Internal Schottky barriers in semiconductors
Keyword(s):
We discuss the effect on the electrical conductivity of a semiconductor if small metal inclusions are formed within the bulk of the semiconductor where the metal to semiconductor contact is a rectifying one. We find that the depletion layers formed inside the material can dominate the conduction process and give rise to conditions similar to that of a highly compensated semiconductor with highly variable activation energy. Some of the predictions of the model are compared to observed facts in cuprous oxide and are shown to be consistent with observation. The expected behaviour of a semiconductor with internal injecting contacts is also briefly discussed.
2018 ◽
Vol 31
(3)
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pp. 20
2008 ◽
Vol 69
(4)
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pp. 949-954
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1983 ◽
Vol 38
(5)
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pp. 593-594
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