Planar strain analysis of liver undergoing microwave thermal ablation using x-ray CT

2014 ◽  
Vol 42 (1) ◽  
pp. 372-380 ◽  
Author(s):  
Noam Weiss ◽  
S. Nahum Goldberg ◽  
Yitzhak Nissenbaum ◽  
Jacob Sosna ◽  
Haim Azhari
Keyword(s):  
Thermal Ablation ◽  
Strain Analysis ◽  
X Ray ◽  
Planar Strain

Strain Analysis in Thin La1−xCaxMnO3 Films by Grazing Incidence X-ray Scattering

1999 ◽  
Vol 602 ◽  
Author(s):  
M. Petit ◽  
L. J. Martinez-Miranda ◽  
M. Rajeswari ◽  
A. Biswas ◽  
D. J. Kang ◽  
...  
Keyword(s):  
Film Thickness ◽  
Lattice Mismatch ◽  
Compressive Strain ◽  
Strain Analysis ◽  
Grazing Incidence ◽  
Relaxation Processes ◽  
Near Surface ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

AbstractWe have performed depth profile analyses of the lattice parameters in epitaxial thin films of La1−xCaxMno3 (LCMO), where x = 0.33 or 0.3, to understand the evolution of strain relaxation processes in these materials. The analyses were done using Grazing Incidence X-ray Scattering (GIXS) on films of different thicnesses on two different substrates, (100) oriented LaAlO3 (LAO), with a lattice mismatch of ∼2% and (110) oriented NGO, with a lattice mismatch of less than 0.1%. Films grown on LAO can exhibit up to three in-plane strained lattice constants, corresponding to a slight orthorhombic distortion of the crystal, as well as near-surface and columnar lattice relaxation. As a function of film thickness, a crossover from a strained film to a mixture of strained and relaxed regions in the film occurs in the range of 700 Å. The structural evolution at this thickness coincides with a change in the resistivity curve near the metalinsulator transition. The in-plane compressive strain has a range of 0.2 – 1.5%, depending on the film thickness for filsm in the range of 400 - 1500 A.

Depth Profile of Structure, Strain, and Composition in an Annealed Al-Cu-Fe-Cr Quasicrystalline Film

2001 ◽  
Vol 695 ◽  
Author(s):  
M.J. Daniels ◽  
D. King ◽  
J.S. Zabinski ◽  
Z.U. Rek ◽  
J.C. Bilello
Keyword(s):  
Residual Strain ◽  
Incident Angle ◽  
Rf Sputtering ◽  
Strain Analysis ◽  
Grazing Incidence ◽  
Grain Structure ◽  
Second Phase ◽  
Secondary Phases ◽  
Composite Target ◽  
X Ray

ABSTRACTQuasicrystalline films were formed by RF sputtering from a powder composite target onto Inconel substrates, which produces a polymorphic nanoquasicrystalline grain structure, ~2.5 - 10 nm. Subsequent annealing at 500°C for 4 hours, at base pressures of below 5*10-5 Torr, and with Ar flow to 5 - 10 mT, fully develops the quasicrystalline structure with decagonal phase predominating, except near the termination surface. Analysis by XPS indicated extensive oxygen incorporation and limited aluminum enrichment at the termination surface. These results are correlated with structure and strain analysis via synchrotron grazing incidence x-ray scattering (GIXS). By varying the incident angle, hence the x-ray penetration depth, the evolution of an amorphous and crystalline crystalline secondary phases at the surface of the film has been detected. Residual strain analysis shows that this second phase induces a compressive residual strain of 0.10% as measured from the displacement of the major quasicrystalline peaks in the surface layers of the film.

In vivo noninvasive three‐dimensional (3D) assessment of microwave thermal ablation zone using non‐contrast‐enhanced x‐ray CT

2020 ◽  
Vol 47 (10) ◽  
pp. 4721-4734
Author(s):  
Omri Ziv ◽  
S. Nahum Goldberg ◽  
Yitzhak Nissenbaum ◽  
Jacob Sosna ◽  
Noam Weiss ◽  
...  
Keyword(s):  
Thermal Ablation ◽  
Three Dimensional ◽  
Ablation Zone ◽  
X Ray ◽  
Contrast Enhanced

Strain Analysis of Silicon Nanolayers by Grazing Incidence X-ray Diffraction

Hyomen Kagaku ◽  
2007 ◽  
Vol 28 (12) ◽  
pp. 678-681
Author(s):  
Hiroo OMI ◽  
Tomoaki KAWAMURA ◽  
Yoshihiro KOBAYASHI ◽  
Seiji FUJIKAWA ◽  
Yoshiyuki TSUSAKA ◽  
...  
Keyword(s):  
Strain Analysis ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

Reconstruction of Stress and Composition Profiles from X-Ray Diffraction Experiments — How to Avoid Ghost Stresses?

