The different influence of magnesite emissions on the surface waxes of Norway spruce and silver fir

1988 ◽  
Vol 66 (1) ◽  
pp. 125-129 ◽  
Author(s):  
E. Bermadinger ◽  
D. Grill ◽  
P. Golob
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Marked Effect ◽  
Abies Alba ◽  
Silver Fir ◽  
Fine Dust ◽  
Surface Waxes ◽  
The Difference ◽  
Dust Load ◽  
Scanning Electron

The difference in vigour between Picea abies (L.) Karst. and Abies alba Mill, in an area exposed to fine dust containing MgO is reflected in scanning electron microscope studies of the needle surfaces. The greater vitality of the silver fir is correlated with intact wax structures and a somewhat lower dust load. In contrast, the spruce reveals a marked effect on the epicuticular wax by a heavy fine-dust load. Possible causes and physiological consequences are discussed.

A Scanning Electron Microscope With Two Secondary Electron Detectors and Its Application to the Surface Topography Measurements of Magnetic Media

1992 ◽  
Vol 114 (2) ◽  
pp. 274-279 ◽  
Author(s):  
K. Tanaka ◽  
K. Nishimori ◽  
K. Maeda ◽  
J. Matsuda ◽  
M. Hotta
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Surface Topography ◽  
Secondary Electron ◽  
Wear Testing ◽  
Magnetic Media ◽  
Wear Process ◽  
Surface Gradient ◽  
The Difference ◽  
Scanning Electron

A scanning electron microscope (SEM) with two secondary electron detectors is applied for the surface topography measurement of magnetic media. The principle of gradient determination of the SEM is based on a relation that the difference in the square signals between the two detectors is linearly proportional to surface gradient. The great advantage of the instrument is the capability of relocation for profiling. It is extremely useful for the examination of wear process at a fixed position in a sequential manner during wear testing. This is demonstrated by two sample data of measurement on thin film rigid disks.

scholarly journals Epicuticular wax on stomata of damaged silver fir trees (Abies alba Mili.)

2011 ◽  
Vol 74 (2) ◽  
pp. 159-166 ◽  
Author(s):  
Tomislav Bačić ◽  
Ljiljana Krstin ◽  
Jadranka Roša ◽  
Željko Popović
Keyword(s):  
Air Pollution ◽  
Electron Microscope ◽  
Gas Exchange ◽  
Preliminary Report ◽  
Abies Alba ◽  
Silver Fir ◽  
Abaxial Surface ◽  
Different Types ◽  
Very High ◽  
Scanning Electron

Condition of epistomatal wax on the abaxial surface of the current and previous-year needles of damaged silver fir trees (<em>Abies alba</em> Mill.), both from the polluted Risnjak and "clean" Donja Dobra sites in Gorski Kotar region, both influenced by pollutants coming from Europe, during two years, three times a year, were examined with Scanning Electron Microscope. In the course of time the wax tubules on the epistomatal rims of stomata in polluted, but also in "clean" needles surface, become fused and agglomerated rapidly to various extents of morphologically different types of amorphous wax crusts, primarily compact and particulate ones. This process begins very early, especially in polluted Risnjak site, and may be interpreted as a possible result of air pollution. However, the recrystalization, or production of new tubules, also appears relatively quickly in mostly cases. Quantitative estimations indicate a very large total amount of amorphous wax crusts in the current-year needles, and a very high percentage of the same wax in previous-year needles. Amorphous wax crusts cover stomatal pores, as well as the rims, disturbing the normal gas exchange. Statistically there is a signicant tendency of increase in wax degradation in the needles of the polluted site in comparison with those of the unpolluted one, but there is an insignificant wax degradation among the needles of damaged trees within each site. These results confirmed most of the research done in our preliminary report.

