Electronic organ having memory circuit

1979 ◽  
Vol 66 (6) ◽  
pp. 1916-1916
Author(s):  
John W. Robinson ◽  
Stephen L. Howell
1983 ◽  
Vol 74 (6) ◽  
pp. 1928-1928
Author(s):  
Alan B. Welsh ◽  
John W. Robinson
Keyword(s):  

2006 ◽  
Vol 42 (9) ◽  
pp. 514 ◽  
Author(s):  
K.-J. Gan ◽  
Y.-H. Chen ◽  
C.-S. Tsai ◽  
L.-X. Su
Keyword(s):  

1987 ◽  
Vol 22 (1) ◽  
pp. 85-91 ◽  
Author(s):  
T. Igarashi ◽  
H. Suzuki ◽  
S. Hasuo ◽  
T. Yamaoka
Keyword(s):  

Author(s):  
Xuhui Chen ◽  
Feilong Ding ◽  
Xiaoqing Huang ◽  
Xinnan Lin ◽  
Runsheng Wang ◽  
...  

1981 ◽  
Vol 69 (1) ◽  
pp. 338-338
Author(s):  
Harold O. Schwartz ◽  
Dennis E. Kidd

1987 ◽  
Vol 81 (5) ◽  
pp. 1658-1658
Author(s):  
Stephen L. Howell
Keyword(s):  

Brain ◽  
2014 ◽  
Vol 137 (7) ◽  
pp. 2065-2076 ◽  
Author(s):  
Rachel H. Tan ◽  
Stephanie Wong ◽  
Jillian J. Kril ◽  
Olivier Piguet ◽  
Michael Hornberger ◽  
...  

Author(s):  
Bui Nguyen Quoc Trinh

Abstract: A novel concept of NAND memory array has been proposed by using only ferroelectric-gate thin film transistors (FGTs), whose structure is constructed from a sol-gel ITO channel and a sol-gel stacked ferroelectric between Bi3.25La0.75Ti3O12 and PbZr0.52TiO0.48O3 (BLT/PZT) gate insulator. Interestingly, ferroelectric cells with a wide memory window of 3 V and a large on/off current ratio of 6 orders, have been successfully integrated in a NAND memory circuit. To protect data writing or reading from disturbance, ferroelectric transistor cells are directly used, instead of paraelectric transistor cells as usual. As a result, we have verified disturbance-free operation for data reading and writing, with a small loss of the memory state and a low power consumption, in principle. Keywords: ITO, PZT, NAND, FeRAM, ferroelectric.


Sign in / Sign up

Export Citation Format

Share Document