2004 ◽  
Vol 443-444 ◽  
pp. 91-94 ◽  
Author(s):  
Thomas L. Christiansen ◽  
Marcel A.J. Somers
Keyword(s):  
Depth Profile ◽  
Lattice Spacing ◽  
Lattice Strain ◽  
Strain Analysis ◽  
Weighted Average ◽  
X Ray Diffraction ◽  
Stress Strain ◽  
X Ray ◽  
Composition Profiles ◽  
Actual Stress

On evaluating lattice strain-depth or stress-depth profiles with X-ray diffraction, the variation of the information depth while combining various tilt angles, in combination with lattice spacing gradients leads to artefacts, so-called ghost or fictitious stresses. X-ray diffraction lattice-strain analysis was simulated for a model stress-depth profile combined with a composition-depth profile. Two principally different methods were investigated for the reconstruction of the actual stress and composition profiles from the simulated data: - considering the stress/strain determined at a specific depth as a weighted average over the actual stress/strain depth profile - considering the lattice spacing determined at a specific depth, for a specific value for as a weighted average over the actual lattice spacing profile for this direction. On the basis of the results it is possible to propose a preferred method for the evaluation of stress/strain and composition profiles, while minimising the risk for ghost stresses.

Non-Destructive Evaluation of Strains and Voiding in Passgvated Copper Metallizations

1993 ◽  
Vol 308 ◽  
Author(s):  
Richard P. Vinci ◽  
Thomas N. Marieb ◽  
John C. Bravman
Keyword(s):  
Thermal Cycle ◽  
Strain State ◽  
Hydrostatic Stress ◽  
Strain Analysis ◽  
X Ray ◽  
Non Destructive Evaluation ◽  
State Determination ◽  
Non Destructive ◽  
Voltage Scanning

ABSTRACTStress induced voiding in passivated Cu lines was investigated by x-ray strain analysis and in-situ high voltage scanning electron microscope (HVSEM) techniques. Cu lines on a Ta underlayer and Cu lines on an Al underlayer were patterned by a trilayer liftoff technique and passivated with Si3N4. For direct observation of stress voiding, specimens were heated to 350ºC in the HVSEM and then cooled and held at 150ºC. Identical samples were subjected to the same thermal cycle for strain state determination using x-ray techniques. The hydrostatic stress state at each temperature was calculated from the measured strains. Few initial voids were observed after passivation in either sample. After heating to 350ºC and cooling to the dwell temperature, no new voiding was seen in the Ta/Cu lines. Measured hydrostatic strains were half those measured in the Al/Cu lines. Heavy voiding was observed in the Al/Cu lines after cooling to the dwell temperature.

Determination of the Mechanical Response of Thin Films with X-Rays

1993 ◽  
Vol 308 ◽  
Author(s):  
I. C. Noyan ◽  
G. Sheikh
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Mechanical Response ◽  
Strain Analysis ◽  
Local Strain ◽  
X Rays ◽  
Stress Strain ◽  
X Ray ◽  
The Individual

ABSTRACTThe mechanical response of a specimen incorporating thin films is dictated by a combination of fundamental mechanical parameters such as Young's moduli of the individual layers, and by configurational parameters such as adhesion strength at the interface(s), residual stress distribution and other process dependent factors. In most systems, the overall response will be dominated by the properties of the (much thicker) substrate. Failure within the individual layers, on the other hand, is dependent on the local strain distributions and can not be predicted from the substrate values alone. To better understand the mechanical response of these systems, the strain within the individual layers of the thin film system must be measured and correlated with applied stresses. Phase selectivity of X-ray stress/strain analysis techniques is well suited for this purpose. In this paper, we will review the use of the traditional x-ray stress/strain analysis methods for the determination of the mechanical properties of thin film systems.

Crystal structure, mosaicity, and strain analysis of Hawaiian olivines using in situ X-ray diffraction

2011 ◽  
Vol 96 (4) ◽  
pp. 486-497 ◽  
Author(s):  
N. Vinet ◽  
R. L. Flemming ◽  
M. D. Higgins
Keyword(s):  
Crystal Structure ◽  
Strain Analysis ◽  
X Ray Diffraction ◽  
X Ray
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