scholarly journals Active pixel imagers incorporating pixel-level amplifiers based on polycrystalline-silicon thin-film transistors

2009 ◽  
Vol 36 (7) ◽  
pp. 3340-3355 ◽  
Author(s):  
Youcef El-Mohri ◽  
Larry E. Antonuk ◽  
Martin Koniczek ◽  
Qihua Zhao ◽  
Yixin Li ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Active Pixel

Empirical noise performance of prototype active pixel arrays employing polycrystalline silicon thin‐film transistors

2020 ◽  
Vol 47 (9) ◽  
pp. 3972-3983
Author(s):  
Martin Koniczek ◽  
Larry E. Antonuk ◽  
Youcef El‐Mohri ◽  
Albert K. Liang ◽  
Qihua Zhao
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Noise Performance ◽  
Silicon Thin Film ◽  
Active Pixel

scholarly journals Noise Characterization of Polycrystalline Silicon Thin Film Transistors for X-ray Imagers Based on Active Pixel Architectures

2008 ◽  
Vol 1066 ◽  
Author(s):  
L. E. Antonuk ◽  
M. Koniczek ◽  
J. McDonald ◽  
Y. El-Mohri ◽  
Q. Zhao ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Noise Power ◽  
Silicon Thin Film ◽  
X Ray ◽  
Noise Power Spectral Density ◽  
Power Spectral ◽  
Active Pixel ◽  
Noise Characterization

ABSTRACTAn examination of the noise of polycrystalline silicon thin film transistors, in the context of flat panel x-ray imager development, is reported. The study was conducted in the spirit of exploring how the 1/f, shot and thermal noise components of poly-Si TFTs, determined from current noise power spectral density measurements, as well as through calculation, can be used to assist in the development of imagers incorporating pixel amplification circuits based on such transistors.

scholarly journals Theoretical investigation of the noise performance of active pixel imaging arrays based on polycrystalline silicon thin film transistors

2017 ◽  
Vol 44 (7) ◽  
pp. 3491-3503 ◽  
Author(s):  
Martin Koniczek ◽  
Larry E. Antonuk ◽  
Youcef El-Mohri ◽  
Albert K. Liang ◽  
Qihua Zhao
Keyword(s):  
Thin Film ◽  
Theoretical Investigation ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Noise Performance ◽  
Silicon Thin Film ◽  
Imaging Arrays ◽  
Active Pixel

Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors

2000 ◽  
Vol 76 (17) ◽  
pp. 2442-2444 ◽  
Author(s):  
C. T. Angelis ◽  
C. A. Dimitriadis ◽  
F. V. Farmakis ◽  
J. Brini ◽  
G. Kamarinos ◽  
...  
Keyword(s):  
Thin Film ◽  
Excimer Laser ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

Dynamic-Gate-Stress-Induced Degradation in Bridged-Grain Polycrystalline Silicon Thin-Film Transistors

2016 ◽  
Vol 63 (10) ◽  
pp. 3964-3970 ◽  
Author(s):  
Meng Zhang ◽  
Zhihe Xia ◽  
Wei Zhou ◽  
Rongsheng Chen ◽  
Man Wong ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

Two‐step annealed polycrystalline silicon thin‐film transistors

1996 ◽  
Vol 80 (3) ◽  
pp. 1883-1890 ◽  
Author(s):  
Kwon‐Young Choi ◽  
Min‐Koo Han
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

Reliability of Low Temperature Polycrystalline Silicon Thin-Film Transistors with Ultrathin Gate Oxide

2007 ◽  
Vol 46 (7A) ◽  
pp. 4021-4027 ◽  
Author(s):  
Hitoshi Ueno ◽  
Yuta Sugawara ◽  
Hiroshi Yano ◽  
Tomoaki Hatayama ◽  
Yukiharu Uraoka ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Gate Oxide ◽  
Silicon Thin Film
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