Sci-Sat AM (1) General-05: Measurement of Coherent Scattering Form Factors using Polychromatic X-Ray Sources and Imaging Detectors

2006 ◽  
Vol 33 (7Part3) ◽  
pp. 2673-2673
Author(s):  
B King ◽  
P Johns
Keyword(s):  
Form Factors ◽  
Coherent Scattering ◽  
X Ray ◽  
Imaging Detectors

Coherent and incoherent scattering of low-energy X-ray photons in the atomic region 13 ≤ Z ≤ 82

1996 ◽  
Vol 74 (1-2) ◽  
pp. 10-16 ◽  
Author(s):  
D. V. Rao ◽  
R. Cesareo ◽  
G. E. Gigante ◽  
D. V. Rao ◽  
G. E. Gigante
Keyword(s):  
Cross Sections ◽  
Detection System ◽  
Form Factors ◽  
Coherent Scattering ◽  
Incoherent Scattering ◽  
X Rays ◽  
Bremsstrahlung Radiation ◽  
X Ray ◽  
Scattering Cross ◽  
Scattering Cross Sections

Coherent- and incoherent-scattering cross sections for the elements Al, Cu, Y, In, Au, and Pb were measured using nearly monoenergetic unpolarized 35.86 and 39.96 keV X-ray beams with high-resolution Si (Li) detectors. Bremsstrahlung radiation from an X-ray tube was used to excite nearly monoenergetic X-rays in secondary targets. To improve the efficiency of the detection system the excitation source, detector, and the target assembly were placed in a vacuum chamber and a pressure of 10−2 mbar was maintained throughout the measurements. This system considerably reduced the background and scattering effects and improved the monochromacy. Experimental coherent-scattering cross sections are compared with the normalized integrated coherent-scattering cross sections calculated using the relativistic, nonrelativistic, and relativistic-modified form factors. Experimental incoherent-scattering cross sections are compared with the theoretical values, calculated using the nonrelativistic incoherent-scattering function. Good correspondence is observed between experimental and theoretical values in the given energy region.

scholarly journals Characterization of a back-illuminated CMOS camera for soft x-ray coherent scattering

2019 ◽  
Author(s):  
Kewin Desjardins ◽  
Horia Popescu ◽  
Pascal Mercère ◽  
Claude Menneglier ◽  
Roland Gaudemer ◽  
...  
Keyword(s):  
Coherent Scattering ◽  
Cmos Camera ◽  
X Ray ◽  
Back Illuminated

scholarly journals From Femtoseconds to Hours–Measuring Dynamics over 18 Orders of Magnitude with Coherent X-rays

2021 ◽  
Vol 11 (13) ◽  
pp. 6179
Author(s):  
Felix Lehmkühler ◽  
Wojciech Roseker ◽  
Gerhard Grübel
Keyword(s):  
Time Scales ◽  
Free Electron Laser ◽  
Photon Correlation Spectroscopy ◽  
Signal To Noise Ratio ◽  
Coherent Scattering ◽  
Correlation Spectroscopy ◽  
X Rays ◽  
Photon Correlation ◽  
X Ray ◽  
Scattering Technique

X-ray photon correlation spectroscopy (XPCS) enables the study of sample dynamics between micrometer and atomic length scales. As a coherent scattering technique, it benefits from the increased brilliance of the next-generation synchrotron radiation and Free-Electron Laser (FEL) sources. In this article, we will introduce the XPCS concepts and review the latest developments of XPCS with special attention on the extension of accessible time scales to sub-μs and the application of XPCS at FELs. Furthermore, we will discuss future opportunities of XPCS and the related technique X-ray speckle visibility spectroscopy (XSVS) at new X-ray sources. Due to its particular signal-to-noise ratio, the time scales accessible by XPCS scale with the square of the coherent flux, allowing to dramatically extend its applications. This will soon enable studies over more than 18 orders of magnitude in time by XPCS and XSVS.

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