Quasi-solitons of magnetostatic waves in a two-layer structure under single-mode excitation

2005 ◽  
Vol 100 (6) ◽  
pp. 1061-1068
Author(s):  
A. M. Shutyi ◽  
D. I. Sementsov
1995 ◽  
Vol 34 (Part 2, No. 8B) ◽  
pp. L1051-L1054 ◽  
Author(s):  
Young Tae Byun ◽  
Kyung Hyun Park ◽  
Sun Ho Kim ◽  
Sang Sam Choi ◽  
Tong Kun Lim

2016 ◽  
Vol 16 (2) ◽  
pp. 158-163 ◽  
Author(s):  
Massimo Vanzi ◽  
K. Xiao ◽  
Giulia Marcello ◽  
Giovanna Mura

2014 ◽  
Vol 22 (01) ◽  
pp. 1440001
Author(s):  
DAYONG PENG ◽  
TIANFU GAO ◽  
JUAN ZENG

Single-mode excitation is a powerful tool for studying many oceanographic processes. Meanwhile, the complex time-variant ocean environment poses a great challenge for single-mode excitation because Green's function matrix of sound field changes quickly. In their previous work, the authors built a system to excite single-mode in a relative simple environment. The purpose of this paper is to study the feasibility of single-mode excitation in rapidly time-variant ocean environment. An improved recursive algorithm is presented to adapt for time-variant environment where the single-mode can be excited within very short time by this algorithm. A typical time-variant shallow water environment is simulated, and results of the single-mode excitation in this environment are presented.


2014 ◽  
Vol 47 (1) ◽  
pp. 285-290
Author(s):  
Hsin-Yi Chen ◽  
Pei-Tzi Chu ◽  
Shih-Lin Chang

A method is reported of realizing single-mode diffraction using singly polarized X-ray wide-angle incidence and grazing-emergence diffraction from a bare Si substrate and from Si nanowires on an Si substrate. For a bare Si substrate, the surface-diffracted and specularly reflected beams of single-mode excitation are separated owing to the extremely asymmetric diffraction at grazing emergence. For Si wires on Si, single-mode diffraction is achieved by tuning the X-ray energy or the azimuthal angle under the conditions of total reflection. This finding opens up new opportunities for using crystal diffraction, in addition to optical reflection or refraction, for the design of coherent X-ray optics.


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