Considerations in Making Stereo Micrographs with the Scanning Electron Microscope - Positioning the Stereo Window

1976 ◽  
Vol 34 ◽  
pp. 508-509
Author(s):  
Earl R. Walter
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Tilt Angle ◽  
Field Of View ◽  
Stereo Pair ◽  
The Difference ◽  
Scanning Electron

A variety of factors must be controlled in order to obtain stereo micrograph pairs with the SEM which provide maximum effectiveness along with ease of viewing. These include the following:1. Where possible, micrographs should be sharp from edge to edge. This may require the use of an Autofocus attachment although somewhat the same effect can be obtained by maintaining the point of sharpest focus near opposite edges of the two micrographs forming the stereo pair.2. The difference in tilt angle between the two micrographs of the pair should be kept in the 4to 6° range to provide a normal perspective.3. Micrographs forming a stereo pair should be made at relatively low tilt angles to prevent large differences in the field of view of the two micrographs and to minimize the left to right magnification variations.

Crescita e morfologia della linea cellulare prostatica umana U285 trattata con mepartricina, finasteride e suramina: Confronto tra i farmaci

1994 ◽  
Vol 61 (1_suppl) ◽  
pp. 178-183
Author(s):  
S. De Angeli ◽  
S. Buoro ◽  
C. Favretti ◽  
M. Bonini ◽  
A. Fandella ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Marked Effect ◽  
Cellular Growth ◽  
Lag Phase ◽  
Cytotoxicity Test ◽  
Logarithmic Growth Phase ◽  
The Moment ◽  
Logarithmic Growth ◽  
Scanning Electron

The aim of this study was to compare the effects of mepartricin on the proliferation and morphology of U285 cells with those induced by suramin and finasteride, both substances which have been investigated previously. Proliferation was evaluated by the FRAME Cytotoxicity Test, exposing the cells to increasing doses of mepartricin, between 0.1 μg/ml and 5 μg/ml, from the moment of seeding for 24 hours. The morphology was evaluated by scanning electron microscope (SEM). The FRAME Test showed a statistically significant decrease (p<0.05) in proliferation at all times of observation and at all doses in those cultures exposed to mepartricin right from seeding. Those where treatment was given 24 hours later, only showed this decrease with the highest doses. SEM highlighted the reduced capacity of the cells to proliferate, confirming data from the FRAME Test. These results therefore indicate that mepartricin has an anti-proliferation effect both in the Lag phase and the logarithmic growth phase. This behaviour differs from that of suramin and finasteride, which have less marked effect on cellular growth.

Etching Techniques and the Surface Morphology of the Gunflint Chert

1975 ◽  
Vol 33 ◽  
pp. 226-227
Author(s):  
A. H. Johnson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Surface Morphology ◽  
Hydrofluoric Acid ◽  
Three Dimensional ◽  
Optimum Concentration ◽  
Energy Dispersive Analysis ◽  
The Difference ◽  
Etch Time ◽  
Scanning Electron

Samples of the Gunflint Chert (2.0 billion years old), collected near Kakabeca Falls, Ontario by Dr. L. P. Knauth, have yielded several distinct and recurring morphologies when in hydrofluoric acid of varying concentrations for varying lengths of time, and viewed with a scanning electron microscope.The chert is entirely siliceous, with the exception of minor calcareous lenses identified by energy dispersive analysis. Previous studies of the Gunflint Chert have been made using TEM however SEM offers a three dimensional view which greatly aids interpretation.The samples were prepared by fracturing followed by etching in HF for 30 seconds to 48 hours with concentrations varying from .5% to 30%. It appears that the optimum concentration and etch time varies according to the particular morphology one wishes to develop. This is due to the difference in response to HF by the different textures in the rocks.

X-Ray Analysis of Forensic Samples, Using a Scanning Electron Microscope

1973 ◽  
Vol 56 (5) ◽  
pp. 1206-1222
Author(s):  
Yel S Vasan ◽  
William D Stewart ◽  
J Bruce Wagner
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Sodium Concentration ◽  
Energy Dispersive ◽  
Line Profiles ◽  
Large Area ◽  
Layer Analysis ◽  
Forensic Samples ◽  
The Difference ◽  
Scanning Electron

Abstract A scanning electron microscope equipped with a wavelength dispersive spectrometer and an energy dispersive analyzer was used to examine paint chips and glasses. Line profiles of the elements in the paint show the non-uniform distribution of the pigments and extenders and, in order to obtain reproducible intensity ratios, a large area of the sample must be scanned. Layer analysis of the paint chip is possible with the energy dispersive analyzer and the resulting elemental profiles can be used to identify the chips. The difference in sodium concentration among the glasses studied provides a means of identifying the glass, but care must be taken to avoid migration of the sodium ions in the glass during electron beam bombardment.

