Effect of various noise sources on the detective quantum efficiency of phosphor screens

1990 ◽  
Vol 17 (5) ◽  
pp. 887-893 ◽  
Author(s):  
Robert M. Nishikawa ◽  
Martin J. Yaffe
Keyword(s):  
Quantum Efficiency ◽  
Detective Quantum Efficiency ◽  
Noise Sources ◽  
Phosphor Screens

Yag Single Crystals for Scintillators of Stem

1990 ◽  
Vol 48 (1) ◽  
pp. 166-167
Author(s):  
M. Hibino ◽  
K. Irie ◽  
R. Autrata ◽  
P. schauer
Keyword(s):  
Single Crystals ◽  
Yttrium Aluminum Garnet ◽  
Light Guide ◽  
Detection System ◽  
Polished Surface ◽  
Detective Quantum Efficiency ◽  
Backscattered Electrons ◽  
Electron Detection ◽  
Yttrium Aluminum ◽  
Phosphor Screens

Although powdered phosphor screens are usually used for scintillators of STEM, it has been found that the phosphor screen of appropriate thickness should be used depending on the accelerating voltage, in order to keep high detective quantum efficiency. 1 It has been also found that the variation in sensitivity, due to granularity of phosphor screens, makes the measurement of fine electron probe difficult and that the sensitivity reduces with electron irradiation specially at high voltages.In order to find out a preferable scintillator for STEM, single crystals of YAG (yttrium aluminum garnet), which are used for detecting secondary and backscattered electrons in SEM were investigated and compared with powdered phosphor screens, at the accelerating voltages of 100kV and 1 MV. A conventional electron detection system, consisting of scintillator, light guide and PMT (Hamamatsu Photonics R268) was used for measurements. Scintillators used are YAG single crystals of 1.0 to 3.2mm thicknesses (with surfaces matted for good interface to the light guide) and of 0.8mm thickness (with polished surface), and powdered P-46 phosphor screens of 0.07mm and 1.0mm thicknesses for 100kV and 1MV, respectively. Surfaces on electron-incidence side of all scintillators are coated with reflecting layers.

scholarly journals Determination of the detective quantum efficiency of a prototype, megavoltage indirect detection, active matrix flat-panel imager

2001 ◽  
Vol 28 (12) ◽  
pp. 2538-2550 ◽  
Author(s):  
Youcef El-Mohri ◽  
Kyung-Wook Jee ◽  
Larry E. Antonuk ◽  
Manat Maolinbay ◽  
Qihua Zhao
Keyword(s):  
Quantum Efficiency ◽  
Indirect Detection ◽  
Detective Quantum Efficiency ◽  
Flat Panel ◽  
Active Matrix

A detective quantum efficiency for spectroscopic X‐ray imaging detectors

2021 ◽  
Author(s):  
Jesse Tanguay ◽  
Devon Richtsmeier ◽  
Christopher Dydula ◽  
James A. Day ◽  
Kris Iniewski ◽  
...  
Keyword(s):  
Quantum Efficiency ◽  
Detective Quantum Efficiency ◽  
X Ray ◽  
X Ray Imaging ◽  
Imaging Detectors
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