Modeling low-frequency reverberation near the Mid-Atlantic Ridge and comparison with ARSRP data

1997 ◽  
Vol 101 (5) ◽  
pp. 2555-2565 ◽  
Author(s):  
Jerald W. Caruthers ◽  
E. J. Yoerger ◽  
J. C. Novarini
Keyword(s):  
Low Frequency ◽  
Mid Atlantic Ridge

Energy Transmission by Barotropic Rossby Waves Revisited

2005 ◽  
Vol 35 (11) ◽  
pp. 2228-2236 ◽  
Author(s):  
R. P. Matano ◽  
E. D. Palma
Keyword(s):  
Cross Section ◽  
Rossby Waves ◽  
Bottom Topography ◽  
Low Frequency ◽  
Energy Transmission ◽  
Low Pass ◽  
Mid Atlantic Ridge ◽  
High Frequency Waves ◽  
The Individual ◽  
Matching Techniques

Abstract This article presents a semianalytic method to investigate the properties of energy transmission across bottom topography by barotropic Rossby waves. The method is first used to revisit the analytical estimates derived from wave-matching techniques and Wentzel–Kramers–Brillouin (WKB) approximations. The comparison between the semianalytic method and WKB indicates that the results of the latter are valid for waves with periods longer than a month and ridges taller than ∼1000 m and wider than ∼500 km. For these parameter values both methods predict the passage of low-frequency waves and the reflection of high-frequency waves. The semianalytic method is then used to discuss the energy transmission properties of a cross section of the Mid-Atlantic Ridge. It is shown that the filtering characteristics of realistic bottom topographies depend not only on the spatial scale set by the cross-section envelope, but also on the scales of the individual peaks. This dependence is related to the fact that topographies narrower than ∼400 km (e.g., peaks) are high-pass filters of incoming waves, while topographies wider than that (e.g., cross-section envelopes) are low-pass filters. In the particular case of the Mid-Atlantic Ridge the neglect of the contribution of individual peaks leads to an erroneous estimate of the filtering properties of the massif.

scholarly journals Variability at Intermediate Depths at the Equator in the Atlantic Ocean in 2000–06: Annual Cycle, Equatorial Deep Jets, and Intraseasonal Meridional Velocity Fluctuations

2008 ◽  
Vol 38 (8) ◽  
pp. 1794-1806 ◽  
Author(s):  
Lucia Bunge ◽  
Christine Provost ◽  
Bach Lien Hua ◽  
Annie Kartavtseff
Keyword(s):  
Plane Wave ◽  
Velocity Component ◽  
Low Frequency ◽  
Velocity Amplitude ◽  
Meridional Velocity ◽  
Vertical Scale ◽  
Mid Atlantic Ridge ◽  
Phase Propagation ◽  
Interannual Fluctuations ◽  
Vertical Scales

Abstract Time series of high vertical resolution current meter measurements between 600-m and 1800-m depths on the equator in the Atlantic were obtained at two locations, 10° and 23°W. The measurements have a time span of almost 7 years (2000–06) and provide insights into the temporal scales and vertical structure of variability at intermediate depths. Variability in the zonal velocity component records is dominated by semiannual, annual, and interannual fluctuations. At semiannual and annual periodicities, vertical scales are large, on the order of 2000 stretched meters (sm), and show upward phase propagation. In contrast, interannual variability is associated with small vertical scale flows, called equatorial deep jets (EDJs), presenting downward phase propagation most of the time. Fitting a plane wave to these small vertical-scale flows leads to velocity amplitude, vertical scale, and temporal scale estimates of 8 (normalized) cm s−1, 440 sm, and 4.4 yr. However, this plane wave cannot explain all the variability presenting small vertical scales. Indeed, the data suggest that, along with a seasonal cycle of much larger vertical scale, different features with EDJ vertical scale coexist, with the possibility of a semipermanent eastward jet at around 1500 sm. Variability in the meridional velocity component is dominated by intraseasonal fluctuations. In addition, at 23°W, the meridional component shows low-frequency flows that may be due to the interaction of zonal fluctuations with the Mid-Atlantic Ridge.

A Study on the Fine Structure of the Lateral Line Organ of the Sea Eel

1973 ◽  
Vol 31 ◽  
pp. 648-649
Author(s):  
K. Hama
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Lateral Line ◽  
Low Frequency ◽  
Sensory Cells ◽  
Apical Surface ◽  
Voltage Electron ◽  
Sensory Epithelia ◽  
Low Frequency Vibration ◽  
Transmission Electron

The lateral line organs of the sea eel consist of canal and pit organs which are different in function. The former is a low frequency vibration detector whereas the latter functions as an ion receptor as well as a mechano receptor.The fine structure of the sensory epithelia of both organs were studied by means of ordinary transmission electron microscope, high voltage electron microscope and of surface scanning electron microscope.The sensory cells of the canal organ are polarized in front-caudal direction and those of the pit organ are polarized in dorso-ventral direction. The sensory epithelia of both organs have thinner surface coats compared to the surrounding ordinary epithelial cells, which have very thick fuzzy coatings on the apical surface.

