Edge Sharpening, Contrast Enhancement, And Feature Dependent Amplification In Inorganic Resist - A Simulation Study

Author(s):  
Wingyu Leung ◽  
Andrew R. Neureuther ◽  
William G. Oldham
2013 ◽  
Vol 40 (12) ◽  
pp. 121906 ◽  
Author(s):  
Ming Xue ◽  
Hao Zhang ◽  
Seth Kligerman ◽  
Paul Klahr ◽  
Warren D’Souza ◽  
...  

2021 ◽  
Vol 24 (1) ◽  
pp. 1
Author(s):  
Ni Larasati Kartika Sari ◽  
Ryscha Dwi Iriani ◽  
Budi Santoso

2012 ◽  
Vol 19 (4) ◽  
pp. 282-286
Author(s):  
Tae Won Beom ◽  
Gi Chan Park ◽  
Jin Woo Lee ◽  
Hun Kim ◽  
Hye Rim Kim ◽  
...  

Author(s):  
H.T. Pearce-Percy

Recently an energy analyser of the uniform magnetic sector type has been installd in a 100KV microscope. This microscope can be used in the STEM mode. The sector is of conventional design (Fig. 1). The bending angle was chosen to be 90° for ease of construction. The bending radius (ρ) is 20 cm. and the object and image distances are 42.5 cm. and 30.0 cm. respectively.


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