Use of thin PVDF film for measuring small single‐crystal samples of high temperature superconductors
1988 ◽
Vol 84
(S1)
◽
pp. S67-S67
Keyword(s):
1988 ◽
Vol 153-155
◽
pp. 1335-1336
◽
Keyword(s):
1995 ◽
Vol 242
(1-2)
◽
pp. 174-182
◽
1993 ◽
Vol 49
(s1)
◽
pp. c297-c297
1988 ◽
Vol 84
(S1)
◽
pp. S109-S109
◽