Measuring the residual stress of transparent conductive oxide films on PET by the double-beam shadow Moiré interferometer

2011 ◽  
Author(s):  
Hsi-Chao Chen ◽  
Kuo-Ting Huang ◽  
Yen-Ming Lo ◽  
Hsuan-Yi Chiu ◽  
Guan-Jhen Chen
Keyword(s):  
Residual Stress ◽  
Oxide Films ◽  
Transparent Conductive Oxide ◽  
Shadow Moire ◽  
Shadow Moiré ◽  
Double Beam ◽  
Conductive Oxide

Measurement of residual stress for ITO/PET substrates by the double beam shadow moiré interferometer

2012 ◽  
Vol 51 (10) ◽  
pp. 1566 ◽  
Author(s):  
Hsi-Chao Chen ◽  
Kuo-Ting Huang ◽  
Yen-Ming Lo
Keyword(s):  
Residual Stress ◽  
Shadow Moire ◽  
Shadow Moiré ◽  
Double Beam

Influence of Ga2O3 addition on transparent conductive oxide films of In2O3–ZnO

Vacuum ◽  
2008 ◽  
Vol 83 (3) ◽  
pp. 561-563 ◽  
Author(s):  
Kikuo Tominaga ◽  
Daisuke Takada ◽  
Kouji Shimomura ◽  
Hiroshi Suketa ◽  
Keisuke Takita ◽  
...  
Keyword(s):  
Oxide Films ◽  
Transparent Conductive Oxide ◽  
Conductive Oxide

Nanoscale Silver-Based Al-Doped ZnO Multilayer Transparent-Conductive Oxide Films

2009 ◽  
Vol 156 (8) ◽  
pp. J215 ◽  
Author(s):  
Hyun-Jin Cho ◽  
Kyung-Woo Park ◽  
Jun-Ku Ahn ◽  
Nak-Jin Seong ◽  
Soon-Gil Yoon ◽  
...  
Keyword(s):  
Oxide Films ◽  
Transparent Conductive Oxide ◽  
Conductive Oxide ◽  
Doped Zno

Al-impurity-doped transparent conductive oxide films of In2O3−ZnO system

Vacuum ◽  
2004 ◽  
Vol 74 (3-4) ◽  
pp. 683-687 ◽  
Author(s):  
K. Tominaga ◽  
H. Fukumoto ◽  
K. Kondou ◽  
Y. Hayashi ◽  
K. Murai ◽  
...  
Keyword(s):  
Oxide Films ◽  
Transparent Conductive Oxide ◽  
Conductive Oxide ◽  
Impurity Doped
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