A Study Of The Far Infrared Dielectric Response Of InAs At Room Temperature By Dispersive Fourier Transform Spectrometry

Author(s):  
A. Memon ◽  
T. J. Parker ◽  
J. R. Birch
1987 ◽  
Vol 108 ◽  
Author(s):  
Paul Sliva ◽  
M. Leffler ◽  
M. Bliss ◽  
L. E. Cross ◽  
B. E. Scheetz

ABSTRACTDielectric permittivity and loss tangent were measured on: 1) pressed disks of four different calcium aluminate cements shear mixed with water and poly(vinyl alcohol) and cured at room temperature and 2) laminates of SECAR 71 cement sintered at 1450°C. Post resonance and perturbation methods were used for microwave frequency measurements. Far infrared dielectric response of the cements was determined by FTIR in the diffuse reflectance mode. The real and imaginary parts of the relative dielectric permittivity were obtained via a conventional Kramers-Kronig analysis.


1984 ◽  
Vol 38 (5) ◽  
pp. 678-680
Author(s):  
W Richter

An experimental set-up, based on a commercial rapid-scan Fourier transform spectrometer, for dielectric loss measurements on low-loss materials in the frequency region between 120 GHz and 1650 GHz (4–55 cm−1) is described Results obtained for cyclohexane are presented as an example of application


Tellus B ◽  
2010 ◽  
Vol 62 (5) ◽  
Author(s):  
Janina Messerschmidt ◽  
Ronald Macatangay ◽  
Justus Notholt ◽  
Christof Petri ◽  
Thorsten Warneke ◽  
...  

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