Quantitative measurements of solid and fluid properties with near‐field acoustics

1999 ◽  
Vol 105 (2) ◽  
pp. 1229-1229 ◽  
Author(s):  
Bernard Cretin ◽  
Pascal Vairac ◽  
Raphael Patois
Keyword(s):  
Near Field ◽  
Quantitative Measurements ◽  
Fluid Properties

Measurement of fluid properties with a near-field acoustic sensor

1999 ◽  
Vol 75 (2) ◽  
pp. 295-297 ◽  
Author(s):  
R. Patois ◽  
P. Vairac ◽  
B. Cretin
Keyword(s):  
Near Field ◽  
Acoustic Sensor ◽  
Fluid Properties

scholarly journals Giant heat transfer in the crossover regime between conduction and radiation

2017 ◽  
Vol 8 (1) ◽  
Author(s):  
Konstantin Kloppstech ◽  
Nils Könne ◽  
Svend-Age Biehs ◽  
Alejandro W. Rodriguez ◽  
Ludwig Worbes ◽  
...  
Keyword(s):  
Heat Transfer ◽  
Heat Flux ◽  
Near Field ◽  
Black Body ◽  
Black Body Radiation ◽  
Quantitative Measurements ◽  
Atomic Spacing ◽  
Large Heat ◽  
Vacuum Gaps ◽  
Near Field Scanning

Abstract Heat is transferred by radiation between two well-separated bodies at temperatures of finite difference in vacuum. At large distances the heat transfer can be described by black body radiation, at shorter distances evanescent modes start to contribute, and at separations comparable to inter-atomic spacing the transition to heat conduction should take place. We report on quantitative measurements of the near-field mediated heat flux between a gold coated near-field scanning thermal microscope tip and a planar gold sample at nanometre distances of 0.2–7 nm. We find an extraordinary large heat flux which is more than five orders of magnitude larger than black body radiation and four orders of magnitude larger than the values predicted by conventional theory of fluctuational electrodynamics. Different theories of phonon tunnelling are not able to describe the observations in a satisfactory way. The findings demand modified or even new models of heat transfer across vacuum gaps at nanometre distances.

A Near-Field Microwave Probe for Quantitative Characterization of Dielectric Thin Films

2004 ◽  
Vol 838 ◽  
Author(s):  
Vladimir V. Talanov ◽  
Robert L. Moreland ◽  
André Scherz ◽  
Bin Ming ◽  
Andrew R. Schwartz
Keyword(s):  
Dielectric Constant ◽  
Semiconductor Industry ◽  
Near Field ◽  
Spot Size ◽  
Dielectric Films ◽  
Quantitative Measurements ◽  
Sample Separation ◽  
Film Dielectric ◽  
Microwave Probe ◽  
Thin Dielectric Films

ABSTRACTWe have developed a novel scanning near-field microwave probe capable of precise quantitative measurements of dielectric constant of thin dielectric films. The technique is noncontact and has a few-micron sampling spot-size. For dielectric films with k<7 and thickness down to 200 nm the probe provides precision and accuracy better than 1% and 5%, respectively. The probe is based on a balanced parallel-plate microwave transmission line operating at 4 GHz. Unlike the apertureless STM- or AFM-based schemes that have been previously employed, our “apertured” approach allows for truly quantitative measurements on a few-micron length scale with result that is insensitive to the material property outside this probing volume.We will present quantitative measurements on a variety of so-called low-k dielectric films, which are of great interest to the semiconductor industry as replacements for SiO2 in interconnect wiring. When the probe is placed in close proximity to the film under test its fringe capacitance is governed by the sample permittivity, the tip geometry, and the tip-sample separation. We measure this capacitance with a resolution down to 30 zF using a microwave resonator. Extraction of the film dielectric constant is based on an original approach providing for removal of the substrate contribution. Bulk Si and a set of variable thickness thermal oxide films are employed to calibrate the probe. There is no need to know the absolute value of the tip-sample separation for either measurement or calibration procedures; this separation must only be kept nominally the same for both measurements, which is achieved by a virtually material independent shear-force distance control.

scholarly journals Microwave Microscopy and Its Applications

2020 ◽  
Vol 50 (1) ◽  
pp. 105-130 ◽  
Author(s):  
Zhaodong Chu ◽  
Lu Zheng ◽  
Keji Lai
Keyword(s):  
Domain Walls ◽  
Materials Science ◽  
Near Field ◽  
Data Interpretation ◽  
General Purpose ◽  
Topological Order ◽  
Microwave Frequencies ◽  
Microwave Microscopy ◽  
Quantitative Measurements ◽  
Materials Research

