SU-E-I-51: Quantitative Assessment of X-Ray Imaging Detector Performance in a Clinical Setting - a Simple Approach Using a Commercial Instrument

2015 ◽  
Vol 42 (6Part6) ◽  
pp. 3253-3253
Author(s):  
J Sjoeberg ◽  
R Bujila ◽  
A Omar ◽  
P Nowik ◽  
S Mobini-Kesheh ◽  
...  
Keyword(s):  
Clinical Setting ◽  
Quantitative Assessment ◽  
Simple Approach ◽  
Detector Performance ◽  
X Ray ◽  
X Ray Imaging ◽  
Imaging Detector ◽  
Commercial Instrument

TU-A-116-05: Evaluation of Relative X-Ray Imaging Detector Performance Using the Metric of Relative Object Detectability (ROD)

2013 ◽  
Vol 40 (6Part25) ◽  
pp. 426-427
Author(s):  
V Singh ◽  
A Jain ◽  
S Setlur Nagesh ◽  
D Bednarek ◽  
S Rudin
Keyword(s):  
Detector Performance ◽  
X Ray ◽  
X Ray Imaging ◽  
Imaging Detector

Measurement of the parameters of a linear CCD structure as a one-dimensional X-ray imaging detector

1983 ◽  
Vol 208 (1-3) ◽  
pp. 427-433 ◽  
Author(s):  
M.G. Fedotov ◽  
E.A. Kuper ◽  
V.N. Litvinenko ◽  
V.E. Panchenko ◽  
V.A. Ushakov
Keyword(s):  
One Dimensional ◽  
X Ray ◽  
Linear Ccd ◽  
X Ray Imaging ◽  
Imaging Detector

Growth of thick CdTe epilayers on GaAs substrates and evaluation of CdTe/n+-GaAs heterojunction diodes for an X-ray imaging detector

2004 ◽  
Vol 33 (6) ◽  
pp. 645-650 ◽  
Author(s):  
M. Niraula ◽  
K. Yasuda ◽  
Y. Nakanishi ◽  
K. Uchida ◽  
T. Mabuchi ◽  
...  
Keyword(s):  
X Ray ◽  
Gaas Substrates ◽  
X Ray Imaging ◽  
Imaging Detector ◽  
Heterojunction Diodes

Characterization of Fine-Pixel X-Ray Imaging Detector Array Fabricated by Using Thick Single-Crystal CdTe Layers on Si Substrates Grown by MOVPE

2019 ◽  
Vol 66 (1) ◽  
pp. 518-523
Author(s):  
Madan Niraula ◽  
Kazuhito Yasuda ◽  
Shintaro Tsubota ◽  
Taiki Yamaguchi ◽  
Junya Ozawa ◽  
...  
Keyword(s):  
Single Crystal ◽  
Detector Array ◽  
X Ray ◽  
Si Substrates ◽  
X Ray Imaging ◽  
Imaging Detector

scholarly journals High-sensitivity high-resolution X-ray imaging with soft-sintered metal halide perovskites

2021 ◽  
Vol 4 (9) ◽  
pp. 681-688
Author(s):  
Sarah Deumel ◽  
Albert van Breemen ◽  
Gerwin Gelinck ◽  
Bart Peeters ◽  
Joris Maas ◽  
...  
Keyword(s):  
High Sensitivity ◽  
Metal Halide ◽  
Detector Arrays ◽  
X Ray ◽  
Carrier Lifetimes ◽  
Sintered Metal ◽  
X Ray Imaging ◽  
Imaging Detector ◽  
High Carrier ◽  
Halide Perovskites

AbstractTo realize the potential of artificial intelligence in medical imaging, improvements in imaging capabilities are required, as well as advances in computing power and algorithms. Hybrid inorganic–organic metal halide perovskites, such as methylammonium lead triiodide (MAPbI3), offer strong X-ray absorption, high carrier mobilities (µ) and long carrier lifetimes (τ), and they are promising materials for use in X-ray imaging. However, their incorporation into pixelated sensing arrays remains challenging. Here we show that X-ray flat-panel detector arrays based on microcrystalline MAPbI3 can be created using a two-step manufacturing process. Our approach is based on the mechanical soft sintering of a freestanding absorber layer and the subsequent integration of this layer on a pixelated backplane. Freestanding microcrystalline MAPbI3 wafers exhibit a sensitivity of 9,300 µC Gyair–1 cm–2 with a μτ product of 4 × 10–4 cm2 V–1, and the resulting X-ray imaging detector, which has 508 pixels per inch, combines a high spatial resolution of 6 line pairs per millimetre with a low detection limit of 0.22 nGyair per frame.

High-efficiency fast X-ray imaging detector development at SSRF

2019 ◽  
Vol 26 (5) ◽  
pp. 1631-1637
Author(s):  
Honglan Xie ◽  
Hongxin Luo ◽  
Guohao Du ◽  
Chengqiang Zhao ◽  
Wendong Xu ◽  
...  
Keyword(s):  
High Speed ◽  
High Efficiency ◽  
Sampling Rate ◽  
Coupling Efficiency ◽  
Numerical Aperture ◽  
X Ray ◽  
Temporal Sampling ◽  
X Ray Imaging ◽  
Imaging Detector ◽  
Working Distance

Indirect X-ray imaging detectors consisting of scintillator screens, long-working-distance microscope lenses and scientific high-speed complementary metal-oxide semiconductor (CMOS) cameras are usually used to realize fast X-ray imaging with white-beam synchrotron radiation. However, the detector efficiency is limited by the coupling efficiency of the long-working-distance microscope lenses, which is only about 5%. A long-working-distance microscope lenses system with a large numerical aperture (NA) is designed to increase the coupling efficiency. It offers an NA of 0.5 at 8× magnification. The Mitutoyo long-working-distance microscope lenses system offers an NA of 0.21 at 7.5× magnification. Compared with the Mitutoyo system, the developed long-working-distance microscope lenses system offers about twice the NA and four times the coupling efficiency. In the indirect X-ray imaging detector, a 50 µm-thick LuAG:Ce scintillator matching with the NA, and a high-speed visible-light CMOS FastCAM SAZ Photron camera are used. Test results show that the detector realized fast X-ray imaging with a frame rate of 100000 frames s−1 and fast X-ray microtomography with a temporal sampling rate up to 25 Hz (25 tomograms s−1).

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