Poster - Wed Eve-23: Electron Energy Spectral Analyses on Electron Backscatter in Solid Water Using Low-Energy Electron Beams

2009 ◽  
Vol 36 (9Part2) ◽  
pp. 4308-4308
Author(s):  
J Chow ◽  
G Grigorov
Keyword(s):  
Electron Energy ◽  
Electron Beams ◽  
Low Energy ◽  
Energy Electron ◽  
Spectral Analyses ◽  
Electron Backscatter ◽  
Low Energy Electron ◽  
Solid Water

Extraction of large-area low-energy electron beams from a multi-dipolar plasma

2009 ◽  
Vol 18 (1) ◽  
pp. 015017 ◽  
Author(s):  
A Lacoste ◽  
S Béchu ◽  
O Maulat ◽  
J Pelletier ◽  
Y Arnal
Keyword(s):  
Electron Beams ◽  
Low Energy ◽  
Energy Electron ◽  
Large Area ◽  
Low Energy Electron

Analysis methodology of movable emittance-meter measurements for low energy electron beams

2008 ◽  
Vol 79 (1) ◽  
pp. 013303 ◽  
Author(s):  
A. Mostacci ◽  
A. Bacci ◽  
M. Boscolo ◽  
E. Chiadroni ◽  
A. Cianchi ◽  
...  
Keyword(s):  
Electron Beams ◽  
Low Energy ◽  
Energy Electron ◽  
Analysis Methodology ◽  
Low Energy Electron

Spin Polarized Low Energy Electron Microscopy of Surface Magnetic Structure

1991 ◽  
Vol 232 ◽  
Author(s):  
M. S. Altman ◽  
H. Pinkvos ◽  
J. Hurst ◽  
H. Poppa ◽  
G. Marx ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Magnetic Structure ◽  
Electron Beams ◽  
Low Energy ◽  
Energy Electron ◽  
Electron Gun ◽  
Image Subtraction ◽  
Topological Features ◽  
Spin Polarized ◽  
Low Energy Electron

ABSTRACTSpin polarized low energy electron microscopy (SPLEEM) has been developed for the high resolution imaging of surface magnetic structure. The existing LEEM ha.s been modified by the incorporation of a. GaAs-type spin polarized electron gun. Large image contrast arises due to the spin-dependent exchange scattering, whifle the st.in-orbit contribution vanishes uniquely for the normal incidence/exit geometry used here. Pixel by pixel image subtraction for incident electron beams of opposite polarization yields precisely the spatially resolved Bragg reflection asymmetry observed in spin polarized low energy electron diffraction. The shallow electron penetration depth arising from the strong coulombic interaction is advantageous for separating surface behavior from the normally overwhelning bulk. Therefore, the use of transversally polarizedI electron beams allows the determination of in-plane surface magnetization directions. Fnrthermore, the parallel illumination and detection of SPLEEM makes it possible to image quickly with a. resolution better than 500 Å in the present configuration. A useful and direct. comparison between surface magnetic, structural, and topological features is made possible by the augmentation of the unique imaging capabilities of conventional LEEM with the magnetic sensitivity of SPLEEM. In this manner, the magnetic domain structure of a Co (0001) surface and in-situ grown Co filmns on Mo(110) have been determined.

scholarly journals Low energy electron energy-loss spectroscopy of CF3X (X=Cl,Br)

2007 ◽  
Vol 126 (2) ◽  
pp. 024303 ◽  
Author(s):  
M. Hoshino ◽  
K. Sunohara ◽  
C. Makochekanwa ◽  
L. Pichl ◽  
H. Cho ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron ◽  
Electron Energy Loss
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