AN AURORAL PHOTOMETER FOR THE I.Q.S.Y.

1964 ◽  
Vol 42 (8) ◽  
pp. 1587-1592
Author(s):  
M. D. Watson

A description is given of a simple auroral photometer which is intended to be used in an extended program of auroral photometry during and after the International Years of the Quiet Sun. Absolute auroral intensities will be measured at four wavelengths and recorded on a logarithmic scale. The instrument incorporates a precision timer and automatic control circuits, and is designed for relatively unattended operation.

Author(s):  
L.A. Moxon ◽  
J. Croney ◽  
W.G. Johnson ◽  
C.A. Law

Author(s):  
L.A. Moxon ◽  
J. Croney ◽  
W.G. Johnston ◽  
C.A. Laws

2020 ◽  
Vol 8 (5) ◽  
pp. 2382-2386

Day by day technological development to provide the sophisticated life to the human being is takes place in a large scale. Among the technical development the wireless control and communication for the device control is one of the fast growing sector. Electrical devices located in many place can be effectively controlled with the electronics control circuits through the wireless communication. This paper present is dedicated to design and develop a model for the automatic control of electrical supply based devices by using wireless communication technology and this is part of clean room technology. The clean room technology is providing fully controlled devices which can be automatically adjusted to have a user friendly environment in the home/ room/hall. Clean room means that the room will provide fully effective comfortable environment to the living person in the room where the entire electrical and electronics appliance will be monitored and controlled as per standard specification which is required for the comfortable life in the room. Microcontrollers will be the controller for the input and output device control. For the wireless control the GSM technology also incorporated in the system. The GSM technology will allow the user to monitor the device control through the wireless cellular phone. Different types of sensors are used as part of sensing device for the monitor and control of various input parameters. The control circuit will get power from the solar during the sun light and from conventional source during the non availability of the sun power.


1979 ◽  
Vol 44 ◽  
pp. 131-134
Author(s):  
A. Raoult ◽  
P. Lantos ◽  
E. Fürst

The depressions at centimetric and millimetric wavelengths associated with the filaments are studied using already published maps as well as unpublished observations from the Effelsberg 100 m radio telescope of the M.P.I., Bonn. The study has been restricted to large Ha quiescent prominences of relatively simple shape, situated far from the limb and from active regions. The data has been reduced employing one method whose main characteristics are choice of a local quiet sun definition and avoidance of the unstable process of deconvolution.


Author(s):  
D.P. Malta ◽  
M.L. Timmons

Measurement of the minority carrier diffusion length (L) can be performed by measurement of the rate of decay of excess minority carriers with the distance (x) of an electron beam excitation source from a p-n junction or Schottky barrier junction perpendicular to the surface in an SEM. In an ideal case, the decay is exponential according to the equation, I = Ioexp(−x/L), where I is the current measured at x and Io is the maximum current measured at x=0. L can be obtained from the slope of the straight line when plotted on a semi-logarithmic scale. In reality, carriers recombine not only in the bulk but at the surface as well. The result is a non-exponential decay or a sublinear semi-logarithmic plot. The effective diffusion length (Leff) measured is shorter than the actual value. Some improvement in accuracy can be obtained by increasing the beam-energy, thereby increasing the penetration depth and reducing the percentage of carriers reaching the surface. For materials known to have a high surface recombination velocity s (cm/sec) such as GaAs and its alloys, increasing the beam energy is insufficient. Furthermore, one may find an upper limit on beam energy as the diameter of the signal generation volume approaches the device dimensions.


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