Detection of beaked whales using near surface towed hydrophones: prospects for survey and mitigation

2008 ◽  
Vol 123 (5) ◽  
pp. 3774-3774 ◽  
Author(s):  
Douglas Gillespie ◽  
Jonathan Gordon ◽  
Marjolaine Caillat ◽  
Diane Claridge ◽  
David Moretti ◽  
...  
Keyword(s):  
Near Surface ◽  
Beaked Whales

Variation in dive behavior of Cuvier’s beaked whales with seafloor depth, time-of-day, and lunar illumination

2020 ◽  
Vol 644 ◽  
pp. 199-214 ◽  
Author(s):  
J Barlow ◽  
GS Schorr ◽  
EA Falcone ◽  
D Moretti
Keyword(s):  
Surface Waters ◽  
Predator Avoidance ◽  
Time Of Day ◽  
Maximum Depth ◽  
Near Surface ◽  
Beaked Whales ◽  
Energetic Constraints ◽  
The Mean ◽  
Ziphius Cavirostris ◽  
Foraging Time

Depth distributions were analyzed from a study of 19 Cuvier’s beaked whales Ziphius cavirostris that were tagged with satellite transmitting instruments off southern California, USA. Over 113000 depth measurements were made over the equivalent of ~200 sampling days. The mean foraging depth was 1182 m (SD = 305 m), and the mean of the maximum depth of all foraging dives was 1427 m (SD = 298 m). Mean foraging depths increased with seafloor depths up to a maximum of ~1300 m at a seafloor depth of 1900 m, but decreased slightly to a mean of ~1200 m at seafloor depths of 2000-4000 m. Near-bottom habitat appears to be important for foraging; whales spent ~30% of their foraging time within 200 m of the bottom at seafloor depths of 1000-2000 m. However, little foraging time was spent near the bottom at seafloor depths greater than 2000 m. The percentage of time spent at near-surface depths (<50 m) was more than twice as high at night (25%) than during the day (12%). Lunar light also appears to affect diving, with 28% of dark nights and only 17% of brightly moonlit nights spent at these near-surface depths. The apparent avoidance of surface waters during daytime and on brightly moonlit nights is consistent with avoidance of visual predators. A considerably greater fraction of time was spent foraging at night (24.8%) than during the day (15.7%), possibly due to energetic constraints imposed by predator avoidance during the day.

scholarly journals Temporal patterns in the acoustic signals of beaked whales at Cross Seamount

2008 ◽  
Vol 4 (2) ◽  
pp. 208-211 ◽  
Author(s):  
D.W Johnston ◽  
M McDonald ◽  
J Polovina ◽  
R Domokos ◽  
S Wiggins ◽  
...  
Keyword(s):  
Surface Waters ◽  
High Frequency ◽  
Marine Mammals ◽  
Prey Capture ◽  
Prey Availability ◽  
Beaked Whale ◽  
Near Surface ◽  
Beaked Whales ◽  
Fisheries Acoustics ◽  
Acoustic Recording

Seamounts may influence the distribution of marine mammals through a combination of increased ocean mixing, enhanced local productivity and greater prey availability. To study the effects of seamounts on the presence and acoustic behaviour of cetaceans, we deployed a high-frequency acoustic recording package on the summit of Cross Seamount during April through October 2005. The most frequently detected cetacean vocalizations were echolocation sounds similar to those produced by ziphiid and mesoplodont beaked whales together with buzz-type signals consistent with prey-capture attempts. Beaked whale signals occurred almost entirely at night throughout the six-month deployment. Measurements of prey presence with a Simrad EK-60 fisheries acoustics echo sounder indicate that Cross Seamount may enhance local productivity in near-surface waters. Concentrations of micronekton were aggregated over the seamount in near-surface waters at night, and dense concentrations of nekton were detected across the surface of the summit. Our results suggest that seamounts may provide enhanced foraging opportunities for beaked whales during the night through a combination of increased productivity, vertical migrations by micronekton and local retention of prey. Furthermore, the summit of the seamount may act as a barrier against which whales concentrate prey.

scholarly journals Acoustic detection range and population density of Cuvier's beaked whales estimated from near-surface hydrophones

2021 ◽  
Vol 149 (1) ◽  
pp. 111-125
Author(s):  
Jay Barlow ◽  
Selene Fregosi ◽  
Len Thomas ◽  
Danielle Harris ◽  
Emily T. Griffiths
Keyword(s):  
Population Density ◽  
Acoustic Detection ◽  
Detection Range ◽  
Near Surface ◽  
Beaked Whales

