Image-Converter Diagnostics Of Laser And Laser Plasma In Pico-Femtosecond Region

Author(s):  
M. Y. Schelev
Keyword(s):  
1996 ◽  
Vol 67 (3) ◽  
pp. 1272-1274 ◽  
Author(s):  
W. Mróz ◽  
P. Parys ◽  
J. Wol/owski ◽  
E. Woryna ◽  
P. Straka ◽  
...  

1985 ◽  
Vol 15 (4) ◽  
pp. 516-520
Author(s):  
V V Blazhenkov ◽  
O P Varnavskiĭ ◽  
A N Kirkin ◽  
Aleksandr M Leontovich ◽  
V V Lidskiĭ ◽  
...  
Keyword(s):  

1988 ◽  
Vol 102 ◽  
pp. 243-246
Author(s):  
J.T. Costello ◽  
W.G. Lynam ◽  
P.K. Carroll

AbstractThe dual laser-produced plasma technique for the study of ionic absorption spectra has been developed by the use of two Q-switched ruby lasers to enable independent generation of the absorbing and back-lighting plasmas. Optical pulse handling is used in the coupling cicuits to enable reproducible pulse delays from 250 nsec. to 10 msec, to be achieved. At delay times > 700 nsec. spectra of essentially pure neutral species are observed. The technique is valuable, not only for obtaining the neutral spectra of highly refractory and/or corrosive materials but also for studying behaviour of ionic species as a function of time. Typical spectra are shown in Fig. 1.


Author(s):  
P. Bonhomme ◽  
A. Beorchia

We have already described (1.2.3) a device using a pockel's effect light valve as a microscopical electron image converter. This converter can be read out with incoherent or coherent light. In the last case we can set in line with the converter an optical diffractometer. Now, electron microscopy developments have pointed out different advantages of diffractometry. Indeed diffractogram of an image of a thin amorphous part of a specimen gives information about electron transfer function and a single look at a diffractogram informs on focus, drift, residual astigmatism, and after standardizing, on periods resolved (4.5.6). These informations are obvious from diffractogram but are usualy obtained from a micrograph, so that a correction of electron microscope parameters cannot be realized before recording the micrograph. Diffractometer allows also processing of images by setting spatial filters in diffractogram plane (7) or by reconstruction of Fraunhofer image (8). Using Electrotitus read out with coherent light and fitted to a diffractometer; all these possibilities may be realized in pseudoreal time, so that working parameters may be optimally adjusted before recording a micrograph or before processing an image.


2009 ◽  
Vol 129 (4) ◽  
pp. 595-600
Author(s):  
Tetsuya Makimura ◽  
Takashige Fujimori ◽  
Shuichi Torii ◽  
Hiroyuki Niino ◽  
Kouichi Murakami

Author(s):  
Laurent Berthe ◽  
Cyril Bolis ◽  
Michel Boustie ◽  
Michel Arrigoni ◽  
Sophie Barradas ◽  
...  

Author(s):  
Л. В. Месарош ◽  
М. П. Чучман ◽  
І. Е. Качер

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