A New Mid-UV Resist With Oxygen Plasma Resistance

Author(s):  
J. M. Liu ◽  
C. H. Tzeng
1993 ◽  
Vol 3 (2) ◽  
pp. 133 ◽  
Author(s):  
Masamitsu Shirai ◽  
Takahiro Miwa ◽  
Tomonobu Sumino ◽  
Masahiro Tsunooka

1999 ◽  
Vol 38 (Part 1, No. 6A) ◽  
pp. 3482-3486 ◽  
Author(s):  
Po-Tsun Liu ◽  
Ting-Chang Chang ◽  
Yi-Shian Mor ◽  
Simon M. Sze

2001 ◽  
Vol 4 (3) ◽  
pp. G31 ◽  
Author(s):  
Takeshi Furusawa ◽  
Daisuke Ryuzaki ◽  
Ryo Yoneyama ◽  
Yoshio Homma ◽  
Kenji Hinode

1985 ◽  
Vol 132 (5) ◽  
pp. 1168-1171 ◽  
Author(s):  
Takumi Ueno ◽  
Hiroshi Shiraishi ◽  
Takao Iwayanagi ◽  
Saburo Nonogaki

Author(s):  
Virgil Peck ◽  
W. L. Carter

Any electron microscopical study of the morphology of bulk polymers has throughout the years been hampered by the lack of any real ability to produce meaningful surface variations for replication. True etching of polymers should show crystalline and amorphous regions in some form of relief. The use of solvents, acids, organic vapors, and inert ion bombardment to etch samples has proved to be useful only in limited applications. Certainly many interpretations of these results are subject to question.The recent use of a radiofrequency (R. F.) plasma of oxygen to degrade and remove organic material with only minor heating has opened a new possibility for etching polymers. However, rigid control of oxygen flow, time, current, and sample position are necessary in order to obtain reproducible results. The action is confined to surface layers; the molecular weight of the polymer residue after heavy etching is the same as the molecular weight of the polymer before attack, within the accuracy of measurement.


2020 ◽  
Vol 59 (SJ) ◽  
pp. SJJF03
Author(s):  
Sitti Subaedah ◽  
Haruka Uematsu ◽  
Nobuya Hayashi

2020 ◽  
Vol 2020 (11) ◽  
pp. 41-45
Author(s):  
Yu.S. Popil ◽  
◽  
V.M. Korzh ◽  
V.Ya. Chernyak ◽  
Ye.A. Zakharov ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document