High-throughput and non-destructive sidewall roughness measurement using 3-dimensional atomic force microscopy

2012 ◽  
Author(s):  
Yueming Hua ◽  
Cynthia Buenviaje-Coggins ◽  
Yong-ha Lee ◽  
Sang-il Park
Keyword(s):  
Atomic Force Microscopy ◽  
High Throughput ◽  
Roughness Measurement ◽  
Sidewall Roughness ◽  
3 Dimensional ◽  
Force Microscopy ◽  
Atomic Force ◽  
Non Destructive

Sidewall roughness measurement inside photonic crystal holes by atomic force microscopy

2007 ◽  
Vol 18 (40) ◽  
pp. 405703 ◽  
Author(s):  
P Strasser ◽  
F Robin ◽  
C F Carlström ◽  
R Wüest ◽  
R Kappeler ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Photonic Crystal ◽  
Roughness Measurement ◽  
Sidewall Roughness ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals A simple and efficient quasi 3-dimensional viscoelastic model and software for simulation of tapping-mode atomic force microscopy

2015 ◽  
Vol 6 ◽  
pp. 2233-2241 ◽  
Author(s):  
Santiago D Solares
Keyword(s):  
Atomic Force Microscopy ◽  
Computational Cost ◽  
Viscoelastic Model ◽  
Software Tool ◽  
Tapping Mode ◽  
3 Dimensional ◽  
Force Microscopy ◽  
Atomic Force ◽  
Standard Linear Solid ◽  
Force Curves

This paper introduces a quasi-3-dimensional (Q3D) viscoelastic model and software tool for use in atomic force microscopy (AFM) simulations. The model is based on a 2-dimensional array of standard linear solid (SLS) model elements. The well-known 1-dimensional SLS model is a textbook example in viscoelastic theory but is relatively new in AFM simulation. It is the simplest model that offers a qualitatively correct description of the most fundamental viscoelastic behaviors, namely stress relaxation and creep. However, this simple model does not reflect the correct curvature in the repulsive portion of the force curve, so its application in the quantitative interpretation of AFM experiments is relatively limited. In the proposed Q3D model the use of an array of SLS elements leads to force curves that have the typical upward curvature in the repulsive region, while still offering a very low computational cost. Furthermore, the use of a multidimensional model allows for the study of AFM tips having non-ideal geometries, which can be extremely useful in practice. Examples of typical force curves are provided for single- and multifrequency tapping-mode imaging, for both of which the force curves exhibit the expected features. Finally, a software tool to simulate amplitude and phase spectroscopy curves is provided, which can be easily modified to implement other controls schemes in order to aid in the interpretation of AFM experiments.

Analysis off cereal chromosomes by atomic force microscopy

Genome ◽  
1996 ◽  
Vol 39 (2) ◽  
pp. 439-444 ◽  
Author(s):  
Terence J. McMaster ◽  
Mervyn J. Miles ◽  
Mark O. Winfield ◽  
Angela Karp
Keyword(s):  
Atomic Force Microscopy ◽  
In Situ Hybridization ◽  
Optical Signal ◽  
3 Dimensional ◽  
Force Microscopy ◽  
C Banding ◽  
Plant Chromosomes ◽  
Atomic Force ◽  
High Resolution Images

Atomic force microscopy has been applied to the study of plant chromosomes from cereal grasses Triticum aestivum (bread wheat), Triticum tauschii, and Hordeum vulgare (barley). Using standard mitotic metaphase squashes, high resolution images have been obtained of untreated chromosomes and also of chromosomes after C-banding, N-banding, and in situ hybridization. The true 3-dimensional nature of the images permits detailed analysis of the surface structure and, on untreated uncoated chromosomes, surface features on a length scale consistent with nucleosome structures have been observed. C+ and N+ regions are manifest as areas of high relief on a slightly collapsed chromosome structure. In situ hybridization leads to a more severe degradation of the native structure, although it is still possible to correlate the optical signal with the topography of the hybridized chromosome. Key words : atomic force microscope, AFM, chromosomes, C-banding, in situ hybridization.

High-throughput measurements of cell mechanics using atomic force microscopy with micro-patterned substrates

MHS2013 ◽  
2013 ◽  
Author(s):  
Ryosuke Takahashi ◽  
Kaori Kuribayashi-Shigetomi ◽  
Masahiro Tsuchiya ◽  
Agus Subagyo ◽  
Kazuhisa Sueoka ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Throughput ◽  
Cell Mechanics ◽  
Patterned Substrates ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Automated Cantilever Exchange and Optical Alignment for High-Throughput Parallel Atomic Force Microscopy

2017 ◽  
Vol 22 (6) ◽  
pp. 2654-2661 ◽  
Author(s):  
Hamed Sadeghian ◽  
Tom Bijnagte ◽  
Rodolf Herfst ◽  
Geerten Kramer ◽  
Lukas Kramer ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Throughput ◽  
Force Microscopy ◽  
Atomic Force ◽  
Optical Alignment

High-throughput Measurements of Single Cell Rheology by Atomic Force Microscopy

2015 ◽  
pp. 57-67
Author(s):  
Kaori Kuribayashi-Shigetomi ◽  
Ryosuke Takahashi ◽  
Agus Subagyo ◽  
Kazuhisa Sueoka ◽  
Takaharu Okajima
Keyword(s):  
Atomic Force Microscopy ◽  
Single Cell ◽  
High Throughput ◽  
Force Microscopy ◽  
Cell Rheology ◽  
Atomic Force
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