Some regularities of ion-beam interactions with semiconductors

1968 ◽  
Vol 46 (6) ◽  
pp. 713-717 ◽  
Author(s):  
E. S. Mashkova ◽  
V. A. Molchanov

During the last few years, various regularities of ion interaction with crystals have been studied, and a number of effects, caused by the regular arrangement of the target atoms, have become apparent. It is interesting that a suitable interpretation of the observed crystal lattice effects can be produced on the basis of the perfect crystal. At first glance this is surprising, since it is known that ion bombardment causes radiation damage, thereby disturbing the regular arrangement of the lattice atoms. The success of the concept of the ideal crystal is determined by the fact that the conditions of many experiments permit rapid annealing of the defects caused by the ion bombardment. In order to prove this assumption, it was necessary to make measurements over a wide temperature range, including the annealing temperature. Semiconductor crystals are the most suitable materials, because their annealing temperatures are high enough. These temperatures are easily obtained and controlled under usual ion-bombardment conditions. Germanium and silicon monocrystalline targets were chosen. The targets were bombarded by 30-keV ions of the noble gases. The temperature range studied was from about 100 to 700 °C. The influence of temperature on the angular regularities of the secondary electron-emission coefficient and on the energy distributions of the scattered ions was investigated. Two strongly different types of ion–electron emission and of scattering regularities were established. At comparatively high temperatures, there are typical anisotropies of the secondary electron-emission coefficient and the "double"-scattering peaks in energy distributions, caused by regular arrangement of the target atoms. At lower temperatures, the normal polycrystalline dependences are observed, i.e., the secondary electron coefficient increases monotonically with increasing incident angle, and the "double"-scattering peak is smoothed out. It has been established that the dependences usually observed with polycrystals change sharply to those observed with single crystals within a small temperature range around the defect annealing temperature. Thus, the concept of the ideal crystal may be used for interpreting the results of ion interactions with crystals, provided the measurements are made at temperatures higher than the annealing temperature of the defects.

Author(s):  
Vladimir Yu. Sadovoy ◽  
Vladimir D. Blank ◽  
Sergey A. Terentiev ◽  
Dmitriy V. Teteruk ◽  
Sergey Yu. Troschiev

Dependence of secondary electron emission coefficient on the chosen crystallographic orientation for a synthetic single crystal diamond of type IIb, grown up by method of a temperature gradient, was investigated. The type IIb of single crystal diamond was chosen because of wide applicability in different areas of microelectronics and the semiconductor properties. Quantitative measurements of secondary electron emission coefficients with energy of primary beam about 7 keV and above for various crystallographic orientations was carried out: the highest coefficient of secondary electronic emission are recorded for the direction (100), cubic sector, and also in intergrowth area that is confirmed by a picture of distribution of the luminescence intensity for various sectors of a single crystal received by means of true secondary electrons detector of scanning electron microscope. The results for (100) area are outstanding: 8.18 at primary beam energy of 7 keV, 10.13 at 10 keV, 49.78 at 30 keV. The results for intergrowth area are similar: 10.10 at primary beam energy of 7 keV, 13.56 at 10 keV, 64.41 at 30 keV. The crystallographic directions (111) have shown secondary electron emission coefficient 4-6 times lower in comparison with (100) and intergrowth area: 2.54 on the average at primary beam energy of 7 keV, 2.75 at 10 keV, 10.03 at 30 keV. The non-standard behavior of secondary electron emission coefficient at the high energy primary beam for all orientations of single crystal diamond is shown: increase in secondary electron emission coefficient with increase in energy of primary beam. At the moment the reason of such behavior is not clear up to the end and since this fact causes a great interest of researchers, considerably expands applicability of the existing devices and detectors due to replacement of a functional element on diamond one, and also opens big opportunities for formation of new field of microelectronics, this facts demand further in-depth study by means of various methods of the structural and surface analysis.


2014 ◽  
Vol 26 (12) ◽  
pp. 123006
Author(s):  
漆世锴 Qi Shikai ◽  
王小霞 Wang Xiaoxia ◽  
罗积润 Luo Jirun ◽  
赵世柯 Zhao Shike ◽  
李云 Li Yun ◽  
...  

2017 ◽  
Vol 32 (6) ◽  
pp. 467-473
Author(s):  
韦海成 WEI Hai-cheng ◽  
许亚杰 XU Ya-jie ◽  
肖明霞 XIAO Ming-xia ◽  
吉文欣 JI Wen-xin

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