Benthic foraminiferal zonation in deep-water carbonate platform margin environments, northern Little Bahama Bank

1988 ◽  
Vol 62 (01) ◽  
pp. 1-8 ◽  
Author(s):  
Ronald E. Martin
Keyword(s):  
Deep Water ◽  
Benthic Foraminifera ◽  
Carbonate Platform ◽  
Sedimentary Facies ◽  
Depositional Environments ◽  
Near Surface ◽  
Sediment Gravity Flows ◽  
Gravity Flows ◽  
Platform Margin ◽  
Water Carbonate

The utility of benthic foraminifera in bathymetric interpretation of clastic depositional environments is well established. In contrast, bathymetric distribution of benthic foraminifera in deep-water carbonate environments has been largely neglected. Approximately 260 species and morphotypes of benthic foraminifera were identified from 12 piston core tops and grab samples collected along two traverses 25 km apart across the northern windward margin of Little Bahama Bank at depths of 275-1,135 m. Certain species and operational taxonomic groups of benthic foraminifera correspond to major near-surface sedimentary facies of the windward margin of Little Bahama Bank and serve as reliable depth indicators. Globocassidulina subglobosa, Cibicides rugosus, and Cibicides wuellerstorfi are all reliable depth indicators, being most abundant at depths &gt;1,000 m, and are found in lower slope periplatform aprons, which are primarily comprised of sediment gravity flows. Reef-dwelling peneroplids and soritids (suborder Miliolina) and rotaliines (suborder Rotaliina) are most abundant at depths &lt;300 m, reflecting downslope bottom transport in proximity to bank-margin reefs. Small miliolines, rosalinids, and discorbids are abundant in periplatform ooze at depths &lt;300 m and are winnowed from the carbonate platform. Increased variation in assemblage diversity below 900 m reflects mixing of shallow- and deep-water species by sediment gravity flows.

Analysis of 2D and 3D defects associated with precipitation of Cu in silicon

1991 ◽  
Vol 49 ◽  
pp. 870-871
Author(s):  
P.M. Rice ◽  
MJ. Kim ◽  
R.W. Carpenter
Keyword(s):  
Colony Growth ◽  
Dark Field ◽  
Dark Side ◽  
Silicide Phase ◽  
Strain Fields ◽  
Near Surface ◽  
Unknown Composition ◽  
Secondary Precipitates ◽  
20 Nm ◽  
2D And 3D

Extrinsic gettering of Cu on near-surface dislocations in Si has been the topic of recent investigation. It was shown that the Cu precipitated hetergeneously on dislocations as Cu silicide along with voids, and also with a secondary planar precipitate of unknown composition. Here we report the results of investigations of the sense of the strain fields about the large (~100 nm) silicide precipitates, and further analysis of the small (~10-20 nm) planar precipitates.Numerous dark field images were analyzed in accordance with Ashby and Brown's criteria for determining the sense of the strain fields about precipitates. While the situation is complicated by the presence of dislocations and secondary precipitates, micrographs like those shown in Fig. 1(a) and 1(b) tend to show anomalously wide strain fields with the dark side on the side of negative g, indicating the strain fields about the silicide precipitates are vacancy in nature. This is in conflict with information reported on the η'' phase (the Cu silicide phase presumed to precipitate within the bulk) whose interstitial strain field is considered responsible for the interstitial Si atoms which cause the bounding dislocation to expand during star colony growth.

Shock consolidation of Ni-Ti alloy powder

1986 ◽  
Vol 44 ◽  
pp. 430-431
Author(s):  
Naresh N. Thadhani ◽  
Thad Vreeland ◽  
Thomas J. Ahrens
Keyword(s):  
Alloy Powder ◽  
Amorphous Material ◽  
Ti Alloy ◽  
Two Phase ◽  
Near Surface ◽  
Optical Micrograph ◽  
Shock Compaction ◽  
Powder Particles ◽  
Ti Powder ◽  
Rapidly Solidified

A spherically-shaped, microcrystalline Ni-Ti alloy powder having fairly nonhomogeneous particle size distribution and chemical composition was consolidated with shock input energy of 316 kJ/kg. In the process of consolidation, shock energy is preferentially input at particle surfaces, resulting in melting of near-surface material and interparticle welding. The Ni-Ti powder particles were 2-60 μm in diameter (Fig. 1). About 30-40% of the powder particles were Ni-65wt% and balance were Ni-45wt%Ti (estimated by EMPA).Upon shock compaction, the two phase Ni-Ti powder particles were bonded together by the interparticle melt which rapidly solidified, usually to amorphous material. Fig. 2 is an optical micrograph (in plane of shock) of the consolidated Ni-Ti alloy powder, showing the particles with different etching contrast.

