Suomi NPP VIIRS on-orbit performance, data quality, and new applications

NOAA-20 VIIRS on-orbit performance, data quality, and operational Cal/Val support

Earth Observing Missions and Sensors: Development, Implementation, and Characterization V ◽

10.1117/12.2324329 ◽

2018 ◽

Cited By ~ 5

Author(s):

Changyong Cao ◽

Slawomir Blonski ◽

Wenhui Wang ◽

Sirish Uprety ◽

Xi Shao ◽

...

Keyword(s):

Data Quality ◽

Performance Data

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Desenvolvimento de um software para calibração de trenas utilizando visão computacional

10.14210/cotb.v11n1.p050-051 ◽

2020 ◽

Author(s):

Matheus Santana Carvalho ◽

Benjamin Grando Moreira ◽

Sueli Fischer Beckert

Keyword(s):

Data Quality ◽

Real Time ◽

Continuous Improvement ◽

Industrial Sector ◽

Calibration Methods ◽

Common Area ◽

Measuring Tape ◽

Traditional Process ◽

New Applications ◽

Machine Processing

Metrology is responsible for the studies of aspects that involve themeasurements application, being a common area to engineering inthe search for continuous improvement and quality in the processand products. To approximate the machine processing, factory floor,and development of new applications, continuous technologicaldevelopment is demanded from the industrial sector and modernizationof its process. In this scenario, Metrology 4.0 uses technologiesin the traditional process ensuring the data quality, reliability, andsupports decision in real-time. For the innovation of the traditionalmodels of calibration, this paper introduces a software developmentto realize the comparation of measuring tape with a standard, usingComputer Vision, and compares the results of this process with thetraditional calibration methods.

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A Data Quality Strategy to Enable FAIR, Programmatic Access across Large, Diverse Data Collections for High Performance Data Analysis

Informatics ◽

10.3390/informatics4040045 ◽

2017 ◽

Vol 4 (4) ◽

pp. 45 ◽

Cited By ~ 1

Author(s):

Ben Evans ◽

Kelsey Druken ◽

Jingbo Wang ◽

Rui Yang ◽

Clare Richards ◽

...

Keyword(s):

Data Analysis ◽

Data Quality ◽

High Performance ◽

Performance Data ◽

Data Collections ◽

Diverse Data ◽

Programmatic Access

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1250-kilovolt scanning transmission electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100113007 ◽

1984 ◽

Vol 42 ◽

pp. 624-625

Author(s):

T. Imura ◽

S. Maruse ◽

K. Mihama ◽

M. Iseki ◽

M. Hibino ◽

...

Keyword(s):

High Voltage ◽

Electron Probe ◽

Scanning Transmission Electron Microscope ◽

Pressure Vessels ◽

Practical Applications ◽

Voltage Generator ◽

Transmission Electron ◽

Scanning Transmission ◽

New Applications ◽

High Voltage Generator

Ultra high voltage STEM has many inherent technical advantages over CTEM. These advantages include better signal detectability and signal processing capability. It is hoped that it will explore some new applications which were previously not possible. Conventional STEM (including CTEM with STEM attachment), however, has been unable to provide these inherent advantages due to insufficient performance and engineering problems. Recently we have developed a new 1250 kV STEM and completed installation at Nagoya University in Japan. It has been designed to break through conventional engineering limitations and bring about theoretical advantage in practical applications.In the design of this instrument, we exercised maximum care in providing a stable electron probe. A high voltage generator and an accelerator are housed in two separate pressure vessels and they are connected with a high voltage resistor cable.(Fig. 1) This design minimized induction generated from the high voltage generator, which is a high frequency Cockcroft-Walton type, being transmitted to the electron probe.

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