Proton radiation testing of laser optical components for NASA Jupiter Europa Orbiter Mission

Validation of FDIR Strategy for Spaceborne SRAM-Based FPGAs Using Proton Radiation Testing

2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ◽

10.1109/radecs.2015.7365694 ◽

2015 ◽

Cited By ~ 1

Author(s):

Felix Siegle ◽

Tanya Vladimirova ◽

Christian Poivey ◽

Omar Emam

Keyword(s):

Proton Radiation ◽

Radiation Testing

Download Full-text

Proton radiation testing of digital micromirror devices for space applications

Optical Engineering ◽

10.1117/1.oe.52.9.091807 ◽

2013 ◽

Vol 52 (9) ◽

pp. 091807 ◽

Cited By ~ 6

Author(s):

Kenneth Fourspring ◽

Zoran Ninkov ◽

Bryan C. Fodness ◽

Massimo Robberto ◽

Sally Heap ◽

...

Keyword(s):

Proton Radiation ◽

Space Applications ◽

Radiation Testing ◽

Digital Micromirror Devices

Download Full-text

Total ionizing dose gamma and proton radiation testing on a COTS interline CCD with microlens

IEEE Radiation Effects Data Workshop, 2005. ◽

10.1109/redw.2005.1532684 ◽

2005 ◽

Cited By ~ 2

Author(s):

P.P.K. Lee ◽

D.A. Thompson ◽

D.L. Modney

Keyword(s):

Proton Radiation ◽

Total Ionizing Dose ◽

Radiation Testing

Download Full-text

In-situ proton radiation testing of 2.4 micron wavelength extended InGaAs photodiodes at dry ice and room temperatures

Laser Radar Technology and Applications XXVI ◽

10.1117/12.2587103 ◽

2021 ◽

Author(s):

Abhay M. Joshi ◽

Shubhaschish Datta ◽

Jeff Mertz ◽

Nilesh Soni ◽

Michael Sivertz ◽

...

Keyword(s):

Proton Radiation ◽

Dry Ice ◽

Radiation Testing

Download Full-text

Proton radiation testing of optical elements

2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) ◽

10.1109/redw.2001.960464 ◽

2002 ◽

Cited By ~ 1

Author(s):

K.B. Miller ◽

J. Leitch ◽

C. Lyons-Mandel

Keyword(s):

Proton Radiation ◽

Optical Elements ◽

Radiation Testing

Download Full-text

Thin-Film Photovoltaic Proton Radiation Testing for a MEO Orbit

3rd International Energy Conversion Engineering Conference ◽

10.2514/6.2005-5650 ◽

2005 ◽

Author(s):

Jennifer Granata ◽

Theodore Sahlstrom ◽

Paul Hausgen ◽

Scott Messenger ◽

Justin Lorentzen ◽

...

Keyword(s):

Thin Film ◽

Proton Radiation ◽

Radiation Testing

Download Full-text

Preparation of Thin Cadmium Telluride Samples for Electron Microscope Studies

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100052754 ◽

1974 ◽

Vol 32 ◽

pp. 548-549

Author(s):

T. J. Magee ◽

J. Peng ◽

J. Bean

Keyword(s):

Electron Microscope ◽

Sulfuric Acid ◽

Solid State ◽

Sample Preparation ◽

Cadmium Telluride ◽

Potassium Dichromate ◽

Optical Components ◽

The Past ◽

Solid State Devices

Cadmium telluride has become increasingly important in a number of technological applications, particularly in the area of laser-optical components and solid state devices, Microstructural characterizations of the material have in the past been somewhat limited because of the lack of suitable sample preparation and thinning techniques. Utilizing a modified jet thinning apparatus and a potassium dichromate-sulfuric acid thinning solution, a procedure has now been developed for obtaining thin contamination-free samples for TEM examination.

Download Full-text

Self-Assembly Optical Components

MRS Proceedings ◽

10.1557/proc-771-10.10 ◽

2003 ◽

Vol 771 ◽

Cited By ~ 2

Author(s):

Pavel I. Lazarev ◽

Michael V. Paukshto ◽

Elena N. Sidorenko

Keyword(s):

Optical Properties ◽

Self Assembly ◽

Crystalline State ◽

Liquid Crystalline ◽

Film Deposition ◽

X Ray Diffraction ◽

Optical Components ◽

Crystal Film ◽

Solid Film ◽

Thin Crystal

AbstractWe report a new method of Thin Crystal Film deposition. In the present paper we describe the method of crystallization, structure, and optical properties of Bisbenzimidazo[2,1-a:1',2',b']anthra[2,1,9-def:6,5,10-d'e'f']-diisoquinoline-6,9-dion (mixture with cis-isomer) (abbreviated DBI PTCA) sulfonation product. The Thin Crystal Film has a thickness of 200-1000 nm, with anisotropic optical properties such as refraction and absorption indices. X-ray diffraction data evidences a lyotropic liquid crystalline state in liquid phase and crystalline state in solid film. Anisotropic optical properties of the film make it useful in optical devices, e.g. liquid crystal displays.

Download Full-text