THz time-domain spectroscopy in different carbon nanotube thin films

2012 ◽  
Author(s):  
Ehsan Dadrasnia ◽  
Horacio Lamela ◽  
Mohan-Babu Kuppam ◽  
Frédéric Garet ◽  
Jean-Louis Coutaz
Keyword(s):  
Thin Films ◽  
Carbon Nanotube ◽  
Time Domain ◽  
Time Domain Spectroscopy

Distributed Strain Sensing Using Carbon Nanotube Thin Films and Electrical Time-Domain Reflectometry

2018 ◽  
Author(s):  
Bo Mi Lee ◽  
Kenneth J. Loh ◽  
Francesco Lanza di Scalea
Keyword(s):  
Thin Films ◽  
Carbon Nanotube ◽  
Transmission Line ◽  
Time Domain ◽  
Structural Response ◽  
Time Domain Reflectometry ◽  
Distributed Sensing ◽  
Uniaxial Tensile ◽  
Electromagnetic Signal ◽  
Single Measurement

Nondestructive inspection (NDI) is an effective technique to inspect, test, or evaluate the integrity of materials, components, and structures without interrupting the serviceability of a system. Despite recent advances in NDI techniques, most of them are either limited to sensing structural response at their instrumented locations or require multiple sensors and measurements to localize damage. In this study, a new NDI system that could achieve distributed sensing using a single measurement was investigated. Here, piezoresistive carbon nanotube (CNT)-polymer thin film sensors connected in a transmission line setup were interrogated using electrical time-domain reflectometry (ETDR). In ETDR, an electromagnetic signal is sent from one end of the transmission line. When the signal encounters the sensor, it can partially reflect and be captured at the same point. The characteristics of the reflected signal depend on the sensor’s impedance, which is correlated to structural response, deformation, or damage. The advantage of this is that distributed sensing along the entire transmission line can be achieved using a single measurement point. To validate this concept, CNT-polymer thin films that were integrated with a transmission line are subjected to uniaxial tensile strains applied using a load frame. The ETDR signals were analyzed to assess the system’s sensing performance.

Measurement of Electrical Properties of GaN Thin Films Using Terahertz-Time Domain Spectroscopy

2005 ◽  
Vol 44 (2) ◽  
pp. 926-931 ◽  
Author(s):  
Takeshi Nagashima ◽  
Kazue Takata ◽  
Shigeki Nashima ◽  
Hiroshi Harima ◽  
Masanori Hangyo
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Time Domain ◽  
Terahertz Time Domain Spectroscopy ◽  
Time Domain Spectroscopy

Non-Drude Behavior in Indium-Tin-Oxide Nanowhiskers and Thin Films Investigated by Transmission and Reflection THz Time-Domain Spectroscopy

2013 ◽  
Vol 49 (8) ◽  
pp. 677-690 ◽  
Author(s):  
Chan-Shan Yang ◽  
Mao-Hsiang Lin ◽  
Chia-Hua Chang ◽  
Peichen Yu ◽  
Jia-Min Shieh ◽  
...  
Keyword(s):  
Thin Films ◽  
Tin Oxide ◽  
Time Domain ◽  
Indium Tin Oxide ◽  
Time Domain Spectroscopy ◽  
Transmission And Reflection
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