Lines from highly charged tungsten ions observed in the visible region between 340 and 400 nm
Keyword(s):
Ion Trap
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A spectroscopic study of highly charged tungsten ions was performed in the visible region from 340 to 400 nm with an electron beam ion trap (EBIT). The tungsten ions were produced by electron impacts in the EBIT with electrons with energies between 1 and 1.7 keV. Several lines attributed to the tungsten ions W26+ to W33+ were measured.