Picosecond Electron-Beam And Synchrotron Radiation Pulse Radiolysis For Studies On Electron-Beam And X-Ray Resists

1989 ◽  
Author(s):  
Yoichi Yoshida ◽  
Hiromi Shibata ◽  
Seiichi Tagawa ◽  
Masakazu Washio ◽  
Yoneho Tabata ◽  
...  
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Pulse Radiolysis ◽  
Radiation Pulse ◽  
X Ray

Evaluation of an elliptically polarized undulator for the future Taiwan Photon Source

2021 ◽  
Vol 16 (12) ◽  
pp. P12017
Author(s):  
H.-W. Luo ◽  
T.-Y. Chung ◽  
C.-H. Lee ◽  
C.-S. Hwang
Keyword(s):  
Magnetic Field ◽  
Electron Beam ◽  
Synchrotron Radiation ◽  
Transverse Field ◽  
Longitudinal Direction ◽  
X Ray ◽  
Elliptically Polarized ◽  
Transverse Position ◽  
Photon Source ◽  
Field Integral

Abstract The resonant photon energy of an adjustable-phase undulator (APU) is varied with the relative motion of the magnet arrays along the longitudinal direction. There exists, however, a transverse field gradient (TFG) of order 100 T/m in an APU of small gap (∼10 mm). Whereas the TFG might affect the electron beam as it contributes to the dynamic field integral and the radiation integrals, the TFG might also degrade the performance of the synchrotron radiation due to the transverse position-dependent magnetic field. The effects of the TFG on the present Taiwan Photon Source (TPS) and future TPS-upgraded are analyzed to investigate the feasibility of an APU that operates in the soft x-ray region.

Picosecond synchrotron radiation pulse radiolysis

1989 ◽  
Vol 60 (7) ◽  
pp. 2197-2200 ◽  
Author(s):  
Atsushi Ogata ◽  
Seiichi Tagawa
Keyword(s):  
Synchrotron Radiation ◽  
Pulse Radiolysis ◽  
Radiation Pulse

Determination of the electron beam size at the Kurchatov synchrotron radiation source using an X-ray refractive lens

2007 ◽  
Vol 1 (5) ◽  
pp. 528-532 ◽  
Author(s):  
A. N. Artemiev ◽  
A. A. Snigirev ◽  
V. N. Korchuganov ◽  
A. G. Valentinov ◽  
V. V. Kvardakov ◽  
...  
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Radiation Source ◽  
Synchrotron Radiation Source ◽  
Beam Size ◽  
X Ray ◽  
Refractive Lens

SPring-8 Program

1998 ◽  
Vol 5 (3) ◽  
pp. 162-167 ◽  
Author(s):  
H. Kamitsubo
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Storage Ring ◽  
Radiation Source ◽  
Third Generation ◽  
X Ray ◽  
Front End ◽  
Maximum Current ◽  
Booster Synchrotron ◽  
Under Construction

SPring-8 is a third-generation synchrotron radiation source operating in the soft and hard X-ray region. It consists of an injector linac of 1 GeV, a booster synchrotron of 8 GeV and a storage ring with a natural emittance of 5.9 nm rad. The storage ring can accommodate 61 beamlines in total, and 26 of them are under construction. The project has been carried out jointly by JAERI and RIKEN and construction of the facility started in 1991. Commissioning of the injector linac was started in August 1996 and an 8 GeV electron beam was injected into the storage ring in March 1997. The first synchrotron radiation from a bending magnet was observed at the front end of the beamline on 25 March and radiation from an undulator was observed on 23 April. On-beam testing of seven beamlines, four of them from in-vacuum undulators and three from bending magnets, started in July. The maximum stored current is currently fixed at 20 mA and the lifetime at maximum current is longer than 20 h. The dedication is scheduled for October 1997.

scholarly journals Hard X-ray nanofocusing at low-emittance synchrotron radiation sources

