Mapping the x-ray response of a CdTe sensor with small pixels using an x-ray microbeam and a single photon processing readout chip

2011 ◽  
Author(s):  
Erik Frojdh ◽  
Christer Frojdh ◽  
Borje Norlin ◽  
Goran Thungstrom
Keyword(s):  
Single Photon ◽  
X Ray

Subpixel resolution in CdTe Timepix3 pixel detectors

2018 ◽  
Vol 25 (6) ◽  
pp. 1650-1657 ◽  
Author(s):  
Mohamad Khalil ◽  
Erik Schou Dreier ◽  
Jan Kehres ◽  
Jan Jakubek ◽  
Ulrik Lund Olsen
Keyword(s):  
Single Photon ◽  
Weighted Average ◽  
European Synchrotron Radiation Facility ◽  
Time Of Arrival ◽  
Pixel Detector ◽  
Step Size ◽  
X Ray ◽  
Pixel Detectors ◽  
Individual Photon ◽  
Subpixel Resolution

Timepix3 (256 × 256 pixels with a pitch of 55 µm) is a hybrid-pixel-detector readout chip that implements a data-driven architecture and is capable of simultaneous time-of-arrival (ToA) and energy (ToT: time-over-threshold) measurements. The ToA information allows the unambiguous identification of pixel clusters belonging to the same X-ray interaction, which allows for full one-by-one detection of photons. The weighted mean of the pixel clusters can be used to measure the subpixel position of an X-ray interaction. An experiment was performed at the European Synchrotron Radiation Facility in Grenoble, France, using a 5 µm × 5 µm pencil beam to scan a CdTe-ADVAPIX-Timepix3 pixel (55 µm × 55 µm) at 8 × 8 matrix positions with a step size of 5 µm. The head-on scan was carried out at four monochromatic energies: 24, 35, 70 and 120 keV. The subpixel position of every single photon in the beam was constructed using the weighted average of the charge spread of single interactions. Then the subpixel position of the total beam was found by calculating the mean position of all photons. This was carried out for all points in the 8 × 8 matrix of beam positions within a single pixel. The optimum conditions for the subpixel measurements are presented with regards to the cluster sizes and beam subpixel position, and the improvement of this technique is evaluated (using the charge sharing of each individual photon to achieve subpixel resolution) versus alternative techniques which compare the intensity ratio between pixels. The best result is achieved at 120 keV, where a beam step of 4.4 µm ± 0.86 µm was measured.

Thermal Detectors as Single Photon X-Ray Spectrometers

1985 ◽  
Vol 32 (1) ◽  
pp. 134-138 ◽  
Author(s):  
S. Harvey Moseley ◽  
R. L. Kelley ◽  
J. C. Mather ◽  
R. F. Mushotzky ◽  
A. E. Szymkowiak ◽  
...  
Keyword(s):  
Single Photon ◽  
X Ray ◽  
Thermal Detectors

Beyond single photon counting X-ray detectors

2011 ◽  
Vol 628 (1) ◽  
pp. 238-241 ◽  
Author(s):  
A. Bergamaschi ◽  
R. Dinapoli ◽  
B. Henrich ◽  
I. Johnson ◽  
A. Mozzanica ◽  
...  
Keyword(s):  
Single Photon ◽  
Photon Counting ◽  
Single Photon Counting ◽  
X Ray

scholarly journals Single photon ionization of hydrogen bonded clusters with a soft x-ray laser: (HCOOH)x and (HCOOH)y(H2O)z

2007 ◽  
Vol 126 (24) ◽  
pp. 244301 ◽  
Author(s):  
S. Heinbuch ◽  
F. Dong ◽  
J. J. Rocca ◽  
E. R. Bernstein
Keyword(s):  
Single Photon ◽  
X Ray ◽  
Single Photon Ionization ◽  
Photon Ionization ◽  
Hydrogen Bonded

Measurement of the Silicon Lattice Parameter by Scanning Single Photon X-Ray Interferometry

2018 ◽  
Author(s):  
Ulrich Kuetgens ◽  
Birk Andreas ◽  
Kathrin Friedrich ◽  
Christoph Weichert ◽  
Paul Kochert ◽  
...  
Keyword(s):  
Single Photon ◽  
Lattice Parameter ◽  
Silicon Lattice ◽  
X Ray

scholarly journals The time-resolved hard X-ray diffraction endstation KMC-3 XPP at BESSY II

2021 ◽  
Vol 28 (3) ◽  
Author(s):  
Matthias Rössle ◽  
Wolfram Leitenberger ◽  
Matthias Reinhardt ◽  
Azize Koç ◽  
Jan Pudell ◽  
...  
Keyword(s):  
Storage Ring ◽  
Single Photon ◽  
Laser System ◽  
High Vacuum ◽  
Laser Pulses ◽  
Pixel Detector ◽  
X Ray Diffraction ◽  
Optical Pump ◽  
Time Resolved ◽  
X Ray

The time-resolved hard X-ray diffraction endstation KMC-3 XPP for optical pump/X-ray probe experiments at the electron storage ring BESSY II is dedicated to investigating the structural response of thin film samples and heterostructures after their excitation with ultrashort laser pulses and/or electric field pulses. It enables experiments with access to symmetric and asymmetric Bragg reflections via a four-circle diffractometer and it is possible to keep the sample in high vacuum and vary the sample temperature between ∼15 K and 350 K. The femtosecond laser system permanently installed at the beamline allows for optical excitation of the sample at 1028 nm. A non-linear optical setup enables the sample excitation also at 514 nm and 343 nm. A time-resolution of 17 ps is achieved with the `low-α' operation mode of the storage ring and an electronic variation of the delay between optical pump and hard X-ray probe pulse conveniently accesses picosecond to microsecond timescales. Direct time-resolved detection of the diffracted hard X-ray synchrotron pulses use a gated area pixel detector or a fast point detector in single photon counting mode. The range of experiments that are reliably conducted at the endstation and that detect structural dynamics of samples excited by laser pulses or electric fields are presented.

Operation of a single-photon–counting x-ray charge-coupled device camera spectrometer in a petawatt environment

2004 ◽  
Vol 75 (10) ◽  
pp. 3705-3707 ◽  
Author(s):  
C. Stoeckl ◽  
W. Theobald ◽  
T. C. Sangster ◽  
M. H. Key ◽  
P. Patel ◽  
...  
Keyword(s):  
Single Photon ◽  
Photon Counting ◽  
Charge Coupled Device ◽  
Single Photon Counting ◽  
X Ray
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