Electron beam depth dose scaling by means of effective atomic number reconstructed from CT scans

1979 ◽  
Vol 6 (6) ◽  
pp. 526-529 ◽  
Author(s):  
Ratna Datta ◽  
Sobhendranath Datta ◽  
William D. McDavid ◽  
Robert G. Waggener
Keyword(s):  
Electron Beam ◽  
Atomic Number ◽  
Effective Atomic Number ◽  
Ct Scans ◽  
Depth Dose ◽  
Beam Depth

PO-1486: Electron beam depth dose distributions in 3D-printed samples with different material filling factor

2020 ◽  
Vol 152 ◽  
pp. S799-S800
Author(s):  
S. StuchebroV ◽  
A. Bulavskaya ◽  
Y. Cherepennikov ◽  
B. Gavrikov ◽  
I. Miloichikova ◽  
...  
Keyword(s):  
Electron Beam ◽  
Filling Factor ◽  
Dose Distributions ◽  
Depth Dose ◽  
Beam Depth ◽  
3D Printed

Effects of extended SSD on electron-beam depth-dose curves

1994 ◽  
Vol 19 (2) ◽  
pp. 77-81 ◽  
Author(s):  
Cheng B. Saw ◽  
Todd Pawlicki ◽  
Leroy J. Korb ◽  
Andrew Wu
Keyword(s):  
Electron Beam ◽  
Depth Dose ◽  
Beam Depth

scholarly journals Electron Beam Depth Dose Distribution Evaluation

1970 ◽  
Vol 9 (6) ◽  
pp. 545-554 ◽  
Author(s):  
A. Jacobson ◽  
Th. E. Banks ◽  
M. A. Ackerman ◽  
H. E. Brizel ◽  
R. M. Scott
Keyword(s):  
Electron Beam ◽  
Dose Distribution ◽  
Depth Dose ◽  
Beam Depth ◽  
Depth Dose Distribution

Material Identification in Presence of Metal for Baggage Screening

2020 ◽  
Vol 2020 (14) ◽  
pp. 294-1-294-8
Author(s):  
Sandamali Devadithya ◽  
David Castañón
Keyword(s):  
Atomic Number ◽  
Effective Atomic Number ◽  
Simulated Data ◽  
Dual Energy ◽  
Basis Functions ◽  
Total Variation Regularization ◽  
Ct Scanner ◽  
Edge Preserving ◽  
Baggage Screening ◽  
Dual Energy Imaging

Dual-energy imaging has emerged as a superior way to recognize materials in X-ray computed tomography. To estimate material properties such as effective atomic number and density, one often generates images in terms of basis functions. This requires decomposition of the dual-energy sinograms into basis sinograms, and subsequently reconstructing the basis images. However, the presence of metal can distort the reconstructed images. In this paper we investigate how photoelectric and Compton basis functions, and synthesized monochromatic basis (SMB) functions behave in the presence of metal and its effect on estimation of effective atomic number and density. Our results indicate that SMB functions, along with edge-preserving total variation regularization, show promise for improved material estimation in the presence of metal. The results are demonstrated using both simulated data as well as data collected from a dualenergy medical CT scanner.

A Spectrum-Adaptive Decomposition Method for Effective Atomic Number Estimation Using Dual Energy CT

2020 ◽  
Vol 2020 (14) ◽  
pp. 293-1-293-7
Author(s):  
Ankit Manerikar ◽  
Fangda Li ◽  
Avinash C. Kak
Keyword(s):  
Atomic Number ◽  
Decomposition Method ◽  
Traditional Approach ◽  
Effective Atomic Number ◽  
Dual Energy ◽  
Performance Comparison ◽  
Estimation Methods ◽  
Dual Energy Ct ◽  
Projection Data ◽  
X Ray

Dual Energy Computed Tomography (DECT) is expected to become a significant tool for voxel-based detection of hazardous materials in airport baggage screening. The traditional approach to DECT imaging involves collecting the projection data using two different X-ray spectra and then decomposing the data thus collected into line integrals of two independent characterizations of the material properties. Typically, one of these characterizations involves the effective atomic number (Zeff) of the materials. However, with the X-ray spectral energies typically used for DECT imaging, the current best-practice approaches for dualenergy decomposition yield Zeff values whose accuracy range is limited to only a subset of the periodic-table elements, more specifically to (Z < 30). Although this estimation can be improved by using a system-independent ρe — Ze (SIRZ) space, the SIRZ transformation does not efficiently model the polychromatic nature of the X-ray spectra typically used in physical CT scanners. In this paper, we present a new decomposition method, AdaSIRZ, that corrects this shortcoming by adapting the SIRZ decomposition to the entire spectrum of an X-ray source. The method reformulates the X-ray attenuation equations as direct functions of (ρe, Ze) and solves for the coefficients using bounded nonlinear least-squares optimization. Performance comparison of AdaSIRZ with other Zeff estimation methods on different sets of real DECT images shows that AdaSIRZ provides a higher output accuracy for Zeff image reconstructions for a wider range of object materials.

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