High-rate deposition of silicon thin film layers using linear plasma sources operated at very high excitation frequencies (80-140 MHz)

Author(s):  
B. Leszczynska ◽  
C. Strobel ◽  
S. Leszczynski ◽  
M. Albert ◽  
J. W. Bartha ◽  
...  
2012 ◽  
Vol 1426 ◽  
pp. 27-32
Author(s):  
T. Zimmermann ◽  
A. J. Flikweert ◽  
T. Merdzhanova ◽  
J. Woerdenweber ◽  
A. Gordijn ◽  
...  

ABSTRACTThin‑film silicon solar cells based on hydrogenated amorphous silicon (a‑Si:H) and hydrogenated microcrystalline silicon (μc‑Si:H) absorber layers are typically deposited using static plasma-enhanced chemical vapor deposition (PECVD) processes. It has been found that the use of very‑high frequencies (VHF) is beneficial for the material quality at high deposition rates when compared to radio-frequency (RF) processes. In the present work a dynamic VHF‑PECVD technique using linear plasma sources is developed. The linear plasma sources facilitate the use of very-high excitation frequencies on large electrode areas without compromising on the homogeneity of the deposition process. It is shown that state-of-the-art a‑Si:H and μc‑Si:H single-junction solar cells can be deposited incorporating intrinsic layers grown dynamically by VHF-PECVD at 0.35 nm/s and 0.95 nm/s, respectively.


2010 ◽  
Vol 133 (3) ◽  
pp. 034701 ◽  
Author(s):  
Bo Peng ◽  
Fangyi Cheng ◽  
Zhanliang Tao ◽  
Jun Chen

2011 ◽  
Vol 520 (2) ◽  
pp. 694-696 ◽  
Author(s):  
Shengzhi Xu ◽  
Xiaodan Zhang ◽  
Yang Li ◽  
Shaozhen Xiong ◽  
Xinhua Geng ◽  
...  

1996 ◽  
Vol 424 ◽  
Author(s):  
Tong Li ◽  
Chun-Ying Chen ◽  
Charles T. Malone ◽  
Jerzy Kanicki

AbstractHydrogenated amorphous silicon nitride thin films, prepared in a large area plasma-enhanced chemical vapor (PECVD) deposition system utilizing high-rate deposition technique, have been characterized by various techniques. Experimental data obtained from this study are presented and compared to low-rate deposited PECVD films. Special attention has been devoted during this study to the difference between high- and low-rate deposited samples. The amorphous silicon (a-Si:H) thin-film transistors (TFTs) based on high-rate PECVD materials have been fabricated and characterized. The evaluation of a-Si:H TFTs indicates a good electrical performance which is comparable to its low-rate PECVD materials counterparts.


2013 ◽  
Vol 532 ◽  
pp. 66-72 ◽  
Author(s):  
Gabrielle Jost ◽  
Tsvetelina Merdzhanova ◽  
Thomas Zimmermann ◽  
Jürgen Hüpkes

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