Extension of Fourier methods to the calculation of effective depths in heterogeneous media of arbitrary contour

1986 ◽  
Vol 13 (6) ◽  
pp. 925-927
Author(s):  
George Starkschall
Author(s):  
D. E. Johnson

Increased specimen penetration; the principle advantage of high voltage microscopy, is accompanied by an increased need to utilize information on three dimensional specimen structure available in the form of two dimensional projections (i.e. micrographs). We are engaged in a program to develop methods which allow the maximum use of information contained in a through tilt series of micrographs to determine three dimensional speciman structure.In general, we are dealing with structures lacking in symmetry and with projections available from only a limited span of angles (±60°). For these reasons, we must make maximum use of any prior information available about the specimen. To do this in the most efficient manner, we have concentrated on iterative, real space methods rather than Fourier methods of reconstruction. The particular iterative algorithm we have developed is given in detail in ref. 3. A block diagram of the complete reconstruction system is shown in fig. 1.


2014 ◽  
Vol 2014 (1) ◽  
pp. 99-110
Author(s):  
Vladimir Sergeevich Fedotovskij ◽  
Tat’yana Nikolaevna Vereschagina ◽  
Svetlana Valer’evna Lunina ◽  
Evgeniya Aleksandrovna Ivanova
Keyword(s):  

Author(s):  
Carolina Palma Naveira Cotta ◽  
Renato Machado Cotta ◽  
Anderson Pereira de Almeida

Author(s):  
Carolina Palma Naveira Cotta ◽  
Kelvin Chen ◽  
Christopher Tostado ◽  
Philippe Rollemberg d'Egmont ◽  
Fernando Duda ◽  
...  

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