Acoustic emission to probe slow dynamics in complex materials

2017 ◽  
Vol 141 (5) ◽  
pp. 3904-3905 ◽  
Author(s):  
Mourad Bentahar ◽  
Xiaoyang Yue ◽  
Charfeddine Mechri ◽  
Silvio Montresor
2008 ◽  
Vol 123 (5) ◽  
pp. 3398-3398
Author(s):  
Mourad Bentahar ◽  
Anne Marec ◽  
Rachid El Guerjouma ◽  
Jean‐Hugh Thomas

2008 ◽  
Author(s):  
M. Bentahar ◽  
A. Marec ◽  
R. El Guerjouma ◽  
J.-H. Thomas ◽  
V. Tournat ◽  
...  

Author(s):  
Mark J Eaton ◽  
Rhys Pullin ◽  
Karen M Holford

The acoustic emission technique is a passive non-destructive testing technique that has significant potential for use as a structural health monitoring technique for many large-scale structures, allowing continuous global monitoring. The location capability of the acoustic emission technique is its most beneficial attribute; however, the location accuracy can often be limited in complex materials and structures. This article discusses recent advances in the location of acoustic emission signals. The key sources of errors are identified as signal arrival time measurement and processing algorithm limitations. A series of strategies for reducing the effects of both causes of error are presented. Additionally, the results of a case study are used to demonstrate a novel mapping technique for acoustic emission source location of fatigue crack signals in an aircraft landing gear component. Improvements in location accuracy of up to 87.5% were observed when compared with standard location calculation algorithms.


Author(s):  
A. Zangvil ◽  
L.J. Gauckler ◽  
G. Schneider ◽  
M. Rühle

The use of high temperature special ceramics which are usually complex materials based on oxides, nitrides, carbides and borides of silicon and aluminum, is critically dependent on their thermomechanical and other physical properties. The investigations of the phase diagrams, crystal structures and microstructural features are essential for better understanding of the macro-properties. Phase diagrams and crystal structures have been studied mainly by X-ray diffraction (XRD). Transmission electron microscopy (TEM) has contributed to this field to a very limited extent; it has been used more extensively in the study of microstructure, phase transformations and lattice defects. Often only TEM can give solutions to numerous problems in the above fields, since the various phases exist in extremely fine grains and subgrain structures; single crystals of appreciable size are often not available. Examples with some of our experimental results from two multicomponent systems are presented here. The standard ion thinning technique was used for the preparation of thin foil samples, which were then investigated with JEOL 200A and Siemens ELMISKOP 102 (for the lattice resolution work) electron microscopes.


2001 ◽  
Vol 148 (4) ◽  
pp. 169-177 ◽  
Author(s):  
R.P. Dalton ◽  
P. Cawley ◽  
M.J. Lowe
Keyword(s):  

2020 ◽  
Vol 92 (2) ◽  
pp. 20401
Author(s):  
Evgeniy Dul'kin ◽  
Michael Roth

In relaxor (1-x)SrTiO3-xBiFeO3 ferroelectrics ceramics (x = 0.2, 0.3 and 0.4) both intermediate temperatures and Burns temperatures were successfully detected and their behavior were investigated in dependence on an external bias field using an acoustic emission. All these temperatures exhibit a non-trivial behavior, i.e. attain the minima at some threshold fields as a bias field enhances. It is established that the threshold fields decrease as x increases in (1-x)SrTiO3-xBiFeO3, as it previously observed in (1-x)SrTiO3-xBaTiO3 (E. Dul'kin, J. Zhai, M. Roth, Phys. Status Solidi B 252, 2079 (2015)). Based on the data of the threshold fields the mechanisms of arising of random electric fields are discussed and their strengths are compared in both these relaxor ferroelectrics.


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