Angular-dependent coherent scatter measured with a diagnostic x-ray image intensifier-based imaging system

1996 ◽  
Vol 23 (5) ◽  
pp. 723-733 ◽  
Author(s):  
M. S. Westmore ◽  
A. Fenster ◽  
I. A. Cunningham
2019 ◽  
Vol 14 (0) ◽  
pp. 1402128-1402128
Author(s):  
Canbin HUANG ◽  
Kazuaki HANADA ◽  
Kengoh KURODA ◽  
Shinichro KOJIMA ◽  
Hiroaki FUJIYOSHI ◽  
...  

MRS Bulletin ◽  
1988 ◽  
Vol 13 (4) ◽  
pp. 44-48 ◽  
Author(s):  
R.E. Green

As useful as classical x-ray diffraction techniques have been, the ability to obtain x-ray diffraction images with extremely short exposure rimes opens up new opportunities for materials scientists, including real-time materials process control. This article briefly describes state-of-the-art systems for obtaining extremely rapid and real-time x-ray diffraction images and gives several examples of their applications for materials process control.Two generic electro-optical methods permit real-time viewing and recording of x-ray diffraction images. The first uses a low-intensity conventional x-ray tube source leading to a low-intensity diffraction image, which requires a high-gain electro-optical imaging system. The second uses either a high-intensity rotating anode, synchrotron, or flash x-ray source. Such a high-intensity source produces a high-intensity diffraction image, permitting use of a low-gain high-resolution electro-optical imaging system.Figure 1 schematically shows two types of image intensifier tubes which have been most often used to view x-ray diffraction images. By cascading three individual first generation image tube stages (Figure 1a), light gains as high as several million can be obtained. The second generation microchannel-plate image intensifier tube (Figure 1b) is similar to a single-stage first generation device except for the extremely important addition of a microchannel plate.


Author(s):  
Jean-Claude Jésior ◽  
Roger Vuong ◽  
Henri Chanzy

Starch is arranged in a crystalline manner within its storage granules and should thus give sharp X-ray diagrams. Unfortunately most of the common starch granules have sizes between 1 and 100μm, making them too small for an X-ray study on individual grains. There is only one instance where an oriented X-ray diagram could be obtained on one sector of an individual giant starch granule. Despite their small size, starch granules are still too thick to be studied by electron diffraction with a transmission electron microscope. The only reported study on starch ultrastructure using electron diffraction on frozen hydrated material was made on small fragments. The present study has been realized on thin sectioned granules previously litnerized to improve the signal to noise ratio.Potato starch was hydrolyzed for 10 days in 2.2N HCl at 35°C, dialyzed against water until neutrality and embedded in Nanoplast. Sectioning was achieved with a commercially available low-angle “35°” diamond knife (Diatome) after a very carefull trimming and a pre-sectioning with a classical “45°” diamond knife. Sections obtained at a final sectioning angle of 42.2° (compared with the usual 55-60°) and at a nominal thickness of 900Å were collected on a Formvar-carbon coated grid. The exact location of the starch granules in their sections was recorded by optical microscopy on a Zeiss Universal polarizing microscope (Fig. 1a). After rehydration at a relative humidity of 95% for 24 hours they were mounted on a Philips cryoholder and quench frozen in liquid nitrogen before being inserted under frozen conditions in a Philips EM 400T electron microscope equipped with a Gatan anticontaminator and a Lhesa image intensifier.


1979 ◽  
Vol 26 (11) ◽  
pp. 1711-1717
Author(s):  
A.I. Carlson ◽  
B.M. Singer

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