An analytical technique for reducing the influence of edge diffraction in reflection measurements made on thin acoustical panels

1986 ◽  
Vol 80 (1) ◽  
pp. 19-27 ◽  
Author(s):  
Jean C. Piquette
Keyword(s):  
Analytical Technique ◽  
Edge Diffraction

Trends in Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 228-229
Author(s):  
C. Colliex ◽  
P. Trebbia
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Materials Science ◽  
Analytical Technique ◽  
Recent Developments ◽  
Quantitative Results ◽  
Electron Microscopes ◽  
Electron Energy Loss ◽  
Primary Electrons

The physical foundations for the use of electron energy loss spectroscopy towards analytical purposes, seem now rather well established and have been extensively discussed through recent publications. In this brief review we intend only to mention most recent developments in this field, which became available to our knowledge. We derive also some lines of discussion to define more clearly the limits of this analytical technique in materials science problems.The spectral information carried in both low ( 0<ΔE<100eV ) and high ( >100eV ) energy regions of the loss spectrum, is capable to provide quantitative results. Spectrometers have therefore been designed to work with all kinds of electron microscopes and to cover large energy ranges for the detection of inelastically scattered electrons (for instance the L-edge of molybdenum at 2500eV has been measured by van Zuylen with primary electrons of 80 kV). It is rather easy to fix a post-specimen magnetic optics on a STEM, but Crewe has recently underlined that great care should be devoted to optimize the collecting power and the energy resolution of the whole system.

Spatially Resolved Photoelectron Spectroscopy: Recent Progress and Future Plans

1990 ◽  
Vol 48 (2) ◽  
pp. 388-389
Author(s):  
A. M. Bradshaw
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Reactivity ◽  
Target Material ◽  
Orbital Energy ◽  
Light Sources ◽  
Analytical Technique ◽  
Hartree Fock ◽  
Spatially Resolved ◽  
Koopmans Theorem ◽  
Surface Analytical Technique

X-ray photoelectron spectroscopy (XPS or ESCA) was not developed by Siegbahn and co-workers as a surface analytical technique, but rather as a general probe of electronic structure and chemical reactivity. The method is based on the phenomenon of photoionisation: The absorption of monochromatic radiation in the target material (free atoms, molecules, solids or liquids) causes electrons to be injected into the vacuum continuum. Pseudo-monochromatic laboratory light sources (e.g. AlKα) have mostly been used hitherto for this excitation; in recent years synchrotron radiation has become increasingly important. A kinetic energy analysis of the so-called photoelectrons gives rise to a spectrum which consists of a series of lines corresponding to each discrete core and valence level of the system. The measured binding energy, EB, given by EB = hv−EK, where EK is the kineticenergy relative to the vacuum level, may be equated with the orbital energy derived from a Hartree-Fock SCF calculation of the system under consideration (Koopmans theorem).

Recent developments in low-voltage SEM of polymers

1993 ◽  
Vol 51 ◽  
pp. 866-867
Author(s):  
S.J. Krause ◽  
W.W. Adams
Keyword(s):  
Low Voltage ◽  
Chromatic Aberration ◽  
Thermal Electron ◽  
Analytical Technique ◽  
Recent Developments ◽  
Beam Currents ◽  
New Generation ◽  
First Time ◽  
Voltage Scanning ◽  
Beam Damage

Over the past decade low voltage scanning electron microscopy (LVSEM) of polymers has evolved from an interesting curiosity to a powerful analytical technique. This development has been driven by improved instrumentation and in particular, reliable field emission gun (FEG) SEMs. The usefulness of LVSEM has also grown because of an improved theoretical and experimental understanding of sample-beam interactions and by advances in sample preparation and operating techniques. This paper will review progress in polymer LVSEM and present recent results and developments in the field.In the early 1980s a new generation of SEMs produced beam currents that were sufficient to allow imaging at low voltages from 5keV to 0.5 keV. Thus, for the first time, it became possible to routinely image uncoated polymers at voltages below their negative charging threshold, the "second crossover", E2 (Fig. 1). LVSEM also improved contrast and reduced beam damage in sputter metal coated polymers. Unfortunately, resolution was limited to a few tenths of a micron due to the low brightness and chromatic aberration of thermal electron emission sources.

Parallel Combining Different Approaches to Multi-pattern Matching for Fpga-based Security Systems

2017 ◽  
Vol 5 (1) ◽  
pp. 8-15
Author(s):  
Sergii Hilgurt ◽  
Keyword(s):  
Information Security ◽  
Pattern Matching ◽  
Intrusion Detection System ◽  
Detection System ◽  
Finite Automata ◽  
Network Intrusion Detection ◽  
Security Systems ◽  
Analytical Technique ◽  
Network Intrusion ◽  
Pros And Cons

The multi-pattern matching is a fundamental technique found in applications like a network intrusion detection system, anti-virus, anti-worms and other signature- based information security tools. Due to rising traffic rates, increasing number and sophistication of attacks and the collapse of Moore’s law, traditional software solutions can no longer keep up. Therefore, hardware approaches are frequently being used by developers to accelerate pattern matching. Reconfigurable FPGA-based devices, providing the flexibility of software and the near-ASIC performance, have become increasingly popular for this purpose. Hence, increasing the efficiency of reconfigurable information security tools is a scientific issue now. Many different approaches to constructing hardware matching circuits on FPGAs are known. The most widely used of them are based on discrete comparators, hash-functions and finite automata. Each approach possesses its own pros and cons. None of them still became the leading one. In this paper, a method to combine several different approaches to enforce their advantages has been developed. An analytical technique to quickly advance estimate the resource costs of each matching scheme without need to compile FPGA project has been proposed. It allows to apply optimization procedures to near-optimally split the set of pattern between different approaches in acceptable time.

