Structural characterization of quantum-well layers by double-crystal X-ray diffractometry

2003 ◽  
Vol 48 (5) ◽  
pp. 728-743 ◽  
Author(s):  
A. M. Afanas’ev ◽  
R. M. Imamov
Keyword(s):  
Quantum Well ◽  
Structural Characterization ◽  
Double Crystal ◽  
X Ray

scholarly journals STRUCTURAL CHARACTERIZATION OF HgTe/CdTe SUPERLATTICES

1985 ◽  
Vol 56 ◽  
Author(s):  
B. M. PAINE ◽  
T. VREELAND ◽  
J. T. CHEUNG
Keyword(s):  
Structural Characterization ◽  
Depth Distribution ◽  
Theoretical Calculations ◽  
Kinematic Model ◽  
Basic Information ◽  
Double Crystal ◽  
X Ray ◽  
Number Of Layers ◽  
Ion Backscattering

AbstractSuperlattices of HgTe and CdTe, grown on (100) and (111) CdTe, have been characterized by He ion backscattering spectrometry and x-ray double crystal diffractometry. Backscattering spectrometry gave basic information about the depth-distribution of layers, i.e. the number of layers in the superlattice, the thickness of CdTe overlayer and the location of damage in the underlying CdTe. Symmetric and asymmetric rocking curves gave information about crystal quality and layer thicknesses. Average strains in the directions perpendicular and parallel to the layer interfaces were obtained directly from the rocking curves. Strains and thicknesses of the HgTe and CdTe layers, as well as variations from layer to layer, were found by fitting the symmetric rocking curves with theoretical calculations based on a kinematic model for the diffraction. A tilt of the atomic planes in the epitaxial layers, relative to those in the substrate, was observed by means of rocking curves recorded from the same diffracting planes, but with reversed incident and diffracted beam directions.

LM-ACT for Imaging RAM Devices in X-ray Diffraction Topographs

1988 ◽  
Vol 32 ◽  
pp. 659-666 ◽  
Author(s):  
Warren T. Beard ◽  
Ronald W. Armstrong
Keyword(s):  
Integrated Circuits ◽  
Structural Characterization ◽  
Device Performance ◽  
X Ray Diffraction ◽  
Circuit Testing ◽  
Double Crystal ◽  
X Ray ◽  
Parametric Testing ◽  
Device Properties

Analysis of serai conductor material and associated integrated circuits (IC) is imperative for ensuring quality products. Currently, routine circuit testing is dominated by measurement of the optical and electrical material/device properties through final device performance and parametric testing.Characterization of the crystal microstructure still is not considered a routine process test. Structural characterization usually is based on double-crystal rocking curves, x-ray topography, or a combination of these techniques.

New horizons for the structural characterization of stainless steel slags by X-ray powder diffraction

2007 ◽  
Vol 2007 (suppl_26) ◽  
pp. 61-66 ◽  
Author(s):  
B. Peplinski ◽  
B. Adamczyk ◽  
G. Kley ◽  
K. Adam ◽  
F. Emmerling ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Powder Diffraction ◽  
Structural Characterization ◽  
X Ray ◽  
New Horizons

scholarly journals Structural Characterization of Heterodinuclear ZnII-LnIII Complexes (Ln = Pr, Nd) with a Ring-Contracted H2valdien-Derived Schiff Base Ligand

2021 ◽  
Author(s):  
Shabana Noor ◽  
Richard Goddard ◽  
Fehmeeda Khatoon ◽  
Sarvendra Kumar ◽  
Rüdiger W. Seidel
Keyword(s):  
Molecular Structure ◽  
Schiff Base ◽  
Structural Characterization ◽  
Schiff Base Ligand ◽  
Crystal And Molecular Structure ◽  
X Ray ◽  
X Ray Crystallography ◽  
Imidazoline Ring

AbstractSynthesis and structural characterization of two heterodinuclear ZnII-LnIII complexes with the formula [ZnLn(HL)(µ-OAc)(NO3)2(H2O)x(MeOH)1-x]NO3 · n H2O · n MeOH [Ln = Pr (1), Nd (2)] and the crystal and molecular structure of [ZnNd(HL)(µ-OAc)(NO3)2(H2O)] [ZnNd(HL)(OAc)(NO3)2(H2O)](NO3)2 · n H2O · n MeOH (3) are reported. The asymmetrical compartmental ligand (E)-2-(1-(2-((2-hydroxy-3-methoxybenzylidene)amino)-ethyl)imidazolidin-2-yl)-6-methoxyphenol (H2L) is formed from N1,N3-bis(3-methoxysalicylidene)diethylenetriamine (H2valdien) through intramolecular aminal formation, resulting in a peripheral imidazoline ring. The structures of 1–3 were revealed by X-ray crystallography. The smaller ZnII ion occupies the inner N2O2 compartment of the ligand, whereas the larger and more oxophilic LnIII ions are found in the outer O2O2’ site. Graphic Abstract Synthesis and structural characterization of two heterodinuclear ZnII-LnIII complexes (Ln = Pr, Nd) bearing an asymmetrical compartmental ligand formed in situ from N1,N3-bis(3-methoxysalicylidene)diethylenetriamine (H2valdien) through intramolecular aminal formation are reported.

Synthesis and structural characterization of a magnesium phthalocyanine(3–) anion

2012 ◽  
Vol 16 (01) ◽  
pp. 154-162 ◽  
Author(s):  
Edwin W.Y. Wong ◽  
Daniel B. Leznoff
Keyword(s):  
Absorption Spectrum ◽  
Solid State ◽  
Single Crystal ◽  
Structural Characterization ◽  
Heterometallic Complex ◽  
State Structure ◽  
Solid State Structure ◽  
X Ray ◽  
X Ray Crystallography

The reduction of magnesium phthalocyanine (MgPc) with 2.2 equivalents of potassium graphite in 1,2-dimethoxyethane (DME) gives [K2(DME)4]PcMg(OH)(1) in 67% yield. Compound 1 was structurally characterized using single crystal X-ray crystallography and was found to be a monomeric, heterometallic complex consisting of a μ3-OH ligand that bridges a [MgIIPc3-]- anion to two potassium cations solvated by four DME molecules. An absorption spectrum of 1 confirms the Pc ligand is singly reduced and has a 3–charge. The solid-state structure of 1 does not indicate breaking of the aromaticity of the Pc ligand. Compound 1 is only the second Pc3- complex and the first reduced MgPc to be isolated and structurally characterized.

Sign in / Sign up

Export Citation Format

Share Document