Fluorescence Spectroscopy Data Analysis Environment: A Second Generation Global Analysis Program

1988 ◽  
Author(s):  
Joseph M. Beechem ◽  
Enrico Gratton
Keyword(s):  
Data Analysis ◽  
Fluorescence Spectroscopy ◽  
Second Generation ◽  
Global Analysis ◽  
Spectroscopy Data ◽  
Analysis Program ◽  
Analysis Environment

Do remittances differ depending on migration pathway and length of stay?

2016 ◽  
Vol 1 (1) ◽  
pp. 105-118
Author(s):  
Anita Pugliese ◽  
Julie Ray ◽  
Neli Esipova
Keyword(s):  
Length Of Stay ◽  
First Generation ◽  
Second Generation ◽  
Global Analysis ◽  
Large Sample ◽  
Migration Pathway ◽  
First Generation Migrants ◽  
Second Generation Migrants

This paper reports the results from Gallup’s global analysis of the likelihood of first-generation migrants, second-generation migrants and the native-born to send financial help in the form of money or goods to others inside or outside their respective country of residence. The findings in this paper are based on more than 450,000 interviews conducted through Gallup’s World Poll in 157 countries in 2012, 2013 and 2014. The sample includes more than 26,000 first-generation migrants and more than 20,000 second-generation migrants. The large sample enables Gallup to analyze first-generation migrants by the duration of their stay in their adopted country and compare their remittance behaviors with second-generation migrants and the native-born.

Failure Analysis Enhancement by Incorporating a Compact Scan Diagnosis System

2014 ◽  
Author(s):  
Rommel Estores ◽  
Pascal Vercruysse ◽  
Karl Villareal ◽  
Eric Barbian ◽  
Ralph Sanchez ◽  
...  
Keyword(s):  
Data Analysis ◽  
Failure Analysis ◽  
Real Analysis ◽  
Failure Data ◽  
Analysis Methodology ◽  
Efficiency And Effectiveness ◽  
Scan Chain ◽  
On Chip ◽  
Analysis Environment ◽  
Selection Of

Abstract The failure analysis community working on highly integrated mixed signal circuitry is entering an era where simultaneously System-On-Chip technologies, denser metallization schemes, on-chip dissipation techniques and intelligent packages are being introduced. These innovations bring a great deal of defect accessibility challenges to the failure analyst. To contend in this era while aiming for higher efficiency and effectiveness, the failure analysis environment must undergo a disruptive evolution. The success or failure of an analysis will be determined by the careful selection of tools, data and techniques in the applied analysis flow. A comprehensive approach is required where hardware, software, data analysis, traditional FA techniques and expertise are complementary combined [1]. This document demonstrates this through the incorporation of advanced scan diagnosis methods in the overall analysis flow for digital functionality failures and supporting the enhanced failure analysis methodology. For the testing and diagnosis of the presented cases, compact but powerful scan test FA Lab hardware with its diagnosis software was used [2]. It can therefore easily be combined with the traditional FA techniques to provide stimulus for dynamic fault localizations [3]. The system combines scan chain information, failure data and layout information into one viewing environment which provides real analysis power for the failure analyst. Comprehensive data analysis is performed to identify failing cells/nets, provide a better overview of the failure and the interactions to isolate the fault further to a smaller area, or to analyze subtle behavior patterns to find and rationalize possible faults that are otherwise not detected. Three sample cases will be discussed in this document to demonstrate specific strengths and advantages of this enhanced FA methodology.

Noise spectroscopy data analysis-based gas identification with a single MOX sensor

2021 ◽  
Vol 334 ◽  
pp. 129654
Author(s):  
Nicolas Morati ◽  
Thierry Contaret ◽  
Sami Gomri ◽  
Tomas Fiorido ◽  
Jean-Luc Seguin ◽  
...  
Keyword(s):  
Data Analysis ◽  
Spectroscopy Data ◽  
Noise Spectroscopy ◽  
Gas Identification

scholarly journals Defect Parameters Contour Mapping: A Powerful Tool for Lifetime Spectroscopy Data Analysis

2018 ◽  
Vol 255 (8) ◽  
pp. 1800082 ◽  
Author(s):  
Simone Bernardini ◽  
Tine U. Naerland ◽  
Gianluca Coletti ◽  
Mariana I. Bertoni
Keyword(s):  
Data Analysis ◽  
Spectroscopy Data ◽  
Contour Mapping
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