HOMOTOPY ANALYSIS METHOD TO SOLVE BOUSSINESQ EQUATIONS

2015 ◽  
Vol 10 (3) ◽  
pp. 2825-2833
Author(s):  
Achala Nargund ◽  
R Madhusudhan ◽  
S B Sathyanarayana
Keyword(s):  
Homotopy Analysis Method ◽  
Degrees Of Freedom ◽  
Initial Approximation ◽  
Boussinesq Equations ◽  
Convergent Series ◽  
Boussinesq System ◽  
Analysis Method ◽  
Analytical Technique ◽  
Homotopy Analysis ◽  
Region Of Convergence

In this paper, Homotopy analysis method is applied to the nonlinear coupleddifferential equations of classical Boussinesq system. We have applied Homotopy analysis method (HAM) for the application problems in [1, 2, 3, 4]. We have also plotted Domb-Sykes plot for the region of convergence. We have applied Pade for the HAM series to identify the singularity and reflect it in the graph. The HAM is a analytical technique which is used to solve non-linear problems to generate a convergent series. HAM gives complete freedom to choose the initial approximation of the solution, it is the auxiliary parameter h which gives us a convenient way to guarantee the convergence of homotopy series solution. It seems that moreartificial degrees of freedom implies larger possibility to gain better approximations by HAM.

Influence of the Aperture Edge Diffraction Effects on the Mutual Coupling Compensation Technique in Small Planar Antenna Arrays

2011 ◽  
Vol 57 (1) ◽  
pp. 115-120 ◽  
Author(s):  
Mariusz Zamłyński ◽  
Piotr Słobodzian
Keyword(s):  
Antenna Arrays ◽  
Mutual Coupling ◽  
Planar Antenna ◽  
Sidelobe Level ◽  
Edge Diffraction ◽  
Narrow Angle ◽  
Compensation Technique ◽  
Diffraction Effects ◽  
Linear Antenna Arrays

Influence of the Aperture Edge Diffraction Effects on the Mutual Coupling Compensation Technique in Small Planar Antenna Arrays In this paper the quality of a technique to compensate for mutual coupling (and other phenomena) in small linear antenna arrays is investigated. The technique consists in calculation of a coupling matrix, which is than used to determine corrected antenna array excitation coefficients. Although the technique is known for more than 20 years, there is still very little information about how different phenomena existing in a real antenna arrays influence its performance. In this paper two models of antenna arrays are used. In the first model the effect of mutual coupling is separated from the aperture edge diffraction. In the second model antenna both mutual coupling and aperture edge diffraction effects are included. It is shown that mutual coupling itself can be compensated very well and an ultralow sidelobe level (i.e. -50 dB) could be achieved in practice. In the presence of diffraction effects -46.3 dB sidelobe level has been attained, but radiation pattern can be controled only in narrow angle range (i.e. up to ±60°).

A Simple Algorithm for Despiking Raman Spectra

2018 ◽  
Author(s):  
Darren Whitaker ◽  
Kevin Hayes
Keyword(s):  
Moving Average ◽  
Simple Algorithm ◽  
Mathematical Concepts ◽  
Charge Coupled Device ◽  
Analytical Technique ◽  
Minimal Sample ◽  
Minimal Distortion ◽  
Molecular Specificity ◽  
Ccd Detectors ◽  
Average Filter

Raman Spectroscopy is a widely used analytical technique, favoured when molecular specificity with minimal sample preparation is required.<br>The majority of Raman instruments use charge-coupled device (CCD) detectors, these are susceptible to cosmic rays and as such multiple spurious spikes can occur in the measurement. These spikes are problematic as they may hinder subsequent analysis, particularly if multivariate data analysis is required. In this work we present a new algorithm to remove these spikes from spectra after acquisition. Specifically we use calculation of modified <i>Z</i> scores to locate spikes followed by a simple moving average filter to remove them. The algorithm is very simple and its execution is essentially instantaneous, resulting in spike-free spectra with minimal distortion of actual Raman data. The presented algorithm represents an improvement on existing spike removal methods by utilising simple, easy to understand mathematical concepts, making it ideal for experts and non-experts alike. <br>

A Simple Algorithm for Despiking Raman Spectra

2018 ◽  
Author(s):  
Darren Whitaker ◽  
Kevin Hayes
Keyword(s):  
Moving Average ◽  
Simple Algorithm ◽  
Mathematical Concepts ◽  
Charge Coupled Device ◽  
Analytical Technique ◽  
Minimal Sample ◽  
Minimal Distortion ◽  
Molecular Specificity ◽  
Ccd Detectors ◽  
Average Filter

Raman Spectroscopy is a widely used analytical technique, favoured when molecular specificity with minimal sample preparation is required.<br>The majority of Raman instruments use charge-coupled device (CCD) detectors, these are susceptible to cosmic rays and as such multiple spurious spikes can occur in the measurement. These spikes are problematic as they may hinder subsequent analysis, particularly if multivariate data analysis is required. In this work we present a new algorithm to remove these spikes from spectra after acquisition. Specifically we use calculation of modified <i>Z</i> scores to locate spikes followed by a simple moving average filter to remove them. The algorithm is very simple and its execution is essentially instantaneous, resulting in spike-free spectra with minimal distortion of actual Raman data. The presented algorithm represents an improvement on existing spike removal methods by utilising simple, easy to understand mathematical concepts, making it ideal for experts and non-experts alike. <br>

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