2014 ◽  
Vol 21 (5) ◽  
pp. 996-1005 ◽  
Author(s):  
Christian G. Schroer ◽  
Gerald Falkenberg
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Storage Ring ◽  
Source Parameters ◽  
Gaussian Model ◽  
Scanning Microscopy ◽  
X Ray ◽  
Radiation Sources ◽  
Central Cone ◽  
Low Emittance

X-ray scanning microscopy relies on intensive nanobeams generated by imaging a highly brilliant synchrotron radiation source onto the sample with a nanofocusing X-ray optic. Here, using a Gaussian model for the central cone of an undulator source, the nanobeam generated by refractive X-ray lenses is modeled in terms of size, flux and coherence. The beam properties are expressed in terms of the emittances of the storage ring and the lateral sizes of the electron beam. Optimal source parameters are calculated to obtain efficient and diffraction-limited nanofocusing. With decreasing emittance, the usable fraction of the beam for diffraction-limited nanofocusing experiments can be increased by more than two orders of magnitude compared with modern storage ring sources. For a diffraction-limited storage ring, nearly the whole beam can be focused, making these sources highly attractive for X-ray scanning microscopy.

scholarly journals Quantitative investigation of linear arbitrary polarization in an APPLE-II undulator

2018 ◽  
Vol 25 (2) ◽  
pp. 378-384
Author(s):  
Matthew Hand ◽  
Hongchang Wang ◽  
Francesco Maccherozzi ◽  
Marco Apollonio ◽  
Jingtao Zhu ◽  
...  
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Light Source ◽  
Polarization State ◽  
Measured Data ◽  
Beam Polarization ◽  
Quantitative Investigation ◽  
X Ray ◽  
The World

Insertion devices are utilized at synchrotron radiation facilities around the world for their capability to provide a high-brilliance X-ray beam. APPLE-II type undulators are especially important for their capacity to switch between a variety of photon beam polarization states. A high-precision soft X-ray polarimeter has been used to investigate the polarization calibration of an APPLE-II undulator (period length λu= 64 mm) installed on beamline I06 at Diamond Light Source. Systematic measurement of the beam polarization state at a range of linear arbitrary angles has been compared with the expected result for a given set of undulator gap and row phase parameters calculated from theory. Determination of the corresponding Stokes–Poincaré parameters from the measured data reveals a discrepancy between the two. The limited number of energy/polarization combinations included in the undulator calibration tables necessitates the use of interpolated values for the missing points which is expected to contribute to the discrepancy. However, by modifying the orbit of the electron beam through the undulator by at least 160 µm it has been found that for certain linear polarizations the discrepancies can be corrected. Overall, it is suggested that complete correction of the Stokes–Poincaré parameters for all linear angles would require alteration of both these aspects.

Aspects of microanalysis in a transmission electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 510-511
Author(s):  
R. Sinclair ◽  
B.E. Jacobson
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Transmission Electron Microscope ◽  
Vapor Deposition ◽  
Critical Currents ◽  
X Ray ◽  
Fine Grain ◽  
Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

X-ray micro tomography in the scanning electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 106-107 ◽  
Author(s):  
W. Brünger
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Target Surface ◽  
The Body ◽  
X Rays ◽  
Cross Sectional ◽  
X Ray ◽  
Micro Tomography ◽  
Scanning Electron

Reconstructive tomography is a new technique in diagnostic radiology for imaging cross-sectional planes of the human body /1/. A collimated beam of X-rays is scanned through a thin slice of the body and the transmitted intensity is recorded by a detector giving a linear shadow graph or projection (see fig. 1). Many of these projections at different angles are used to reconstruct the body-layer, usually with the aid of a computer. The picture element size of present tomographic scanners is approximately 1.1 mm2.Micro tomography can be realized using the very fine X-ray source generated by the focused electron beam of a scanning electron microscope (see fig. 2). The translation of the X-ray source is done by a line scan of the electron beam on a polished target surface /2/. Projections at different angles are produced by rotating the object.During the registration of a single scan the electron beam is deflected in one direction only, while both deflections are operating in the display tube.

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