scholarly journals Effects of different samples of reproducible noise on detection of a 20‐Hz‐wide interaural phase shift centered on 500 Hz

1993 ◽  
Vol 93 (4) ◽  
pp. 2350-2350
Author(s):  
A. N. Grange ◽  
William A. Yost
Keyword(s):  
Phase Shift ◽  
Interaural Phase

Interaural Phase Disparity of Stutterers and Nonstutterers

1972 ◽  
Vol 15 (4) ◽  
pp. 771-780 ◽  
Author(s):  
Courtney Stromsta
Keyword(s):  
Control System ◽  
Phase Shift ◽  
Phase Difference ◽  
Auditory Feedback ◽  
Laryngeal Function ◽  
Interaural Phase ◽  
Frequency Criterion ◽  
Interaural Phase Difference ◽  
The Mean ◽  
Phase Differences

Stutterers and nonstutterers cancelled the auditory sensation evoked by bone-conducted sinusoidal signals. They accomplished this by appropriate phase and amplitude adjustments of simultaneously presented bilateral air-conducted signals of the same frequency. Criterion measures of interaural phase difference at the point of cancellation were obtained for seven frequencies. The mean interaural phase differences obtained by stutterers were consistently greater than those of the nonstutterers. Based on time-equivalent values of the mean interaural phase differences, the values for stutterers were approximately twice as great as for nonstutterers at 150, 300, and 1200 Hz. The mean interaural phase difference found to exist for stutterers at 150 Hz approximates the magnitude of phase shift of normally delayed air-conducted auditory feedback of speech sounds that serves to induce experimental blockage of phonation. This relationship, in view of other findings, offers credence to the idea that disturbance of laryngeal function effected by an anomalous audition-phonation control system could be a causative agent in stuttering.

Object Wave Determination by Single-Sideband Methods

1973 ◽  
Vol 31 ◽  
pp. 266-267
Author(s):  
Kenneth H. Downing ◽  
Benjamin M. Siegel
Keyword(s):  
Phase Shift ◽  
Carbon Films ◽  
Object Wave ◽  
Electron Wave ◽  
Phase Object ◽  
Heavy Atoms ◽  
Single Sideband ◽  
Thin Carbon ◽  
Additional Phase Shift ◽  
Additional Phase

Under the “weak phase object” approximation, the component of the electron wave scattered by an object is phase shifted by π/2 with respect to the unscattered component. This phase shift has been confirmed for thin carbon films by many experiments dealing with image contrast and the contrast transfer theory. There is also an additional phase shift which is a function of the atomic number of the scattering atom. This shift is negligible for light atoms such as carbon, but becomes significant for heavy atoms as used for stains for biological specimens. The light elements are imaged as phase objects, while those atoms scattering with a larger phase shift may be imaged as amplitude objects. There is a great deal of interest in determining the complete object wave, i.e., both the phase and amplitude components of the electron wave leaving the object.

A Many-Beam Technique for Enhanced Resolution of Partial Dislocations

1972 ◽  
Vol 30 ◽  
pp. 646-647
Author(s):  
J. M. Oblak ◽  
B. H. Kear
Keyword(s):  
Phase Shift ◽  
Field Method ◽  
Dark Field ◽  
Bright Field ◽  
Field Technique ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Enhanced Resolution ◽  
Nickel Base ◽  
Beam Technique

The “weak-beam” and systematic many-beam techniques are the currently available methods for resolution of closely spaced dislocations or other inhomogeneities imaged through strain contrast. The former is a dark field technique and image intensities are usually very weak. The latter is a bright field technique, but generally use of a high voltage instrument is required. In what follows a bright field method for obtaining enhanced resolution of partial dislocations at 100 KV accelerating potential will be described.A brief discussion of an application will first be given. A study of intermediate temperature creep processes in commercial nickel-base alloys strengthened by the Ll2 Ni3 Al γ precipitate has suggested that partial dislocations such as those labelled 1 and 2 in Fig. 1(a) are in reality composed of two closely spaced a/6 <112> Shockley partials. Stacking fault contrast, when present, tends to obscure resolution of the partials; thus, conditions for resolution must be chosen such that the phase shift at the fault is 0 or a multiple of 2π.

Observation of surface morphology by reflection electron holography

1989 ◽  
Vol 47 ◽  
pp. 536-537
Author(s):  
N. Osakabe ◽  
J. Endo ◽  
T. Matsuda ◽  
A. Tonomura
Keyword(s):  
Phase Shift ◽  
Surface Morphology ◽  
High Sensitivity ◽  
High Energy ◽  
Path Difference ◽  
Transmission Mode ◽  
Electron Holography ◽  
Dynamical Process ◽  
High Vertical Resolution ◽  
Amplification Technique

Progress in microscopy such as STM and TEM-TED has revealed surface structures in atomic dimension. REM has been used for the observation of surface dynamical process and surface morphology. Recently developed reflection electron holography, which employes REM optics to measure the phase shift of reflected electron, has been proved to be effective for the observation of surface morphology in high vertical resolution ≃ 0.01 Å.The key to the high sensitivity of the method is best shown by comparing the phase shift generation by surface topography with that in transmission mode. Difference in refractive index between vacuum and material Vo/2E≃10-4 owes the phase shift in transmission mode as shownn Fig. 1( a). While geometrical path difference is created in reflection mode( Fig. 1(b) ), which is measured interferometrically using high energy electron beam of wavelength ≃0.01 Å. Together with the phase amplification technique , the vertivcal resolution is expected to be ≤0.01 Å in an ideal case.

Inelastic mean free path and phase-shift determinations in NiO, using EXELFS

1993 ◽  
Vol 3 (7) ◽  
pp. 1649-1659
Author(s):  
Mohammad A. Tafreshi ◽  
Stefan Csillag ◽  
Zou Wei Yuan ◽  
Christian Bohm ◽  
Elisabeth Lefèvre ◽  
...  
Keyword(s):  
Phase Shift ◽  
Free Path ◽  
Mean Free Path ◽  
Inelastic Mean Free Path
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