Characterization of silicide-silicon interface contact resistivity using 1-D dual transmission line model approximation of modified cross bridge kelvin measurements
Characterization of contact resistance of low-value resistor by transmission line model (TLM) method
2002 ◽
Vol 85
(3)
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pp. 16-22
Keyword(s):
2020 ◽
Vol 67
(7)
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pp. 2690-2696
2015 ◽
Vol 36
(6)
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pp. 600-602
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2014 ◽
Vol 35
(9)
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pp. 957-959
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Keyword(s):
2020 ◽
Vol 67
(7)
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pp. 2682-2689