Brillouin scattering in thin film optical waveguides. I. Theory of the phonon modes

1982 ◽  
Vol 60 (12) ◽  
pp. 1788-1803 ◽  
Author(s):  
N. L. Rowell ◽  
G. I. Stegeman

The phonon modes of a thick plate and a thick plate coated with a thin film are discussed in the light of recent experiments on Brillouin scattering in thin film optical waveguides. Using the reflection coefficients for bulk waves, we have obtained the field structures, the mode normalization for excitation by thermal fluctuations, and the density of states for these modes. Both bulk and surface (Rayleigh, Sezawa, and Love) phonons are discussed.

1982 ◽  
Vol 60 (12) ◽  
pp. 1804-1820 ◽  
Author(s):  
N. L. Rowell ◽  
G. I. Stegeman

The general theory of Brillouin scattering out of the guided optical modes by the acoustic modes of a thin film optical waveguide is formulated in terms of a total field analysis which includes the effects of both the elastooptic and corrugation scattering mechanisms. The general analytical forms for the field discontinuities at the film boundaries are given and the spectral densities are evaluated for two particular radiative geometries. The results of numerical calculations for the geometries are presented.


1982 ◽  
Vol 60 (12) ◽  
pp. 1821-1837 ◽  
Author(s):  
N. L. Rowell ◽  
V. C-Y. So ◽  
R. Normandin ◽  
G. I. Stegeman

A series of experimental results on Brillouin scattering in thin film optical waveguides is discussed for two scattering geometries and for three types of planar waveguides. The results of these experiments are compared with the theory presented in the previous two papers.


1999 ◽  
Vol 198-199 ◽  
pp. 590-592 ◽  
Author(s):  
W. Sturhahn ◽  
R. Roehlsberger ◽  
E.E. Alp ◽  
T. Ruckert ◽  
H. Schrör ◽  
...  

1992 ◽  
Vol 24 (5) ◽  
pp. 263-266 ◽  
Author(s):  
P.F. Wahid ◽  
K.B. Sundaram ◽  
P.J. Sisk

2002 ◽  
Vol 13 (6) ◽  
pp. 475-480 ◽  
Author(s):  
R. P. Sharma ◽  
M. S. Raghuvanshi ◽  
S. V. Bhavsar ◽  
A. R. Patil ◽  
S. C. K. Misra

2013 ◽  
Vol 209 ◽  
pp. 111-115 ◽  
Author(s):  
Sandip V. Bhatt ◽  
M.P. Deshpande ◽  
Bindiya H. Soni ◽  
Nitya Garg ◽  
Sunil H. Chaki

Thin film deposition of PbS is conveniently carried out by chemical reactions of lead acetate with thiourea at room temperature. Energy dispersive analysis of X-ray (EDAX), X-ray diffraction (XRD), selected area electron diffraction patterns (SAED), UV-Vis-NIR spectrophotometer, Scanning Electron Microscopy (SEM), Atomic force microscopy (AFM), Photoluminescence (PL) and Raman spectroscopy techniques are used for characterizing thin films. EDAX spectra shows that no impurity is present and XRD pattern indicates face centered cubic structure of PbS thin films. The average crystallite size obtained using XRD is about 15nm calculated using Scherrer’s formula and that determined from Hall-Williamson plot was found to be 18nm. SAED patterns indicate that the deposited PbS thin films are polycrystalline in nature. Blue shift due to quantum confinement was seen from the UV-Vis-NIR absorption spectra of thin film in comparison with bulk PbS. The Photoluminescence spectra obtained for thin film with different excitation sources shows sharp emission peaks at 395nm and its intensity of photoluminescence increases with increasing the excitation wavelength. Raman spectroscopy of deposited thin film was used to study the optical phonon modes at an excitation wavelength of 488nm using (Ar+) laser beam.


Sign in / Sign up

Export Citation Format

Share Document