Effects of underlayer and surface roughness on the attenuated total reflection spectra of silver films

1984 ◽  
Vol 62 (1) ◽  
pp. 50-53
Author(s):  
Alain Pinard ◽  
Fernand E. Girouard ◽  
Vo-Van Truong
Keyword(s):  
Surface Roughness ◽  
Film Thickness ◽  
Surface Plasmons ◽  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Silver Layer ◽  
Reflection Spectra ◽  
Final State ◽  
Silver Films ◽  
Air Interface

When studying the effects of roughness on surface plasmons produced by the method of attenuated total reflection (ATR), one can deposit an aggregated or wavy underlayer on the prism surface before overcoating it with the same metal used for the underlayers. In the present work, aggregated silver films have been overcoated with a second silver layer, making a total film thickness of 52.5 nm. The ATR spectra of these systems were shown to be greatly influenced by the final state of the underlayer as well as the roughness at the silver–air interface. Results suggested that even after overcoating, the underlayers remained partially aggregated. The roughness at the silver–air interface was found to be less important than the thickness of the original, noncoated, aggregated underlayer.

Effects of annealing on the attenuated-total-reflection spectra of cold-evaporated silver films

1985 ◽  
Vol 31 (4) ◽  
pp. 1873-1880 ◽  
Author(s):  
C. E. Reed ◽  
J. Giergiel ◽  
S. Ushioda ◽  
J. C. Hemminger
Keyword(s):  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Reflection Spectra ◽  
Silver Films

Attenuated Total Reflection Spectra of the Aluminum and Silver Bilayer

1994 ◽  
Vol 63 (7) ◽  
pp. 2677-2684 ◽  
Author(s):  
Richard Lang ◽  
Yutaro Okuno ◽  
Masuo Fukui
Keyword(s):  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Reflection Spectra

Attenuated total reflection spectra of surface exciton polaritons

1976 ◽  
Vol 14 (10) ◽  
pp. 4744-4745 ◽  
Author(s):  
M. F. Bishop ◽  
A. A. Maradudin ◽  
D. L. Mills
Keyword(s):  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Reflection Spectra ◽  
Exciton Polaritons

Subsurface Layer Studies by Attenuated Total Reflection Fourier Transform Spectroscopy

1977 ◽  
Vol 31 (4) ◽  
pp. 289-292 ◽  
Author(s):  
Tomas Hirschfeld
Keyword(s):  
Fourier Transform ◽  
Critical Angle ◽  
Subsurface Layer ◽  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Data Sets ◽  
Angle Of Incidence ◽  
Reflection Spectra ◽  
Reflection Spectroscopy ◽  
A New Technique

In total reflection spectroscopy the effective sampled depth increases as the angle of incidence approaches the critical one. At each angle of incidence, successive layers within the sample are weighed differently in the overall spectrum, and the manner of this weighing changes with angle. It is thus possible in principle to deconvolute a set of spectra taken at different angles into spectra corresponding to successive depth invervals. As this angular effect is particularly marked near the critical angle, where attenuated total reflection spectra are severely distorted, the spectra usually require inversion into optical constant spectra. This has been done by a new technique that measures spectra twice at each angle with different prism materials to give the necessary data sets. Examples of such subsurface spectra are shown.

Polarized Infrared Attenuated Total Reflection Spectra of Powders

1984 ◽  
Vol 38 (1) ◽  
pp. 29-31 ◽  
Author(s):  
Angelo J. Barbetta
Keyword(s):  
Infrared Spectra ◽  
Amorphous Polymer ◽  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Experimental Results ◽  
Reflection Spectra ◽  
Relative Absorption ◽  
Theoretical Predictions ◽  
Polarization Spectra ◽  
Perpendicular Polarization

Attenuated Total Reflection infrared spectra were obtained for rough and spheroidal powders made from an amorphous polymer. The spectra were recorded with a polarizer to obtain both parallel and perpendicular components of the spectra separately. The results were compared to both theoretical predictions and experimental results for the same material examined as a film. It was found that the relative absorption intensities of the two polarization spectra recorded of the film agreed well with the theory for films. However, the powdered samples showed unexpected increases in absorption intensities for the perpendicular spectra. The intensities of the absorptions for perpendicular polarization were about 45% greater than for films as measured by the ratio of relative effective thicknesses. Implications for interpretation of the spectra of powdered materials are discussed.

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