Shaped field electron dosimetry for a Philips SL75/10 linear accelerator

1983 ◽  
Vol 10 (3) ◽  
pp. 356-360 ◽  
Author(s):  
Ravi P. Nair ◽  
T. K. M. Nair ◽  
Don E. Wrede
Keyword(s):  
Linear Accelerator ◽  
Field Electron ◽  
Electron Dosimetry

Small-field electron dosimetry for the Philips SL25 linear accelerator

1990 ◽  
Vol 17 (4) ◽  
pp. 710-714 ◽  
Author(s):  
H. Rashid ◽  
M. K. Islam ◽  
H. Gaballa ◽  
U. F. Rosenow ◽  
J. Y. Ting
Keyword(s):  
Linear Accelerator ◽  
Small Field ◽  
Field Electron ◽  
Electron Dosimetry

scholarly journals PO-0841: Experimental comparison of detectors for small field electron dosimetry

2015 ◽  
Vol 115 ◽  
pp. S426
Author(s):  
O.S. Dohm ◽  
V. Spöring ◽  
B. Zeeb ◽  
S. Tsitsekidis ◽  
D. Thorwarth
Keyword(s):  
Experimental Comparison ◽  
Small Field ◽  
Field Electron ◽  
Electron Dosimetry

Automatic Electron Dosimetry System for a Micro wave Linear Accelerator

Radiology ◽  
1966 ◽  
Vol 87 (2) ◽  
pp. 353-353
Author(s):  
Kenneth I. Cook ◽  
Joseph Mantel
Keyword(s):  
Linear Accelerator ◽  
Dosimetry System ◽  
Electron Dosimetry

Utilizing Dark Field Electron Microscopy to Produce Lantern Slides

1974 ◽  
Vol 32 ◽  
pp. 116-117
Author(s):  
J. N. Meador ◽  
C. N. Sun ◽  
H. J. White
Keyword(s):  
Electron Microscope ◽  
Electron Micrographs ◽  
Dark Field ◽  
Limiting Factor ◽  
Clinical Laboratories ◽  
Field Electron ◽  
Time Element ◽  
Field Electron Microscopy ◽  
Dark Field Electron ◽  
Dark Field Micrographs

The electron microscope is being utilized more and more in clinical laboratories for pathologic diagnosis. One of the major problems in the utilization of the electron microscope for diagnostic purposes is the time element involved. Recent experimentation with rapid embedding has shown that this long phase of the process can be greatly shortened. In rush cases the making of projection slides can be eliminated by taking dark field electron micrographs which show up as a positive ready for use. The major limiting factor for use of dark field micrographs is resolution. However, for conference purposes electron micrographs are usually taken at 2.500X to 8.000X. At these low magnifications the resolution obtained is quite acceptable.

Evaluation of the dark field method for large association of spread DNA

1978 ◽  
Vol 36 (2) ◽  
pp. 190-191
Author(s):  
Douglas C. Barker
Keyword(s):  
Electron Microscopy ◽  
Molecular Weight ◽  
Mitochondrial Dna ◽  
Extraction Method ◽  
Field Method ◽  
Dark Field ◽  
Kinetoplast Dna ◽  
Field Electron ◽  
Field Electron Microscopy ◽  
Dark Field Electron

A number of satisfactory methods are available for the electron microscopy of nicleic acids. These methods concentrated on fragments of nuclear, viral and mitochondrial DNA less than 50 megadaltons, on denaturation and heteroduplex mapping (Davies et al 1971) or on the interaction between proteins and DNA (Brack and Delain 1975). Less attention has been paid to the experimental criteria necessary for spreading and visualisation by dark field electron microscopy of large intact issociations of DNA. This communication will report on those criteria in relation to the ultrastructure of the (approx. 1 x 10-14g) DNA component of the kinetoplast from Trypanosomes. An extraction method has been developed to eliminate native endonucleases and nuclear contamination and to isolate the kinetoplast DNA (KDNA) as a compact network of high molecular weight. In collaboration with Dr. Ch. Brack (Basel [nstitute of Immunology), we studied the conditions necessary to prepare this KDNA Tor dark field electron microscopy using the microdrop spreading technique.

Injector for a 100-500 kV Linac Electron Microscopy Source

1967 ◽  
Vol 25 ◽  
pp. 274-275
Author(s):  
John W. Coleman
Keyword(s):  
Electron Microscopy ◽  
Linear Accelerator ◽  
Beam Current ◽  
Ion Trapping ◽  
University Of Virginia ◽  
Electron Injector ◽  
Illumination System ◽  
Radio Corporation Of America ◽  
The University ◽  
Optical Integration

The injector to be described is a component in the Electron Injector-Linear Accelerator—Condenser Module for illumination used on the variable 100-500kV electron microscope being built at the Radio Corporation of America for the University of Virginia.The injector is an independently powered, autonomous unit, operating at a constant 6kV positive with respect to accelerator potential, thereby making beam current independent of accelerator potential. The injector provides for on-axis ion trapping to prolong filament lifetime, and incorporates a derived Einzel lens for optical integration into the overall illumination system for microscopy. Electrostatic beam deflectors for alignment are an integral part of the apparatus. The entire injector unit is cantilevered off a door for side loading, and is topped with a 4-filament turret released electrically but driven by a self-contained Negator spring motor.

Simulated Dark-Field Electron Micrographs of Point Defects and Organometallics

1975 ◽  
Vol 33 ◽  
pp. 200-201
Author(s):  
William Krakow
Keyword(s):  
Electron Micrographs ◽  
Point Defects ◽  
Structure Determination ◽  
Atomic Structure ◽  
Image Interpretation ◽  
Dark Field ◽  
Field Electron ◽  
Dark Field Microscopy ◽  
Dark Field Electron

Tilted beam dark-field microscopy has been applied to atomic structure determination in perfect crystals, several synthesized molecules with heavy atcm markers and in the study of displaced atoms in crystals. Interpretation of this information in terms of atom positions and atom correlations is not straightforward. Therefore, calculated dark-field images can be an invaluable aid in image interpretation.

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