scholarly journals Impurity level lifetime measurements using a lock‐in amplifier

1996 ◽  
Vol 64 (6) ◽  
pp. 787-791 ◽  
Author(s):  
Kenneth Edmondson ◽  
Steve Agoston ◽  
Radha Ranganathan
Keyword(s):  
Impurity Level ◽  
Lifetime Measurements ◽  
Level Lifetime ◽  
Lock In

Level lifetime measurements and the structure of neutron-richGe78

1993 ◽  
Vol 47 (1) ◽  
pp. 157-162 ◽  
Author(s):  
W.-T. Chou ◽  
D. S. Brenner ◽  
R. F. Casten ◽  
R. L. Gill
Keyword(s):  
Lifetime Measurements ◽  
Level Lifetime

Excited level lifetime measurements following very low energy nuclear recoils

1992 ◽  
Vol 75 (1-4) ◽  
pp. 533-542 ◽  
Author(s):  
S. J. Robinson ◽  
J. Jolie ◽  
H. G. Börner ◽  
S. Ulbig ◽  
D. Janssen
Keyword(s):  
Excited Level ◽  
Low Energy ◽  
Lifetime Measurements ◽  
Level Lifetime ◽  
Nuclear Recoils

Low level lifetime measurements on electron irradiated silicon

1981 ◽  
Vol 31 (3) ◽  
pp. 345-346 ◽  
Author(s):  
J. Kodeš ◽  
J. Samek ◽  
J. Zamastil
Keyword(s):  
Lifetime Measurements ◽  
Level Lifetime ◽  
Low Level

A differential converter for nuclear level lifetime measurements

1969 ◽  
Vol 71 (1) ◽  
pp. 99-101 ◽  
Author(s):  
E.Ye. Berlovitch ◽  
V.A. Kotchkin ◽  
V.V. Lukashevitch ◽  
A.V. Popov ◽  
V.M. Romanov
Keyword(s):  
Nuclear Level ◽  
Lifetime Measurements ◽  
Level Lifetime
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