Nanoscale imaging of the bone cell network with synchrotron X-ray tomography: optimization of acquisition setup

2012 ◽  
Vol 39 (4) ◽  
pp. 2229-2238 ◽  
Author(s):  
Alexandra Pacureanu ◽  
Max Langer ◽  
Elodie Boller ◽  
Paul Tafforeau ◽  
Françoise Peyrin
2015 ◽  
Author(s):  
Aurélie Dehlinger ◽  
Anne Blechschmidt ◽  
Daniel Grötzsch ◽  
Robert Jung ◽  
Birgit Kanngießer ◽  
...  

Author(s):  
H. Stiel ◽  
A. Dehlinger ◽  
K.A. Janulewicz ◽  
R. Jung ◽  
H. Legall ◽  
...  
Keyword(s):  
X Ray ◽  

2019 ◽  
Vol 49 (1) ◽  
pp. 389-415 ◽  
Author(s):  
Haidan Wen ◽  
Mathew J. Cherukara ◽  
Martin V. Holt

X-ray microscopy has been an indispensable tool to image nanoscale properties for materials research. One of its recent advances is extending microscopic studies to the time domain to visualize the dynamics of nanoscale phenomena. Large-scale X-ray facilities have been the powerhouse of time-resolved X-ray microscopy. Their upgrades, including a significant reduction of the X-ray emittance at storage rings (SRs) and fully coherent ultrashort X-ray pulses at free-electron lasers (FELs), will lead to new developments in instrumentation and will open new scientific opportunities for X-ray imaging of nanoscale dynamics with the simultaneous attainment of unprecedentedly high spatial and temporal resolutions. This review presents recent progress in and the outlook for time-resolved X-ray microscopy in the context of ultrafast nanoscale imaging and its applications to condensed matter physics and materials science.


Cell Calcium ◽  
2010 ◽  
Vol 47 (3) ◽  
pp. 234-241 ◽  
Author(s):  
Bo Huo ◽  
Xin L. Lu ◽  
Kevin D. Costa ◽  
Qiaobing Xu ◽  
X. Edward Guo

2018 ◽  
Vol 5 (6) ◽  
pp. 1870036
Author(s):  
Anna Khimchenko ◽  
Christos Bikis ◽  
Alexandra Pacureanu ◽  
Simone E. Hieber ◽  
Peter Thalmann ◽  
...  

Author(s):  
Pei Dong ◽  
Sebastien Valette ◽  
Maria A. Zuluaga ◽  
Galateia J. Kazakia ◽  
Francoise Peyrin

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Silvia Cipiccia ◽  
Francesco Brun ◽  
Vittorio Di Trapani ◽  
Christoph Rau ◽  
Darren J. Batey

X-ray ptychography and X-ray fluorescence are complementary nanoscale imaging techniques, providing structural and elemental information, respectively. Both methods acquire data by scanning a localized beam across the sample. X-ray ptychography processes the transmission signal of a coherent illumination interacting with the sample, to produce images with a resolution finer than the illumination spot and step size. By enlarging both the spot and the step size, the technique can cover extended regions efficiently. X-ray fluorescence records the emitted spectra as the sample is scanned through the localized beam and its spatial resolution is limited by the spot and step size. The requisites for fast ptychography and high-resolution fluorescence appear incompatible. Here, a novel scheme that mitigates the difference in requirements is proposed. The method makes use of two probes of different sizes at the sample, generated by using two different energies for the probes and chromatic focusing optics. The different probe sizes allow to reduce the number of acquisition steps for the joint fluorescence–ptychography scan compared with a standard single beam scan, while imaging the same field of view. The new method is demonstrated experimentally using two undulator harmonics, a Fresnel zone plate and an energy discriminating photon counting detector.


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