SU-F-T-167: Measurement of Proton Beam Spot Size Using a 2D Ion Chamber Array for Daily QA

2016 ◽  
Vol 43 (6Part15) ◽  
pp. 3500-3500
Author(s):  
N Thorne ◽  
A Kassaee
Keyword(s):  
Proton Beam ◽  
Spot Size ◽  
Beam Spot ◽  
Ion Chamber ◽  
Beam Spot Size

PLANAR JOSEPHSON JUNCTIONS FABRICATED BY FOCUSED-ION BEAM

2001 ◽  
Vol 15 (24n25) ◽  
pp. 3359-3360 ◽  
Author(s):  
Hye-Won Seo ◽  
Quark Y. Chen ◽  
Chong Wang ◽  
Wei-Kan Chu ◽  
T. M. Chuang ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Josephson Junctions ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Spot Size ◽  
Physical Significance ◽  
Fabrication Technique ◽  
Beam Spot ◽  
Beam Spot Size ◽  
Current Voltage

We have fabricated nano-scaled planar superconductor-insulator-superconductor Josephson junctions using focused ion beam (FIB) with beam spot size ~5 nm . To study the effectiveness of this fabrication technique and for the purpose of comparisons, a variety of samples have been made based on high temperature superconducting (HTS) YBa2Cu3O7-δ electrodes. The insulators are either vacuum or silicon dioxide. The samples showed current-voltage (IV) characteristics typical of a resistively shunted junction (RSJ). We will discuss various aspects of the processing methods and the physical significance of the junction characteristics.

Development of a high-current microbeam system

2014 ◽  
Vol 24 (03n04) ◽  
pp. 101-110 ◽  
Author(s):  
S. Matsuyama ◽  
K. Ishii ◽  
S. Suzuki ◽  
A. Terakawa ◽  
M. Fujiwara ◽  
...  
Keyword(s):  
Quadrupole Doublet ◽  
Spot Size ◽  
Beam Current ◽  
Chemical State ◽  
High Current ◽  
Rigid Support ◽  
Beam Spot ◽  
X Ray ◽  
Beam Spot Size

We report on the development of a high-current microbeam system for wavelength-dispersive X-ray micro particle-induced X-ray emission (WDX-[Formula: see text]-PIXE) for chemical state mapping. The microbeam system is composed of two slits and a quadrupole doublet lens mounted on a heavy rigid support. The microbeam system is installed immediately after a switching magnet. A beam brightness of [Formula: see text] is obtained at a half-divergence of 0.1 mrad. A beam current of more than 300 pA is obtained for object sizes of [Formula: see text] with a half-divergence of 0.2 mrad, which corresponds to a beam spot size of [Formula: see text]. The calculated spot size of the beam was [Formula: see text] and the measured spot size was [Formula: see text]. The WDX-[Formula: see text]-PIXE system with the microbeam system is now operational.

Push beam spot-size dependence of atom transfer in a double magneto-optical trap setup

2013 ◽  
Vol 84 (7) ◽  
pp. 073102 ◽  
Author(s):  
S. P. Ram ◽  
S. K. Tiwari ◽  
S. R. Mishra ◽  
H. S. Rawat
Keyword(s):  
Size Dependence ◽  
Optical Trap ◽  
Spot Size ◽  
Atom Transfer ◽  
Magneto Optical Trap ◽  
Beam Spot ◽  
Beam Spot Size

Defect Sizing in Pipeline Welds: What Can We Really Achieve?

2004 ◽  
Author(s):  
Michael Moles
Keyword(s):  
Fracture Mechanics ◽  
Time Of Flight ◽  
Spot Size ◽  
Height Measurement ◽  
Beam Spot ◽  
Analysis Techniques ◽  
Time Of Flight Diffraction ◽  
Beam Spot Size ◽  
Weld Inspection ◽  
Focused Transducers

