scholarly journals PDT is better than alternative therapies such as brachytherapy, electron beams, or low-energy x rays for the treatment of skin cancers

2011 ◽  
Vol 38 (3) ◽  
pp. 1133-1135 ◽  
Author(s):  
Timothy C. Zhu ◽  
E. Ishmael Parsai ◽  
Colin G. Orton
Keyword(s):  
Electron Beams ◽  
Alternative Therapies ◽  
Low Energy ◽  
X Rays ◽  
Skin Cancers ◽  
Better Than

Use of Low-Energy X-Rays in the Treatment of Superficial Nonmelanomatous Skin Cancers

2003 ◽  
Vol 21 (3) ◽  
pp. 355-362 ◽  
Author(s):  
William R. Bodner ◽  
Basil S. Hilaris ◽  
Mehran Alagheband ◽  
Bijan Safai ◽  
Constance A. Mastoras ◽  
...  
Keyword(s):  
Low Energy ◽  
X Rays ◽  
Skin Cancers

Characterization of Rh/Si multilayer structure by HREM and HAADF

1992 ◽  
Vol 50 (1) ◽  
pp. 122-123
Author(s):  
Y. Cheng ◽  
J. Liu ◽  
M.B. Stearns ◽  
D.G. Steams
Keyword(s):  
Normal Incidence ◽  
High Resolution Electron Microscopy ◽  
X Rays ◽  
Beam Direction ◽  
Cross Sectional ◽  
Optical Elements ◽  
Resolution Electron ◽  
Point To Point ◽  
Better Than

The Rh/Si multilayer (ML) thin films are promising optical elements for soft x-rays since they have a calculated normal incidence reflectivity of ∼60% at a x-ray wavelength of ∼13 nm. However, a reflectivity of only 28% has been attained to date for ML fabricated by dc magnetron sputtering. In order to determine the cause of this degraded reflectivity the microstructure of this ML was examined on cross-sectional specimens with two high-resolution electron microscopy (HREM and HAADF) techniques.Cross-sectional specimens were made from an as-prepared ML sample and from the same ML annealed at 298 °C for 1 and 100 hours. The specimens were imaged using a JEM-4000EX TEM operating at 400 kV with a point-to-point resolution of better than 0.17 nm. The specimens were viewed along Si [110] projection of the substrate, with the (001) Si surface plane parallel to the beam direction.

Thermocapillary model of formation of nanostructures on the surface irradiated by low-energy high-current electron beams

2019 ◽  
Vol 6 (7) ◽  
pp. 076551 ◽  
Author(s):  
Vladimir Sarychev ◽  
Sergey Nevskii ◽  
Sergey Konovalov ◽  
Alexey Granovskii ◽  
Victor Gromov
Keyword(s):  
Electron Beams ◽  
Low Energy ◽  
High Current ◽  
Current Electron ◽  
High Current Electron

Key comparison BIPM.RI(I)-K2 of the air-kerma standards of the LNE–LNHB, France and the BIPM in low-energy x-rays

Metrologia ◽  
2011 ◽  
Vol 48 (1A) ◽  
pp. 06013-06013 ◽  
Author(s):  
D T Burns ◽  
P Roger ◽  
M Denozière ◽  
E Leroy
Keyword(s):  
Low Energy ◽  
X Rays ◽  
Key Comparison ◽  
Air Kerma
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