Preparation of cross-sectional samples for near-surface TEM studies

1987 ◽  
Vol 45 ◽  
pp. 380-381
Author(s):  
R.C. Dickenson ◽  
K.R. Lawless
Keyword(s):  
Standard Sample ◽  
Surface Region ◽  
Specimen Preparation ◽  
Thick Sheet ◽  
Drill Bit ◽  
Sample Holder ◽  
Metal Interface ◽  
Cross Sectional ◽  
Near Surface ◽  
Cold Worked

In thermal oxidation studies, the structure of the oxide-metal interface and the near-surface region is of great importance. A technique has been developed for constructing cross-sectional samples of oxidized aluminum alloys, which reveal these regions. The specimen preparation procedure is as follows: An ultra-sonic drill is used to cut a 3mm diameter disc from a 1.0mm thick sheet of the material. The disc is mounted on a brass block with low-melting wax, and a 1.0mm hole is drilled in the disc using a #60 drill bit. The drill is positioned so that the edge of the hole is tangent to the center of the disc (Fig. 1) . The disc is removed from the mount and cleaned with acetone to remove any traces of wax. To remove the cold-worked layer from the surface of the hole, the disc is placed in a standard sample holder for a Tenupol electropolisher so that the hole is in the center of the area to be polished.

Near-Surface Aggregation of Sn In Heavily Sn-Doped GaAs Films Grown By Molecular Beam Epitaxy

1985 ◽  
Vol 43 ◽  
pp. 368-369
Author(s):  
S. H. Chen
Keyword(s):  
Molecular Beam Epitaxy ◽  
Cross Section ◽  
Electron Spectroscopy ◽  
Molecular Beam ◽  
Surface Segregation ◽  
Secondary Ion Mass Spectrometry ◽  
Specimen Preparation ◽  
Near Surface ◽  
Gaas Films ◽  
Secondary Ion

Sn has been used extensively as an n-type dopant in GaAs grown by molecular-beam epitaxy (MBE). The surface accumulation of Sn during the growth of Sn-doped GaAs has been observed by several investigators. It is still not clear whether the accumulation of Sn is a kinetically hindered process, as proposed first by Wood and Joyce, or surface segregation due to thermodynamic factors. The proposed donor-incorporation mechanisms were based on experimental results from such techniques as secondary ion mass spectrometry, Auger electron spectroscopy, and C-V measurements. In the present study, electron microscopy was used in combination with cross-section specimen preparation. The information on the morphology and microstructure of the surface accumulation can be obtained in a fine scale and may confirm several suggestions from indirect experimental evidence in the previous studies.

Specimen Preparation of Near Surface Ion Irradiated Samples

1985 ◽  
Vol 43 ◽  
pp. 170-171
Author(s):  
K. F. Russell ◽  
L. L. Horton
Keyword(s):  
Radiation Damage ◽  
Heavy Ions ◽  
Target Material ◽  
Metal Alloys ◽  
Specimen Surface ◽  
Specimen Preparation ◽  
Particle Accelerators ◽  
Near Surface ◽  
Graaff Accelerator ◽  
Van De Graaff

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.

Comparison of Ion-Milling Techniques For Cross-Sectional TEM of Semiconductors

1985 ◽  
Vol 43 ◽  
pp. 166-167
Author(s):  
Julia T. Luck ◽  
C. W. Boggs ◽  
S. J. Pennycook
Keyword(s):  
Analytical Techniques ◽  
Sample Surface ◽  
Ion Milling ◽  
Cross Sectional ◽  
Reliable Technique ◽  
Near Surface ◽  
Transmission Electron ◽  
Thin Region ◽  
Transient Thermal

The use of cross-sectional Transmission Electron Microscopy (TEM) has become invaluable for the characterization of the near-surface regions of semiconductors following ion-implantation and/or transient thermal processing. A fast and reliable technique is required which produces a large thin region while preserving the original sample surface. New analytical techniques, particularly the direct imaging of dopant distributions, also require good thickness uniformity. Two methods of ion milling are commonly used, and are compared below. The older method involves milling with a single gun from each side in turn, whereas a newer method uses two guns to mill from both sides simultaneously.

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