Study of the Superconducting Proximity Effects by Josephson Tunneling

1971 ◽  
Vol 49 (10) ◽  
pp. 1350-1360 ◽  
Author(s):  
S. Greenspoon ◽  
H. J. T. Smith

We have studied Josephson tunneling in lead – lead oxide – copper – lead junctions with the intent of investigating the proximity effects between normal (Cu) and superconducting (Pb) metals. Zero-voltage tunneling currents of the order of milliamps have been observed in junctions with varying copper thicknesses and electron mean free paths. We have interpreted our measurements of the temperature dependence of the maximum Josephson current in terms of a model based on the de Gennes – Werthamer theory of the proximity effects. As a result of our work we conclude that the de Gennes – Werthamer theory has considerable usefulness outside the strict limits of validity in which it was derived.

1975 ◽  
Vol 46 (3) ◽  
pp. 1419-1420 ◽  
Author(s):  
G. Paternò ◽  
P. Rissman ◽  
R. Vaglio

1970 ◽  
Vol 41 (7) ◽  
pp. 2958-2960 ◽  
Author(s):  
W. J. Johnson ◽  
A. Barone

2007 ◽  
Vol 460-462 ◽  
pp. 1323-1324 ◽  
Author(s):  
Shin-ichi Hikino ◽  
Michiyasu Mori ◽  
Saburo Takahashi ◽  
Sadamichi Maekawa

2016 ◽  
Vol 858 ◽  
pp. 773-776 ◽  
Author(s):  
Maurizio Puzzanghera ◽  
Roberta Nipoti

The temperature dependence of the bulk and periphery forward current components of vertical 4H-SiC p+-i-n diodes, with Al+ implanted circular anodes of diameters in the range 150-1000 mm, have been obtained from the analysis of the results of forward current-voltage measurements in the temperature range 30-290°C. The zero voltage bulk and periphery current densities at different temperatures have been used to compute the temperature dependence of: (i) the effective carrier lifetime in the space charge region, (ii) the minority carrier diffusion coefficient to lifetime ratio in the base region, and (iii) a surface quality parameter.


1982 ◽  
Vol 21 (Part 2, No. 7) ◽  
pp. L437-L439 ◽  
Author(s):  
Minoru Suzuki ◽  
Toshiaki Murakami ◽  
Youichi Enomoto ◽  
Takahiro Inamura

1991 ◽  
Vol 26 (3) ◽  
pp. 347-359 ◽  
Author(s):  
Kevork A. Chouzadjian ◽  
Stephen J. Roden ◽  
Gary J. Davis ◽  
John M. Laven

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