Lectin Binding to Human Breast Tumor Cells

1976 ◽  
Vol 34 ◽  
pp. 34-35
Author(s):  
Robert E. Nordquist ◽  
J. Hill Anglin ◽  
Michael P. Lerner
Keyword(s):  
Carcinoma Cell ◽  
Ricinus Communis ◽  
Lectin Binding ◽  
Low Frequency ◽  
Breast Carcinoma Cell Line ◽  
Human Breast ◽  
Human Breast Tumor ◽  
Duct Carcinoma ◽  
Specific Antigens ◽  
Ricin Agglutinin

A human breast carcinoma cell line (BOT-2) was derived from an infiltrating duct carcinoma (1). These cells were shown to have antigens that selectively bound antibodies from breast cancer patient sera (2). Furthermore, these tumor specific antigens could be removed from the living cells by low frequency sonication and have been partially characterized (3). These proteins have been shown to be around 100,000 MW and contain approximately 6% hexose and hexosamines. However, only the hexosamines appear to be available for lectin binding. This study was designed to use Concanavalin A (Con A) and Ricinus Communis (Ricin) agglutinin for the topagraphical localization of D-mannopyranosyl or glucopyranosyl and D-galactopyranosyl or DN- acetyl glactopyranosyl configurations on BOT-2 cell surfaces.

Practical High Resolution Microscopy

1968 ◽  
Vol 26 ◽  
pp. 302-303
Author(s):  
P. A. Marsh ◽  
T. Mullens ◽  
D. Price
Keyword(s):  
High Resolution ◽  
Magnetic Fields ◽  
Low Frequency ◽  
Resolving Power ◽  
Careful Attention ◽  
Electron Microscopes ◽  
The Relationship ◽  
High Resolution Microscopy ◽  
New Facilities

It is possible to exceed the guaranteed resolution on most electron microscopes by careful attention to microscope parameters essential for high resolution work. While our experience is related to a Philips EM-200, we hope that some of these comments will apply to all electron microscopes.The first considerations are vibration and magnetic fields. These are usually measured at the pre-installation survey and must be within specifications. It has been our experience, however, that these factors can be greatly influenced by the new facilities and therefore must be rechecked after the installation is completed. The relationship between the resolving power of an EM-200 and the maximum tolerable low frequency interference fields in milli-Oerstedt is 10 Å - 1.9, 8 Å - 1.4, 6 Å - 0.8.

Simulations of high-resolution images of amorphous silicon films

1986 ◽  
Vol 44 ◽  
pp. 544-545
Author(s):  
G. Y. Fan ◽  
J. M. Cowley
Keyword(s):  
Electron Microscope ◽  
High Frequency ◽  
Fourier Transformation ◽  
Amorphous Materials ◽  
Low Frequency ◽  
Chromatic Aberration ◽  
Structure Information ◽  
Frequency Components ◽  
High Resolution Images ◽  
Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

SEM image sharpness analysis

1996 ◽  
Vol 54 ◽  
pp. 142-143
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
High Frequency ◽  
Low Frequency ◽  
Quantitative Information ◽  
Primary Electron ◽  
Image Sharpness ◽  
Critical Dimensions ◽  
Sem Image ◽  
Frequency Changes ◽  
Electron Microscopes ◽  
Scanning Electron

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.

Real Ear Sound Pressure Levels Developed by Three Portable Stereo System Earphones

1992 ◽  
Vol 1 (4) ◽  
pp. 52-55 ◽  
Author(s):  
Gail L. MacLean ◽  
Andrew Stuart ◽  
Robert Stenstrom
Keyword(s):  
High Frequency ◽  
Sound Pressure ◽  
Low Frequency ◽  
Test System ◽  
Output Frequency ◽  
Frequency Effects ◽  
Adult Men ◽  
Frequency Responses ◽  
Significant Difference ◽  
Sound Pressure Levels

Differences in real ear sound pressure levels (SPLs) with three portable stereo system (PSS) earphones (supraaural [Sony Model MDR-44], semiaural [Sony Model MDR-A15L], and insert [Sony Model MDR-E225]) were investigated. Twelve adult men served as subjects. Frequency response, high frequency average (HFA) output, peak output, peak output frequency, and overall RMS output for each PSS earphone were obtained with a probe tube microphone system (Fonix 6500 Hearing Aid Test System). Results indicated a significant difference in mean RMS outputs with nonsignificant differences in mean HFA outputs, peak outputs, and peak output frequencies among PSS earphones. Differences in mean overall RMS outputs were attributed to differences in low-frequency effects that were observed among the frequency responses of the three PSS earphones. It is suggested that one cannot assume equivalent real ear SPLs, with equivalent inputs, among different styles of PSS earphones.

Evaluation of Special Hearing Aids for Deaf Children

1971 ◽  
Vol 36 (4) ◽  
pp. 527-537 ◽  
Author(s):  
Norman P. Erber
Keyword(s):  
Hearing Aids ◽  
High Frequency ◽  
Hearing Aid ◽  
Low Frequency ◽  
Acoustic Stimulation ◽  
Deaf Children ◽  
Frequency Range ◽  
Frequency Limit ◽  
Unpublished Studies ◽  
Published Research

Two types of special hearing aid have been developed recently to improve the reception of speech by profoundly deaf children. In a different way, each special system provides greater low-frequency acoustic stimulation to deaf ears than does a conventional hearing aid. One of the devices extends the low-frequency limit of amplification; the other shifts high-frequency energy to a lower frequency range. In general, previous evaluations of these special hearing aids have obtained inconsistent or inconclusive results. This paper reviews most of the published research on the use of special hearing aids by deaf children, summarizes several unpublished studies, and suggests a set of guidelines for future evaluations of special and conventional amplification systems.

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