Obtaining optical properties on demand

Developement of computer technology provides much improvements on electron microscopy, such as simulation of images, reconstruction of images and automatic controll of microscopes (auto-focussing and auto-correction of astigmatism) and design of electron microscope lenses by using a finite element method (FEM). In this investigation, procedures for simulating the optical properties of objective lenses of HREM and the characteristics of the new lens for HREM at 200 kV are described.The process for designing the objective lens is divided into three stages. Stage 1 is the process for estimating the optical properties of the lens. Firstly, calculation by FEM is made for simulating the axial magnetic field distributions Bzc of the lens. Secondly, electron ray trajectory is numerically calculated by using Bzc. And lastly, using Bzc and ray trajectory, spherical and chromatic aberration coefficients Cs and Cc are numerically calculated. Above calculations are repeated by changing the shape of lens until! to find an optimum aberration coefficients.

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Optical Properties of HVEM Accelerators

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100114529 ◽

1975 ◽

Vol 33 ◽

pp. 180-181

Author(s):

A. Strojnik ◽

J.W. Scholl ◽

V. Bevc

Keyword(s):

Optical Properties ◽

Electron Accelerator ◽

Systematic Investigation ◽

Electron Source ◽

High Brightness ◽

The Past ◽

Wide Range ◽

Optical Behavior

The electron accelerator, as inserted between the electron source (injector) and the imaging column of the HVEM, is usually a strong lens and should be optimized in order to ensure high brightness over a wide range of accelerating voltages and illuminating conditions. This is especially true in the case of the STEM where the brightness directly determines the highest resolution attainable. In the past, the optical behavior of accelerators was usually determined for a particular configuration. During the development of the accelerator for the Arizona 1 MEV STEM, systematic investigation was made of the major optical properties for a variety of electrode configurations, number of stages N, accelerating voltages, 1 and 10 MEV, and a range of injection voltages ϕ0 = 1, 3, 10, 30, 100, 300 kV).

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Differential polarization imaging of sickled cells

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100102390 ◽

1988 ◽

Vol 46 ◽

pp. 62-63

Author(s):

Marcos F. Maestre

Keyword(s):

Optical Properties ◽

Theoretical Approach ◽

Polarized Light ◽

Polarization Microscopy ◽

Spectroscopic Techniques ◽

Polarization Imaging ◽

Circularly Polarized Light ◽

Circularly Polarized ◽

Microscopic Scale ◽

Chiral Structures

Recently we have developed a form of polarization microscopy that forms images using optical properties that have previously been limited to macroscopic samples. This has given us a new window into the distribution of structure on a microscopic scale. We have coined the name differential polarization microscopy to identify the images obtained that are due to certain polarization dependent effects. Differential polarization microscopy has its origins in various spectroscopic techniques that have been used to study longer range structures in solution as well as solids. The differential scattering of circularly polarized light has been shown to be dependent on the long range chiral order, both theoretically and experimentally. The same theoretical approach was used to show that images due to differential scattering of circularly polarized light will give images dependent on chiral structures. With large helices (greater than the wavelength of light) the pitch and radius of the helix could be measured directly from these images.

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