Optical energy gap variation in GaxIn1−x As alloys

1968 ◽  
Vol 46 (2) ◽  
pp. 157-159 ◽  
Author(s):  
John C. Woolley ◽  
Mathew B. Thomas ◽  
Alan G. Thompson

Room-temperature optical energy-gap values have been determined for GaxIn1−x As alloys, and have been corrected, where necessary, for the Burstein effect by finding Fermi energy values from thermoelectric power data. The results show good agreement with the empirical equations given previously for mixed III–V alloys.

1994 ◽  
Vol 144 (2) ◽  
pp. 311-316 ◽  
Author(s):  
R. Cadenas ◽  
M. Quintero ◽  
J. C. Woolley

1989 ◽  
pp. 157-165
Author(s):  
M. Quintero ◽  
R . Tovar ◽  
M. Dhksi ◽  
J. Woolley

1995 ◽  
Vol 115 (2) ◽  
pp. 416-419 ◽  
Author(s):  
M. Morocoima ◽  
M. Quintero ◽  
J.C. Woolley

1995 ◽  
Vol 224 (1) ◽  
pp. 93-96 ◽  
Author(s):  
A. Rivero ◽  
M. Quintero ◽  
M. Morocoima ◽  
J.C. Woolley

1993 ◽  
Vol 22 (3) ◽  
pp. 297-301 ◽  
Author(s):  
E. Guerrero ◽  
M. Quintero ◽  
R. Tovar ◽  
T. Tinoco ◽  
J. González ◽  
...  

1988 ◽  
Vol 63 (7) ◽  
pp. 2252-2256 ◽  
Author(s):  
Eunice Guerrero ◽  
Miguel Quintero ◽  
J. C. Woolley

1988 ◽  
Vol 77 (1) ◽  
pp. 26-32 ◽  
Author(s):  
Miguel Quintero ◽  
Pedro Grima ◽  
Eunice Guerrero ◽  
Rafael Tovar ◽  
Gerardo S. Pérez ◽  
...  

2012 ◽  
Vol 27 (02) ◽  
pp. 1350015
Author(s):  
AHMED M. EL-NAGGAR

The influence of the deposition rate of chemically annealed vacuum-deposited a-Si : H films on its optical and electrical properties was studied. The optical parameters were studied using spectrophotometric measurements of the film transmittance in the wavelength range 200–3000 nm. It was found that with increasing the silicon deposition rate from 0.09 to 0.23 nm/s, the refractive index, n, decreases from 3.78 to 3.45 at 1.5 μm, and the optical energy gap, Eg, decreases from 1.74 to 1.66 eV, while the Urbach parameter, ΔE, increases from 77 to 99 meV. The dark conductivity was measured at temperatures descending from 480 to 170 K. It was found that the room temperature dark conductivity values decreased from 1.11 × 10-6 (Ω⋅ cm )-1 to 2.08 × 10-10 (Ω⋅ cm )-1 with increasing the deposition rate from 0.09 to 0.23 nm/s respectively, while the activation energy Ea increased from 0.53 to 0.84 eV with increasing deposition rate. As a result, a good quality a-Si : H film with optical energy gap of 1.74 eV, Urbach parameter of 77 meV, dark conductivity of 1.11 × 10-6 (Ω⋅ cm )-1, and activation energy of 0.53 eV was successfully prepared at a low deposition rate of 0.09 nm/s.


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