Pipelines are now using Fitness-For-Service (FFS) for accept/reject of weld defects. FFS requires accurate measurement of defect height for Fracture Mechanics assessments. The standard pipeline weld inspection technique of radiography is incapable of such measurements. However, the newer technique of ultrasonics can measure defect height, in principle. Initially ultrasonic amplitude methods were used for height measurement, but these proved unreliable. Now diffraction methods, especially Time-Of-Flight-Diffraction (TOFD), are being used in conjunction. This paper reviews previous work — mainly large nuclear studies like PISC II — and published pipeline sizing studies. The best nuclear sizing was within a few millimetres, using diffraction. In contrast to nuclear, pipeline AUT uses zone discrimination, focused transducers, much thinner material and simpler analysis techniques. Current accuracies are typically ± 1 mm (terminology undefined), which correlates with the beam spot size and typical weld pass. Requests for accuracies of ± 0.3 mm are probably unachievable, though future R&D should significantly improve pipeline sizing.

Improvement of ion beam brightness by reducing voltage ripple of an electrostatic accelerator for microbeam focusing by a triplet quadrupole lens system having large spherical aberration coefficient

2013 ◽  
Vol 23 (03n04) ◽  
pp. 171-181 ◽  
Author(s):  
S. Matsuyama ◽  
K. Watanabe ◽  
K. Ishii ◽  
A. Terakawa ◽  
M. Fujisawa ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Spherical Aberration ◽  
Ion Beam ◽  
Spot Size ◽  
Beam Current ◽  
Lens System ◽  
Beam Spot ◽  
Beam Spot Size ◽  
Voltage Ripple ◽  
Terminal Voltage

The microbeam system at Tohoku University was upgraded to a triplet lens system aiming at applying to the analysis of sub-micron features. The triplet lens system has a higher demagnification than the existing doublet system. However, the introduction of the triplet system also resulted in larger chromatic and spherical aberration coefficients. To overcome these problems, the energy resolution of the accelerator was improved by developing a terminal voltage stabilization system. The energy resolution of the accelerator was improved to 1 × 10−5 ΔE/E, which resulted in an increase in the brightness of the beam. The beam brightness was 2.3 pA Δ μm−2 Δ mrad−2 Δ MeV− and was higher in the central region. The effects of the increased chromatic and spherical aberration were mitigated by restricting the divergence angle without reducing the beam current. A beam spot size of 0.6 × 0.8 μm2 was obtained with a beam current of 150 pA.

scholarly journals The Coherent X-ray Scattering Beamline at Taiwan Photon Source

2014 ◽  
Vol 70 (a1) ◽  
pp. C1747-C1747
Author(s):  
Jhih-Min Lin ◽  
Yu-Shan Huang ◽  
Chun-Yu Chen ◽  
U-Ser Jeng ◽  
Chung-Yuan Mou ◽  
...  
Keyword(s):  
Photon Energy ◽  
Vertical Direction ◽  
Spot Size ◽  
Beam Spot ◽  
X Ray ◽  
Beam Spot Size ◽  
X Ray Scattering ◽  
Sample Position ◽  
Photon Source ◽  
Ray Scattering

The coherent X-ray scattering beamline is one of the phase I beamlines designed for the Taiwan Photon Source, a new 3 GeV ring under construction at the National Synchrotron Radiation Research Center in Taiwan. By using a pair of 2m-long in-vacuum undulators, this beamline will provide a highly coherent beam for X-ray photon correlation spectroscopy principally; moreover, it will share a part of beamtime for small-angle X-ray scattering (SAXS) experiments with similar setup of the beamline. The operating photon energy is designed within the range of 5-20 keV. In vertical direction, the beam spot size at sample position is 1 μm with focusing mirror and by using 1D compound refractive lenses (CRLs) the beam spot size is 10 μm. The horizontal beam spot size is in the range of 1 to 10 μm with a two-stage focusing design. The vertical and horizontal transverse coherence lengths of the 10 μm2 beam spot size at the photon energy of 5 KeV are 212 and 6 μm at sample position respectively. Beside XPCS the beamline configuration can cope with the requirements of most SAXS experiments, including anomalous measurements and micro-beam mapping. In addition, the increasing biological SAXS demand is also considered and the on-line fast performance liquid chromatography (FPLC) will be enclosed for biological users.

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