Sci-PM Fri - 08: Accurate surface dose measurements in CT exam using isotropic high sensitivity MOSFET dosimeters calibrated by Monte Carlo simulations

2005 ◽  
Vol 32 (7Part3) ◽  
pp. 2422-2422
Author(s):  
M Lemire ◽  
G Hegyi ◽  
J Seuntjens ◽  
F Verhaegen
Author(s):  
Yuri Simeonov ◽  
Uli Weber ◽  
Christoph Schuy ◽  
Rita Engenhart-Cabillic ◽  
Petar Penchev ◽  
...  

2019 ◽  
Vol 117 (5) ◽  
pp. 489-503 ◽  
Author(s):  
Firass Ghareeb ◽  
Joana Lencart ◽  
Jorge Oliveira ◽  
João A.M. Santos

1999 ◽  
Vol 26 (9) ◽  
pp. 1874-1882 ◽  
Author(s):  
K. De Vlamynck ◽  
H. Palmans ◽  
F. Verhaegen ◽  
C. De Wagter ◽  
W. De Neve ◽  
...  

2007 ◽  
Vol 34 (4) ◽  
pp. 1266-1273 ◽  
Author(s):  
Hong F. Xiang ◽  
Jun S. Song ◽  
David W. H. Chin ◽  
Robert A. Cormack ◽  
Roy B. Tishler ◽  
...  

Author(s):  
Matthew T. Johnson ◽  
Ian M. Anderson ◽  
Jim Bentley ◽  
C. Barry Carter

Energy-dispersive X-ray spectrometry (EDS) performed at low (≤ 5 kV) accelerating voltages in the SEM has the potential for providing quantitative microanalytical information with a spatial resolution of ∼100 nm. In the present work, EDS analyses were performed on magnesium ferrite spinel [(MgxFe1−x)Fe2O4] dendrites embedded in a MgO matrix, as shown in Fig. 1. spatial resolution of X-ray microanalysis at conventional accelerating voltages is insufficient for the quantitative analysis of these dendrites, which have widths of the order of a few hundred nanometers, without deconvolution of contributions from the MgO matrix. However, Monte Carlo simulations indicate that the interaction volume for MgFe2O4 is ∼150 nm at 3 kV accelerating voltage and therefore sufficient to analyze the dendrites without matrix contributions.Single-crystal {001}-oriented MgO was reacted with hematite (Fe2O3) powder for 6 h at 1450°C in air and furnace cooled. The specimen was then cleaved to expose a clean cross-section suitable for microanalysis.


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