scholarly journals The difference of Fracture Behaviour between T300 and T800 Quasi-Isotropic Composites

1992 ◽  
Vol 1 (2) ◽  
pp. 096369359200100
Author(s):  
Zen-ichiro Maekawa ◽  
Hiroyuki Hamada ◽  
Tomohiro Kitagawa ◽  
Kueichi Lee
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Tensile Test ◽  
Fracture Behaviour ◽  
Cfrp Laminates ◽  
Fracture Modes ◽  
Reinforcing Fibers ◽  
The Difference ◽  
Scanning Electron

Four types of quasi-isotropic CFRP laminates were tested in this study. Then the fracture behaviours, for example fracture modes and failure processes were observed by microscope and scanning electron microscope after tensile test. As the result, the differences of fracture behaviours between two kinds of reinforcing fibers composites are indicated.

Resolution Test for the Sem

1976 ◽  
Vol 34 ◽  
pp. 510-511
Author(s):  
R.A. Ploc
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Instrument Performance ◽  
The Difference ◽  
Vertical Height ◽  
Scanning Electron ◽  
Zr Alloy

Many experiments have been proposed for testing resolution in the scanning electron microscope but no standard has been universally accepted.Many investigators have used the smallest separation between two arms of a 50-50% Al-W alloy dendrite as being a measure of resolution but, like other tests, criticism has persisted due to the difference in vertical height between the arms. During the course of our investigations of anodically formed oxides on Zircaloy-2 (a dilute Zr alloy containing 0.05% Ni, 0.1% Fe, 0.1% Cr and 1.5% Sn) a rapid measure of instrument performance was found. The SEM results presented here were obtained on a Coates and Welter CWIKSCAN Model 106A.

The Effect of Different Colloidal Silica Binders on Strengths of Corundum-Mullite Castables

2015 ◽  
Vol 1094 ◽  
pp. 127-130
Author(s):  
Wen Jie Yuan ◽  
Qing You Zhu ◽  
Cheng Ji Deng ◽  
Hong Xi Zhu
Keyword(s):  
Electron Microscope ◽  
Fracture Surface ◽  
Scanning Electron Microscope ◽  
Size Distribution ◽  
Colloidal Silica ◽  
Modulus Of Rupture ◽  
Fracture Surfaces ◽  
The Difference ◽  
Slit Island Method ◽  
Scanning Electron

Three kinds of colloidal silica (GS-30, AM and HS-30) were applied as binders to corundum-mullite castables. The apparent porosity and cold modulus of rupture for samples fired at 800 oC and 1000 oC were compared. The fractography of colloidal silica bonded corundum-mullite castables was carried out by slit island method. The microstructure of fracture surface was characterized by scanning electron microscope. The results showed that castables by using imported colloidal silica (AM and HS-30) presented higher strength than those with domestic (GS-30), which was determined by the activity of silica and modified ion. The difference of the size distribution of the salient on the fracture surfaces indicated that the strength of castables was dependent on the bonding among the components.

In-Situ Measurement of Bending Strength of TiC Whiskers in the Scanning Electron Microscope

1994 ◽  
Vol 365 ◽  
Author(s):  
Yutaka Seino ◽  
Shoichiro Shin ◽  
Satoshi Nagai
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Bending Strength ◽  
Whisker Growth ◽  
Growth Direction ◽  
Three Point Bending ◽  
Cleavage Strength ◽  
The Difference ◽  
Scanning Electron

ABSTRACTThe three–point bending strength of TiC whiskers was measured in a scanning electron microscope. The whisker samples have ∼ 50µm length and 2∼4µm diameter and are commercially available as reinforcements for composite materials. The distribution of the bending strengths of the whiskers showed a double peak around 5.2GPa and 30.4GPa, respectively. The difference in these values is attributed to differences in the cleavage strength of two crystal planes depending on whisker growth direction.

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