Etude des intensités et des largeurs des raies de vibration–rotation de la bande deuxième harmonique de l'anhydride carbonique à 6970 cm−1 par déconvolution numérique

1968 ◽  
Vol 46 (15) ◽  
pp. 1697-1703 ◽  
Author(s):  
Philippe Arcas ◽  
Lucette Hochard-Demolliere

The intensity and half-width of the 12CO2 3ν3 band lines are determined, the instrumental effects being corrected by numerical calculations. The square of the vibrational moment (R03)2 is found to be equal to 0.233 × 10−42 e.s.u. With a quadrupolar momentum Q = 5.2 × 10−26 e.s.u., the line-width variation curve versus J can be approximately interpreted by Anderson's theory.

1981 ◽  
Vol 35 (1) ◽  
pp. 88-92 ◽  
Author(s):  
Horst Ziegler

Digital filters for spectrometric applications are compared with the classical RC filter. Properties discussed include noise reduction, line shift, and conservation of line moments. For Gaussian and Lorentzian lines, signal deformation and change of half-width as a function of time constant and line width are calculated for several filter types. Using accuracy, sensitivity, and scan speed as criteria, it is shown that a fourth-order digital smoothing polynomial (DISPO) filter is better by typically 1 or even 2 orders of magnitude than the RC filter. Since a real time implementation of these filters is possible, they can directly replace RC filters in all spectrometric applications.


1962 ◽  
Vol 40 (1) ◽  
pp. 113-121 ◽  
Author(s):  
J. H. Jaffe ◽  
S. Kimel ◽  
M. A. Hirshfeld

Intensities and widths of lines in the 2–0 band of HCl have been determined from the refraction spectrum. A hollow prism refractometer was used together with a monochromator of high resolving power. Fairly elaborate corrections for instrumental effects were applied to the observations. A band intensity of 3.68 cm−2 atm−1 was obtained. The vibration–rotation constant θ was found to be 0.97. Both these values agree well with recent results for HCl obtained from the absorption spectrum.


1978 ◽  
Vol 32 (5) ◽  
pp. 433-444 ◽  
Author(s):  
L. C. McGonagle ◽  
J. A. Holcombe

Various microphotometric (or densitometric) techniques for generating quantitative intensity information from photographically recorded spectral lines of time or spatially resolved sources are discussed. The impact of various parameters on the accuracy of quantitative densitometry is presented. These parameters include line widths of the calibration spectrum, source line broadening, microphotometer scan slit width and the optical density of the photographic image. Nonrandom errors associated with the use of various microphotometer slit widths for spectral lines of nonuniform half-width are presented. Spectral lines which are uniform and exhibit slit width or diffraction limited resolution can be scanned with any size microphotometer slit width as long as the calibration curve is prepared using the same scan slit width. The use of microphotometer slit widths narrower than the line width produce H and D curves with maximal γ and increased accuracy in the final intensity value. A density-to-intensity conversion accuracy with a 6% average error was determined for SA-1 plates. For sources whose line widths are larger than the spectrometer bandpass, minimal errors are generated by using a narrow line source for calibration and scanning this spectrum with a slit width less than the line width. Scanning of the broadened line of interest is accomplished using a scan slit width equal to approximately twice the spectrometer slit width. Under these conditions an average error of approximately 11% was determined experimentally for SA-1 plates.


Results are given for the pressure broadening of lines in the vibration-rotation bands of carbon monoxide and deuterium chloride, by a wide variety of added gases including both non-polar and polar molecules. Optical collision diameters have been calculated and considered in relation to the interaction forces likely to be involved. For carbon monoxide, a rough correlation is found between the optical collision diameter and the interaction potential for non-polar broadeners where dispersion forces are dominant, but derivations occur with some polar broadeners. Similar data for deuterium chloride illustrate the importance of dipolar forces, but no simple theory explains the results satisfactorily. The variation of line width with J quantum number is discussed.


2008 ◽  
Vol 109 (10) ◽  
pp. 1834-1844 ◽  
Author(s):  
A.D. Bykov ◽  
N.N. Lavrentieva ◽  
T.P. Mishina ◽  
L.N. Sinitsa ◽  
R.J. Barber ◽  
...  

1976 ◽  
Vol 32 ◽  
pp. 49-55 ◽  
Author(s):  
F.A. Catalano ◽  
G. Strazzulla

SummaryFrom the analysis of the observational data of about 100 Ap stars, the radii have been computed under the assumption that Ap are main sequence stars. Radii range from 1.4 to 4.9 solar units. These values are all compatible with the Deutsch's period versus line-width relation.


Author(s):  
James B. Pawley

Past: In 1960 Thornley published the first description of SEM studies carried out at low beam voltage (LVSEM, 1-5 kV). The aim was to reduce charging on insulators but increased contrast and difficulties with low beam current and frozen biological specimens were also noted. These disadvantages prevented widespread use of LVSEM except by a few enthusiasts such as Boyde. An exception was its use in connection with studies in which biological specimens were dissected in the SEM as this process destroyed the conducting films and produced charging unless LVSEM was used.In the 1980’s field emission (FE) SEM’s came into more common use. The high brightness and smaller energy spread characteristic of the FE-SEM’s greatly reduced the practical resolution penalty associated with LVSEM and the number of investigators taking advantage of the technique rapidly expanded; led by those studying semiconductors. In semiconductor research, the SEM is used to measure the line-width of the deposited metal conductors and of the features of the photo-resist used to form them. In addition, the SEM is used to measure the surface potentials of operating circuits with sub-micrometer resolution and on pico-second time scales. Because high beam voltages destroy semiconductors by injecting fixed charges into silicon oxide insulators, these studies must be performed using LVSEM where the beam does not penetrate so far.


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