Understanding the nanoscale electrodynamic properties of a material at microwave frequencies is of great interest for materials science, condensed matter physics, device engineering, and biology. With specialized probes, sensitive detection electronics, and improved scanning platforms, microwave microscopy has become an important tool for cutting-edge materials research in the past decade. In this article, we review the basic components and data interpretation of microwave imaging and its broad range of applications. In addition to the general-purpose mapping of permittivity and conductivity, microwave microscopy is now exploited to perform quantitative measurements on semiconductor devices, photosensitive materials, ferroelectric domains and domain walls, and acoustic-wave systems. Implementation of the technique in low-temperature and high-magnetic-field chambers has also led to major discoveries in quantum materials with strong correlation and topological order. We conclude the review with an outlook of the ultimate resolution, operation frequency, and future industrial and academic applications of near-field microwave microscopy.

scholarly journals Developments and Recent Progresses in Microwave Impedance Microscope

2020 ◽  
Vol 8 ◽  
Author(s):  
Zhaoqi Zhong ◽  
Xiaolong Chen ◽  
Xing Quan ◽  
Huiting Huan ◽  
Fushun Nian ◽  
...  
Keyword(s):  
Near Field ◽  
Microwave Measurement ◽  
Basic Principles ◽  
Microwave Microscopy ◽  
Quantitative Measurements ◽  
Capacitance Variation ◽  
Low Emission ◽  
The Common ◽  
Instrument Configuration ◽  
Mim Technology

Microwave impedance microscope (MIM) is a near-field microwave technology which has low emission energy and can detect samples without any damages. It has numerous advantages, which can appreciably suppress the common-mode signal as the sensing probe separates from the excitation electrode, and it is an effective device to represent electrical properties with high spatial resolution. This article reviews the major theories of MIM in detail which involve basic principles and instrument configuration. Besides, this paper summarizes the improvement of MIM properties, and its cutting-edge applications in quantitative measurements of nanoscale permittivity and conductivity, capacitance variation, and electronic inhomogeneity. The relevant implementations in recent literature and prospects of MIM based on the current requirements are discussed. Limitations and advantages of MIM are also highlighted and surveyed to raise awareness for more research into the existing near-field microwave microscopy. This review on the ongoing progress and future perspectives of MIM technology aims to provide a reference for the electronic and microwave measurement community.

Quantitative Measurements on the Ion Etching of TMV

1973 ◽  
Vol 31 ◽  
pp. 336-337
Author(s):  
Irwin Bendet ◽  
Nabil Rizk
Keyword(s):  
Electron Microscope ◽  
Tobacco Mosaic Virus ◽  
Mosaic Virus ◽  
Ion Current ◽  
Beam Diameter ◽  
Ion Etching ◽  
Preliminary Results ◽  
Quantitative Measurements ◽  
Monitoring Devices

Preliminary results reported last year on the ion etching of tobacco mosaic virus indicated that the diameter of the virus decreased more rapidly at 10KV than at 5KV, perhaps reaching a constant value before disappearing completely.In order to follow the effects of ion etching on TMV more quantitatively we have designed and built a second apparatus (Fig. 1), which incorporates monitoring devices for measuring ion current and vacuum as well as accelerating voltage. In addition, the beam diameter has been increased to approximately 1 cm., so that ten electron microscope grids can be exposed to the beam simultaneously.

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Some quantitative applications of vascular corrosion casting

1992 ◽  
Vol 50 (1) ◽  
pp. 738-739
Author(s):  
Fred E. Hossler
Keyword(s):  
Blood Vessels ◽  
Nuclear Orientation ◽  
Three Dimensional ◽  
Surrounding Tissue ◽  
Confocal Laser ◽  
Corrosion Casting ◽  
Venous Valve ◽  
Casting Technique ◽  
Low Viscosity ◽  
Quantitative Measurements

Preparation of replicas of the complex arrangement of blood vessels in various organs and tissues has been accomplished by infusing low viscosity resins into the vasculature. Subsequent removal of the surrounding tissue by maceration leaves a model of the intricate three-dimensional anatomy of the blood vessels of the tissue not obtainable by any other procedure. When applied with care, the vascular corrosion casting technique can reveal fine details of the microvasculature including endothelial nuclear orientation and distribution (Fig. 1), locations of arteriolar sphincters (Fig. 2), venous valve anatomy (Fig. 3), and vessel size, density, and branching patterns. Because casts faithfully replicate tissue vasculature, they can be used for quantitative measurements of that vasculature. The purpose of this report is to summarize and highlight some quantitative applications of vascular corrosion casting. In each example, casts were prepared by infusing Mercox, a methyl-methacrylate resin, and macerating the tissue with 20% KOH. Casts were either mounted for conventional scanning electron microscopy, or sliced for viewing with a confocal laser microscope.

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